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31. 发明公开

EP1494012A1 Container inspection machine with man-machine interface for identifying and defining back lights 有权
标题翻译：的机器用于与人机接口部检查容器用于背光设备的识别和判定
公开(公告)号：EP1494012A1
公开(公告)日：2005-01-05
申请号：EP04253473.5
申请日：2004-06-10
申请人： Emhart Glass S.A.
发明人： Diehr, Richard D.
IPC分类号： G01N21/90 , G01N21/88 , G06F3/033 , G06F3/023
CPC分类号： G01N21/8803 , B07C5/126 , G01N21/8806 , G01N21/9009 , G01N2021/8411 , G01N2021/845 , G01N2021/8809 , G01N2021/8832 , G01N2021/8835
摘要： A container inspecting machine is provided with a man-machine screen interface (17) which can be switched (25,26) to one of a plurality of different back lights (28,30) or patterns so that an operator can define any one of these back lights (28,30) on the man-machine screen interface (17) as a desired back light (28,30) for inspecting a transparent container.
摘要翻译：人机界面屏幕可被切换到背光源的多个1所以没有在操作者可以定义人机界面屏幕上合成的背光中的任何一个作为用于检查的透明容器在所需的背光。

32. 发明公开

EP1107012A1 Visual inspection apparatus 有权
标题翻译： OptischePrüfvorrichtung
公开(公告)号：EP1107012A1
公开(公告)日：2001-06-13
申请号：EP00126105.6
申请日：2000-11-29
申请人： Nidek Co., Ltd.
发明人： Yonezawa, Eiji
IPC分类号： G01R31/308 , H01L21/66 , G01N21/88
CPC分类号： G01N21/9501 , G01N21/8803 , G01N21/8806 , G01N2021/8809 , G01N2021/8845
摘要： In a visual inspection apparatus for visual inspection of an object, a plurality of monochrome images obtained from an object are used to prepare a plurality of computed color images. The computed color images are switchingly displayed on a color display for visual inspection.
摘要翻译：在用于物体目视检查的目视检查装置中，使用从对象获得的多个单色图像来准备多个计算出的彩色图像。所计算的彩色图像被切换显示在彩色显示器上用于目视检查。

33. 发明授权

EP1795888B1 Apparatus for generating data for determining a property of a gemstone 有权
标题翻译：用于生成确定宝石属性的数据的设备
公开(公告)号：EP1795888B1
公开(公告)日：2017-08-23
申请号：EP05257579.2
申请日：2005-12-09
申请人： Sarine Color Technologies Ltd.
发明人： Van de Velde, Marc Frans Alida , Keersmaekers, Christiaan Louis Cecile
IPC分类号： G01N21/87 , G01N33/38 , G01N21/88
CPC分类号： G01N33/381 , G01N21/87 , G01N2021/8809

34. 发明公开

EP3060902A1 DEFECT INSPECTION SYSTEM AND METHOD 审中-公开
标题翻译：缺陷检测系统和方法
公开(公告)号：EP3060902A1
公开(公告)日：2016-08-31
申请号：EP14783834.6
申请日：2014-10-13
申请人： Philips Lighting Holding B.V.
发明人： KUAI, Shuguang , JAEGER, Mark Christoph , ZHOU, Weixi
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N21/8803 , G01N2021/8809 , G01N2201/0633 , G01N2201/12 , H04N5/225
摘要： A defect inspection system is provided for inspection of defects in the surface of a sample. An array of light sources is used, with different light sources providing light to the sample from different directions. A main direction of illumination is defined with highest intensity, and this direction evolves over time. By providing varying directional illumination instead of blanket illumination, it becomes easier to detect defects.

