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    • 32. 发明申请
    • VEHICLE ELECTRONIC SYSTEM AND VEHICLE
    • 车辆电子系统和车辆
    • US20090157252A1
    • 2009-06-18
    • US12335984
    • 2008-12-16
    • Makoto SaenKenichi OsadaShigeru Oho
    • Makoto SaenKenichi OsadaShigeru Oho
    • G06F7/00
    • G07C5/0816
    • In a vehicle electronic system including a plurality of LSI boards, LSIS which cannot control a user interface such as image or audio directly issue a command for notifying a vehicle occupant of its own information via networks and an information control LSI receives the request to output a message. A mechanism for setting priority of processings regarding LSI status information notification to be lower than that of an apparatus control processing is provided in each of LSIs and networks so that real-time property of the apparatus control processing is maintained. In order to reduce network load regarding the LSI status information notification, a message content itself is stored in a memory in a vehicle information processing unit previously so that only an ID for identifying the message content is transmitted.
    • 在包括多个LSI板的车载电子系统中,无法控制诸如图像或音频的用户界面的LSIS直接发出用于通过网络通知车辆乘客自己的信息的命令,并且信息控制LSI接收输出 信息。 在LSI和网络的每一个中设置有用于将关于LSI状态信息通知的处理的优先级设置为低于设备控制处理的优先级的机制,从而保持设备控制处理的实时性。 为了减少关于LSI状态信息通知的网络负载,消息内容本身预先存储在车辆信息处理单元中的存储器中,从而仅发送用于识别消息内容的ID。
    • 33. 发明授权
    • Semiconductor integrated circuit including power domains
    • 半导体集成电路包括电源域
    • US07954023B2
    • 2011-05-31
    • US12342015
    • 2008-12-22
    • Kazuo OtsugaKenichi OsadaYusuke Kanno
    • Kazuo OtsugaKenichi OsadaYusuke Kanno
    • G01R31/28
    • H03K19/0016
    • A scan chain configuration and a control method for the same are provided, which are optimized for the leakage current reduction technique by a vector input in SoC in which many functional blocks are mounted. The semiconductor integrated circuit includes: plural power domains (Area1-AreaN) which have plural functional blocks; power switches (PSW1-PSWN) which can supply a power source for operation to the power domains; a scan chain provided for every power domain, and a memory unit (VEC) which supplies, to a scan chain, a vector to enable shifting to a low-leakage state. By re-coupling the scan chain only to a non-operating functional block, it is possible to perform shifting to a low-leakage state for a short time.
    • 提供了一种扫描链配置及其控制方法,其通过SoC中的矢量输入针对泄漏电流降低技术进行了优化,其中安装了许多功能块。 半导体集成电路包括:具有多个功能块的多个电力域(Area1-AreaN) 电源开关(PSW1-PSWN),可以向电源区域提供运行的电源; 为每个功率域提供的扫描链,以及向扫描链提供矢量以使其能够转换到低泄漏状态的存储器单元(VEC)。 通过将扫描链重新耦合到非操作功能块,可以在短时间内进行低泄漏状态的切换。
    • 34. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT
    • 半导体集成电路
    • US20090160544A1
    • 2009-06-25
    • US12342015
    • 2008-12-22
    • Kazuo OtsugaKenichi OsadaYusuke Kanno
    • Kazuo OtsugaKenichi OsadaYusuke Kanno
    • H01L25/00
    • H03K19/0016
    • A scan chain configuration and a control method for the same are provided, which are optimized for the leakage current reduction technique by a vector input in SoC in which many functional blocks are mounted. The semiconductor integrated circuit includes: plural power domains (Area1-AreaN) which have plural functional blocks; power switches (PSW1-PSWN) which can supply a power source for operation to the power domains; a scan chain provided for every power domain, and a memory unit (VEC) which supplies, to a scan chain, a vector to enable shifting to a low-leakage state. By re-coupling the scan chain only to a non-operating functional block, it is possible to perform shifting to a low-leakage state for a short time.
