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    • 31. 发明申请
    • Electron-emitting apparatus
    • 电子发射装置
    • US20060132024A1
    • 2006-06-22
    • US11224689
    • 2005-09-12
    • Tsutomu NanatakiIwao OhwadaTakayoshi AkaoHirokazu Nakamura
    • Tsutomu NanatakiIwao OhwadaTakayoshi AkaoHirokazu Nakamura
    • H01J3/00H01J63/04
    • H01J1/312B82Y10/00H01J1/30H01J1/32H01J29/467H01J31/127
    • An electron-emitting apparatus includes an emitter section made of a dielectric material, lower electrodes, upper electrodes having micro through holes, insulating layers disposed on the upper surface of the emitter section and between the adjacent upper electrodes, and focusing electrodes to which a predetermine potential is applied and which are disposed on the insulating layers. The electron-emitting apparatus applies a negative potential to the upper electrode to accumulate electrons in the emitter section and then applies a positive potential to the upper electrode. As a result, the polarization of the emitter section is reversed, and the accumulated electrons are emitted through the micro through holes in the upper electrodes by Coulomb repulsion. Owing to electric fields generated by the focusing electrodes, the emitted electrons travel in the upward direction of the upper electrode without spreading into a shape of a cone.
    • 电子发射装置包括由电介质材料制成的发射极部分,下电极,具有微通孔的上电极,设置在发射极部分的上表面和相邻上电极之间的绝缘层,以及预定的 施加电位并且设置在绝缘层上。 电子发射装置向上电极施加负电位以在发射极部分中积聚电子,然后向上电极施加正电位。 结果,发射极部分的极化反转,并且累积的电子通过库仑排斥通过上电极中的微通孔发射。 由于聚焦电极产生的电场,发射的电子沿着上电极的向上方向移动,而不会扩散成锥形。
    • 32. 发明授权
    • Electron beam irradiating apparatus
    • 电子束照射装置
    • US07518131B2
    • 2009-04-14
    • US11385483
    • 2006-03-21
    • Tsutomu NanatakiIwao OhwadaYuki BesshoTakayoshi Akao
    • Tsutomu NanatakiIwao OhwadaYuki BesshoTakayoshi Akao
    • A61N5/00
    • G21K5/04H01J37/317H01L21/67005
    • An electron beam irradiating apparatus includes a chamber being kept under vacuum, and housing a planar electron emitting element and a positioning unit and an object to be irradiated is directly irradiated with an electron beam emitted from the element. The planar electron emitting element includes: an emitter portion composed of a dielectric material; and a first electrode and a second electrode applied with a driving voltage for emitting electrons, and the first electrode is formed on a first surface of the emitter portion and has a plurality of through-holes where the emitter portion is exposed, a surface of the first electrode facing to the emitter portion around the through-holes is separated from the emitter portion, and the electron beam is emitted from the first surface of the emitter portion through the through-holes.
    • 电子束照射装置包括保持在真空下的室,并容纳平面电子发射元件和定位单元,并且被照射物体直接用从元件发射的电子束照射。 平面电子发射元件包括:由电介质材料构成的发射极部分; 以及施加有用于发射电子的驱动电压的第一电极和第二电极,并且所述第一电极形成在所述发射极部分的第一表面上,并且具有多个通过所述发射极部分露出的通孔, 面向通孔周围的发射极部分的第一电极与发射极部分分离,并且电子束通过通孔从发射器部分的第一表面发射。
    • 39. 发明授权
    • Inspection method of honeycomb structure
    • 蜂窝结构检验方法
    • US08421860B2
    • 2013-04-16
    • US12718240
    • 2010-03-05
    • Takayoshi AkaoAkihiro MizutaniKensuke Tanaka
    • Takayoshi AkaoAkihiro MizutaniKensuke Tanaka
    • H04N7/18
    • G01B11/26G01N21/94G01N21/95692
    • An inspection method of a honeycomb structure comprising the steps of illuminating one end face of a honeycomb structure as an inspection target by a light source; condensing, by a condensing lens as a lens having an angle of view, light which is emitted from the light source to the one end face, passed through cells of the honeycomb structure and radiated from the other end face; receiving the light condensed on the condensing lens by a camera; subjecting the light received by the camera to image processing by an image processor, thereby specifying the radiated position of the light on the other end face; and calculating the tilt of the cells of the honeycomb structure from the radiated position of the light on the other end face, and the direction of the tilt.
    • 一种蜂窝结构的检查方法,包括以下步骤:通过光源照射作为检查对象的蜂窝结构体的一个端面; 通过聚光透镜作为具有视角的透镜,从光源发射到一个端面的光通过蜂窝结构体的细胞并从另一端面辐射; 通过相机接收在聚光透镜上聚光的光; 使由相机接收的光经受图像处理器的图像处理,从而指定在另一端面上的光的辐射位置; 以及从另一端面上的光的辐射位置和倾斜方向计算蜂窝结构体的单元的倾斜度。