35. 发明申请

WO2010097878A1 欠陥検査方法及び欠陥検査装置审中-公开
标题翻译：缺陷检查方法和缺陷检查装置
公开(公告)号：WO2010097878A1
公开(公告)日：2010-09-02
申请号：PCT/JP2009/006887
申请日：2009-12-15
申请人：株式会社日立ハイテクノロジーズ , 中尾敏之 , 丸山重信 , 浜松玲 , 浦野雄太
发明人：中尾敏之 , 丸山重信 , 浜松玲 , 浦野雄太
IPC分类号： G01N21/956 , H01L21/66
CPC分类号： G01N21/9501 , G01N21/8806 , G01N2021/8809 , G01N2021/8848 , H01L22/12
摘要：　試料へのダメージを抑えつつ、偏光検出を利用した欠陥検出感度向上とHaze計測を両立させる欠陥検査方法および欠陥検査装置を提供する。試料に対し、エネルギの吸収が小さい波長帯域を有するレーザビームを発振する光源と、前記光源から発振されたレーザビーム照射により、欠陥から発生する欠陥散乱光を検出する欠陥検出光学系と、ウエハ表面荒れから発生するラフネス散乱光を検出するHaze検出光学系の二つを独立に備え、前記二つの検出光学系で検出した散乱光に対し独立に偏光検出を行い、前記二つの異なる検出信号に基づき欠陥判定および、Haze計測を行うことを特徴とする。
摘要翻译：提供了一种缺陷检查方法和缺陷检查装置，其中改善了缺陷检测灵敏度，并且在抑制对样本的损害的同时，使用偏振检测进行雾度测量。缺陷检查装置具有向样品振荡的光源，其具有吸收小能量的波长带的激光束，以及两个独立的检测光学系统，即检测由通过照射由光源振荡的激光束的缺陷，以及检测由于晶片表面的粗糙度而产生的粗糙度散射光的雾度检测光学系统。相对于由两个检测光学系统检测的散射光独立地进行极化检测，并且基于两个不同的检测信号，执行缺陷确定和雾度测量。

36. 发明申请

WO2006066135A3 SYSTEM AND METHOD FOR SIGNAL PROCESSING FOR A WORKPIECE SURFACE INSPECTION 审中-公开
标题翻译：用于工件表面检查的信号处理系统和方法
公开(公告)号：WO2006066135A3
公开(公告)日：2009-04-16
申请号：PCT/US2005045782
申请日：2005-12-17
申请人： ADE CORP
发明人： ANDREWS SCOTT , JUDELL NEIL , BILLS RICHARD EARL , TIEMEYER TIMOTHY R
IPC分类号： G01N21/88 , G06F17/30 , G06K9/00
CPC分类号： G01N21/9501 , G01N21/21 , G01N21/47 , G01N21/4738 , G01N21/474 , G01N21/55 , G01N21/88 , G01N21/8806 , G01N21/95 , G01N21/956 , G01N2021/4707 , G01N2021/4711 , G01N2021/4792 , G01N2021/556 , G01N2021/8809 , G01N2021/8848 , G01N2021/8864 , G01N2021/8877 , G01N2021/8896 , G01N2201/0612 , G01N2201/105 , G06T7/0004 , G06T2207/30148 , Y10T29/49826
摘要： A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The signal processing subsystem comprises a series of data acquisition nodes, each dedicated to a collection detection module and a plurality of data reduction nodes, made available on a peer to peer basis to each data acquisition nodes. Improved methods for detecting signal in the presence of noise are also provided.
摘要翻译：提供了表面检查系统，以及相关的部件和方法。表面检查系统包括光束源子系统，光束扫描子系统，工件运动子系统，光学收集和检测子系统以及处理子系统。信号处理子系统包括一系列数据采集节点，每个数据采集节点专用于收集检测模块和多个数据缩减节点，可在每个数据采集节点的基础上可用。还提供了用于在存在噪声的情况下检测信号的改进方法。

37. 发明公开

EP2790012A1 LIGHTING DEVICE FOR INSPECTION AND LIGHTING METHOD FOR INSPECTION 审中-公开
标题翻译： BELEUCHTUNGSVORRICHTUNG ZUR INSPEKTION UND BELEUCHTUNGSVERFAHREN ZUR INSPEKTION
公开(公告)号：EP2790012A1
公开(公告)日：2014-10-15
申请号：EP12855609.9
申请日：2012-11-27
申请人： CCS Inc.
发明人： MASUMURA, Shigeki
IPC分类号： G01N21/84 , G01B11/30
CPC分类号： G01B11/30 , G01N21/8806 , G01N2021/8809 , G01N2021/8835 , G01N2201/068
摘要： In order to provide a lighting device for inspection and lighting method for inspection that, with use of inspection light, make it possible for a difference between a defect and a normal part, such as contrast, to appear, the lighting device for inspection is provided with: a surface light source 1 that emits the inspection light; a lens 2 that is provided on a light axis LX of the inspection light emitted from the surface light source 1, and between an inspection object W and the surface light source 1; and a first diaphragm 31 that is provided between the surface light source 1 and the lens 2, or between the lens 2 and the inspection object W, wherein: positions of the surface light source 1 and the lens 2 with respect to the inspection object W are set such that an image plane IM on which the surface light source 1 is imaged is present near the inspection object W; and a position of the first diaphragm 31 with respect to the lens 2 is set such that the central axis of an irradiation solid angle determined by a part of the inspection light, which is incident on an outer edge part of the image plane IM, is parallel to the light axis LX, or is displaced from the light axis and tilted by a predetermined amount.
摘要翻译：为了提供一种用于检查的照明装置，通过使用检查光，可以使缺陷和诸如对比度的正常部分之间的差异出现，提供用于检查的照明装置具有：发射检查光的面光源1; 设置在从面光源1发射的检查光的光轴LX上和检查对象W与面光源1之间的透镜2; 以及设置在表面光源1和透镜2之间或者在透镜2和检查对象W之间的第一光阑31，其中：面光源1和透镜2相对于检查对象W的位置被设置为使得在其上形成有面光源1的图像面IM存在于检查对象W附近; 并且第一光阑31相对于透镜2的位置被设定为使得入射在图像面IM的外缘部分上的被检查光的一部分确定的照射立体角的中心轴为平行于光轴LX，或者从光轴移位并倾斜预定量。