    • 提供了一种扫描链配置及其控制方法,其通过SoC中的矢量输入针对泄漏电流降低技术进行了优化,其中安装了许多功能块。 半导体集成电路包括:具有多个功能块的多个电力域(Area1-AreaN) 电源开关(PSW1-PSWN),可以向电源区域提供运行的电源; 为每个功率域提供的扫描链,以及向扫描链提供矢量以使其能够转换到低泄漏状态的存储器单元(VEC)。 通过将扫描链重新耦合到非操作功能块,可以在短时间内进行低泄漏状态的切换。
    • 37. 发明授权
    • Semiconductor integrated circuit and manufacturing method thereof
    • 半导体集成电路及其制造方法
    • US08531872B2
    • 2013-09-10
    • US13350340
    • 2012-01-13
    • Masanao YamaokaKenichi OsadaShigenobu Komatsu
    • Masanao YamaokaKenichi OsadaShigenobu Komatsu
    • G11C11/00
    • G11C11/417
    • High manufacturing yield is realized and variation in threshold voltage of each MOS transistor in a CMOS·SRAM is compensated. Body bias voltages are applied to wells for MOS transistors of each SRAM memory cell in any active mode of an information holding operation, a write operation and a read operation of an SRAM. Threshold voltages of PMOS and NMOS transistors of the SRAM are first measured. Control information is programmed into control memories according to results of determination. Levels of the body bias voltages are adjusted based on the programs so that variations in the threshold voltages of the MOS transistors of the CMOS·SRAM are controlled to a predetermined error span. Body bias voltage corresponding to a reverse body bias or an extremely shallow forward body bias is applied to a substrate for the MOS transistors with an operating voltage applied to the source of each MOS transistor.
    • 实现了高制造成品率,补偿了CMOS·SRAM中的每个MOS晶体管的阈值电压的变化。 在SRAM的信息保持操作,写入操作和读取操作的任何活动模式中,将体偏置电压施加到每个SRAM存储器单元的MOS晶体管的阱。 首先测量SRAM的PMOS和NMOS晶体管的阈值电压。 控制信息根据确定结果被编程到控制存储器中。 基于程序调整体偏置电压的电平,使得CMOS·SRAM的MOS晶体管的阈值电压的变化被控制到预定的误差范围。 将对应于反体偏置或非常浅的正向体偏置的体偏置电压施加到施加到每个MOS晶体管的源极的工作电压的MOS晶体管的衬底。
    • 39. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08270230B2
    • 2012-09-18
    • US13353949
    • 2012-01-19
    • Masanao YamaokaKenichi Osada
    • Masanao YamaokaKenichi Osada
    • G11C11/00G11C7/10G11C5/14
    • G11C8/08G11C11/412
    • The semiconductor device makes a comparison between a word-line timing signal for determining a word-line activation time and a reference signal, applies a back-gate bias for enlarging a read margin when the result of the comparison represents a low condition of the read margin, and applies a back-gate bias for enlarging a write margin when the comparison result represents a low condition of the write margin. The reference signal is selected depending on whether to compensate an operating margin fluctuating according to the word-line activation time (or word-line pulse width), or to compensate an operating margin fluctuating according to the process fluctuation (or variation in threshold voltage). By controlling the back-gate biases according to the word-line pulse width, an operating margin fluctuating according to the word-line pulse width, and an operating margin fluctuating owing to the variation in threshold voltage during its fabrication are improved.
    • 半导体器件在用于确定字线激活时间的字线定时信号与参考信号之间进行比较,当比较结果表示读取的低条件时,施加用于放大读取余量的反向栅极偏置 并且当比较结果表示写入余量的低条件时,施加用于扩大写入裕度的反向栅极偏置。 参考信号是根据是否补偿根据字线激活时间(或字线脉冲宽度)而波动的工作裕度,或者根据工艺波动(或阈值电压的变化)来补偿工作裕量波动, 。 通过根据字线脉冲宽度控制背栅极偏压,可以提高根据字线脉冲宽度而波动的工作裕度,以及由于其制造期间的阈值电压的变化而波动的工作裕度。