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    • 31. 发明申请
    • Selective light absorbing semiconductor surface
    • 选择性光吸收半导体表面
    • US20080066797A1
    • 2008-03-20
    • US11825558
    • 2007-07-05
    • Avto TavkhelidzeAmiran BibilashviliZara Taliashvili
    • Avto TavkhelidzeAmiran BibilashviliZara Taliashvili
    • H01L35/16
    • H01L31/055H01L31/02363Y02E10/52
    • A selective light absorbing semiconductor surface is disclosed. Said semiconductor surface is characterized by the presence of indentations or protrusions comprising a grating of dimensions such as to enhance the absorption of selected frequencies of radiation. In a preferred embodiment of the present invention, said grating is formed on the surface of a doped semiconductor for the purposes of optical frequency down conversion. The semiconductor is doped so as to create energy levels within the forbidden zone between the conduction and valence bands. Incident radiation excites electrons from the valence to conduction band from where they decay to the meta-stable newly created energy level in the forbidden zone. From there, electrons return to the valence band, accompanied by the emission of radiation of lower frequency than that of the incident radiation. Optical frequency down-conversion is thus efficiently and rapidly accomplished. In a further embodiment of the present invention said grating is formed on the entrance and exit surfaces of one or more layers of a single or multi-junction solar cell. In this embodiment said grating is characterized by indents of depth λ/4 and width >λ, where λ is the wavelength of solar radiation incident on the layer under consideration.
    • 公开了选择性光吸收半导体表面。 所述半导体表面的特征在于存在包括尺寸的光栅的凹陷或突起,以增强所选择的辐射频率的吸收。 在本发明的优选实施例中,为了进行光频率下变换,所述光栅形成在掺杂半导体的表面上。 半导体被掺杂以便在导电带和价带之间的禁区内产生能级。 入射辐射激发电子从价态衰减到禁带的元稳定新创能量的价带到导带。 从那里,电子返回价带,伴随着辐射频率低于入射辐射的辐射。 因此,光频率下变换被有效且快速地实现。 在本发明的另一实施例中,所述光栅形成在单结或多结太阳能电池的一层或多层的入射表面和出射表面上。 在该实施例中,所述光栅的特征在于深度为λ/ 4和宽度>λ,其中λ是入射在所考虑的层上的太阳辐射的波长。
    • 36. 发明申请
    • MOS transistor on the basis of quantum interferance effect
    • MOS晶体管在量子干涉效应的基础上
    • US20090072219A1
    • 2009-03-19
    • US12283378
    • 2008-09-11
    • Avto Tavkhelidze
    • Avto Tavkhelidze
    • H01L29/06
    • H01L29/66977B82Y10/00H01L29/125H01L29/66439H01L29/775H01L49/006
    • A new type of Metal Oxide Semiconductor (MOS) transistor that works on the basis of the Quantum Interference Depression (QID) effect is disclosed. QID occurs inside an n-type semiconductor source-drain electrode of special geometry. Due to QID the Fermi level of said semiconductor increases locally inside the source drain electrode, thereby creating a localised potential energy barrier in the path of electrons moving from source to drain regions. The height of the barrier depends on the degree of QID. QID is in turn regulated by the gate voltage via the charge depletion and hence change in effective dimensions of the special geometry of the semiconductor electrode. A gate voltage modulated potential energy barrier and is thus formed whereby current in said MOS transistor is controlled.
    • 公开了基于量子干涉抑制(QID)效应工作的新型金属氧化物半导体(MOS)晶体管。 QID发生在特殊几何形状的n型半导体源极 - 漏极电极内部。 由于QID,所述半导体的费米能级在源漏电极内局部增加,从而在从源极到漏极区域移动的电子的路径中产生局部势能势垒。 屏障的高度取决于QID的程度。 QID又通过电荷耗尽由栅极电压调节,因此也改变了半导体电极的特殊几何形状的有效尺寸。 栅电压调制势垒,由此形成,从而控制所述MOS晶体管中的电流。
    • 37. 发明申请
    • Transistor on the basis of new quantum interference effect
    • 晶体管在新的量子干涉效应的基础上
    • US20080224124A1
    • 2008-09-18
    • US12075943
    • 2008-03-13
    • Avto Tavkhelidze
    • Avto Tavkhelidze
    • H01L29/06
    • H01L29/66977B82Y10/00H01L29/1033H01L29/1037H01L29/4232
    • A quantum interference transistor comprising a thin metal film having a protrusion and a thin insulating layer between the metal film and protrusion. A potential barrier is formed in the region beneath the protrusion as a result of quantum interference caused by the geometry of the film and protrusion. A voltage applied between the electrically isolated protrusion (“island”) and the thin film leads to a change in the electron wave function of the island which in turn leads to a change in the Fermi level of the metal film in the entire region beneath the protrusion. Consequently, a potential barrier may or may not exist depending on the applied voltage, thus providing the present invention with the transistor-like property of switching between open and closed states.
    • 一种量子干涉晶体管,包括在金属膜和突起之间具有突起的薄金属膜和薄的绝缘层。 由于膜和突起的几何形状引起的量子干涉,在突起下方的区域中形成势垒。 施加在电隔离的突起(“岛”)和薄膜之间的电压导致岛的电子波函数的变化,这又导致金属膜在整个区域内的费米能级的变化 突出。 因此,取决于施加的电压,势垒可能存在或可能不存在,从而为本发明提供了在开态和闭态之间切换的晶体管状特性。
    • 40. 发明申请
    • Process for making electrode pairs
    • 制作电极对的工艺
    • US20060038290A1
    • 2006-02-23
    • US11254495
    • 2005-10-20
    • Avto TavkhelidzeStuart Harbron
    • Avto TavkhelidzeStuart Harbron
    • H01L29/40H01L21/44
    • H01J9/02Y10T29/413Y10T29/49128Y10T29/49147Y10T29/49156
    • The present invention is a process for making a matching pair of surfaces, which involves creating a network of channels on one surface of two substrate. The substrates are then coated with one or more layers of materials, the coating extending over the regions between the channels and also partially into the channels. The two coated surfaces are then contacted and pressure is applied, which causes the coatings to be pressed into the network of channels, and surface features on one of the layers of material creates matching surface features in the other, and vice versa. It also results in the formation of a composite. In a final step, the composite is separated, forming a matching pair of surfaces.
    • 本发明是一种用于制作匹配的一对表面的方法,其涉及在两个基板的一个表面上产生通道网络。 然后用一层或多层材料涂覆基材,涂层在通道之间的区域上延伸并且还部分地进入通道。 然后将两个涂覆的表面接触并施加压力,这导致涂层被压入通道网络中,并且一层材料上的表面特征在另一层上产生匹配的表面特征,反之亦然。 它还导致复合材料的形成。 在最后一步中,复合物被分离,形成一对匹配的表面。