38. 发明公开

EP1795888A1 Apparatus for generating data for determining a property of a gemstone 有权
标题翻译：用于确定宝石的一个属性生成数据的装置
公开(公告)号：EP1795888A1
公开(公告)日：2007-06-13
申请号：EP05257579.2
申请日：2005-12-09
申请人： Overseas Diamonds Technologies N.V.
发明人： Van de Velde, Marc Frans Alida , Keersmaekers, Christiaan Louis Cecile
IPC分类号： G01N21/87 , G01N33/38
CPC分类号： G01N33/381 , G01N21/87 , G01N2021/8809
摘要： An apparatus for generating image data for use in determining a visual property of a gemstone perceptible to the human eye, such as a cut diamond, the apparatus comprising: a support structure for supporting a gemstone placed at an observation position, the support structure being capable of supporting a gemstone having an axis of symmetry such that the axis of symmetry is parallel to an axis X passing through the observation position; illumination means arranged to illuminate a gemstone so placed with a spatially varied light pattern; rotation means arranged to cause relative rotation between the light pattern and the support structure generally about the axis X; and a camera arranged to capture electronic images of light returned by the gemstone and to output said images as image data; control means arranged to control the rotation means and camera such that the camera captures an electronic image of the gemstone during said relative rotation at each of a plurality of different rotational positions of the support structure relative to the light pattern, the images being captured generally along the axis X, the illumination means comprising a reflector having a concave surface arranged to reflect light generally towards the gemstone, wherein the concave surface has at least one relatively reflective region and at least one relatively unreflective region, thereby creating said light pattern, the apparatus characterised in that: the length of a boundary between the relatively reflective and unreflective regions is greater than the minimum length.
摘要翻译：用于生成图像数据以用于确定性采矿宝石的视觉特性可感知到人眼，颜色的装置：诸如一个切割的钻石，该装置包括：支撑结构，用于支撑在观察位置放置一个宝石，支撑结构能够的支撑具有对称轴线检查做了宝石对称轴是平行于X穿过观察位置的轴; 照明装置，被设置以照射与在空间上变化的光图案，以便放置在宝石; 旋转装置，用来使所述光图案和绕X轴的支撑结构基因反弹之间的相对旋转; 和布置为捕获由宝石并且输出返回光的电子图像的照相机所述图像作为图像数据; 控制装置布置成控制所述旋转装置和相机沿着检查做上述相对转动期间，在每种情况下相对于光图案的支撑结构的不同的旋转位置的多个在宝石的电子图像的照相机捕捉，图像被捕获基因的反弹轴线X，该照明装置包括一个反射器具有布置为将光反射基因反弹向宝石的凹表面，worin凹面具有至少一个相对反射区域和至少一个相对鲁莽的区域，从而产生所述光图案，该装置 DASS：相对反射和鲁莽的区域之间的边界的长度大于最小长度。

39. 发明授权

EP1107012B1 Visual inspection apparatus 有权
标题翻译：光学检测仪
公开(公告)号：EP1107012B1
公开(公告)日：2006-04-05
申请号：EP00126105.6
申请日：2000-11-29
申请人： Nidek Co., Ltd.
发明人： Yonezawa, Eiji
IPC分类号： G01R31/308 , H01L21/66 , G01N21/88
CPC分类号： G01N21/9501 , G01N21/8803 , G01N21/8806 , G01N2021/8809 , G01N2021/8845

40. 发明公开

EP2790012A4 LIGHTING DEVICE FOR INSPECTION AND LIGHTING METHOD FOR INSPECTION 审中-公开
标题翻译：照明装置以供检查检验和照明方法
公开(公告)号：EP2790012A4
公开(公告)日：2015-07-08
申请号：EP12855609
申请日：2012-11-27
申请人： CCS INC
发明人： MASUMURA SHIGEKI
IPC分类号： G01N21/84 , G01B11/30 , G01N21/88
CPC分类号： G01B11/30 , G01N21/8806 , G01N2021/8809 , G01N2021/8835 , G01N2201/068

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