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    • 32. 发明授权
    • Architecture for high-speed magnetic memories
    • 高速磁记忆架构
    • US06778431B2
    • 2004-08-17
    • US10318709
    • 2002-12-13
    • Dietmar GoglWilliam Robert ReohrRoy Edwin Scheuerlein
    • Dietmar GoglWilliam Robert ReohrRoy Edwin Scheuerlein
    • G11C700
    • G11C11/1693G11C11/1673G11C11/1675
    • A magnetic memory circuit comprises a plurality of memory cells and a plurality of bit lines coupled to the memory cells for selectively accessing one or more of the memory cells. The memory circuit comprises at least one bit line programming circuit, configurable as a current source for generating a programming current for writing a logical state of at least one memory cell and/or a current sink for returning the programming current, and a first set of switches. The first set of switches are disabled at least during a read operation of the memory cells and at least a portion of the first set of switches are selectively enabled during a write operation of the memory cells. Each switch in the first set of switches is configured to selectively couple the at least one bit line programming circuit to a corresponding one of the bit lines in response to a first control signal. The memory circuit further comprises at least one sense amplifier and a second set of switches. The second set of switches are disabled at least during a write operation of the memory cells and at least a portion of the second set of switches are selectively enabled during a read operation of the memory cells. Each switch in the second set of switches is configured to selectively couple the at least one sense amplifier to a corresponding one of the bit lines in response to a second control signal.
    • 磁存储器电路包括多个存储器单元和耦合到存储器单元的多个位线,用于选择性地访问一个或多个存储器单元。 存储器电路包括至少一个位线编程电路,可配置为用于产生用于写入至少一个存储器单元的逻辑状态的编程电流的电流源和/或用于返回编程电流的电流吸收器,以及第一组 开关。 至少在存储器单元的读取操作期间禁用第一组开关,并且在存储器单元的写入操作期间选择性地使能第一组开关的至少一部分。 第一组开关中的每个开关被配置为响应于第一控制信号选择性地将至少一个位线编程电路耦合到对应的位线。 存储器电路还包括至少一个读出放大器和第二组开关。 至少在存储器单元的写入操作期间禁用第二组开关,并且在存储器单元的读取操作期间,第二组开关的至少一部分被选择性地使能。 第二组开关中的每个开关被配置为响应于第二控制信号选择性地将至少一个读出放大器耦合到对应的一个位线。
    • 35. 发明授权
    • Memory write circuit
    • 存储器写入电路
    • US07411815B2
    • 2008-08-12
    • US11273248
    • 2005-11-14
    • Dietmar Gogl
    • Dietmar Gogl
    • G11C11/00
    • G11C7/02G11C7/12G11C11/16
    • A design for a memory array that uses bi-directional write currents and that avoids switched ground connections for memory cells, thereby reducing signal loss and noise problems is described. Positive and negative current sources are provided to supply the bi-directional current that is used to write to a memory cell. These current sources may be selectively connected to bit lines that are electrically connected to the memory cells. Applying a positive current, from the positive current source, through a memory cell writes a “1”, and applying a negative current, from the negative current source, through a memory cell writes a “0”. Use of both a positive and a negative current source enables writing to the memory cells without relying on a switched ground connection to provide bi-directional current. This permits a ground connection of each memory cell to be connected to a fixed ground. An example in which this design is used with a spin injection magneto-resistive random access memory (MRAM) device is shown.
    • 描述了一种使用双向写入电流并避免用于存储器单元的开关接地连接的存储器阵列的设计,从而减少信号损耗和噪声问题。 提供正和负电流源以提供用于写入存储单元的双向电流。 这些电流源可以选择性地连接到电连接到存储器单元的位线。 从正电流源施加正电流通过存储单元写入“1”,并从负电流源施加负电流通过存储单元写入“0”。 使用正电流源和负电流源都可以对存储单元进行写操作,而无需依靠开关式接地连接来提供双向电流。 这允许每个存储单元的接地连接到固定地。 示出了这种设计与自旋注入磁阻随机存取存储器(MRAM)装置一起使用的示例。
    • 36. 发明申请
    • Memory device and method for reading data
    • 用于读取数据的存储器件和方法
    • US20070189059A1
    • 2007-08-16
    • US11354281
    • 2006-02-14
    • Dietmar Gogl
    • Dietmar Gogl
    • G11C11/00
    • G11C13/0011G11C7/12G11C13/0026G11C13/004G11C13/04G11C2013/0042G11C2213/79
    • The present invention relates to a memory with memory cells, wherein a memory cell comprises a resistive element and a switch, wherein the memory cells are connected with a common plate line and with respective bit lines, wherein the common plate line supplies a plate voltage, wherein the switches comprise control inputs that are connected with word lines for controlling the switching states, wherein the word lines are connected with a word line driver that supplies selected word lines with a voltage, wherein the bit lines are connected with second switches, wherein the first bit lines are connectable by respective second switches with a first voltage level and the second bit lines are connectable by respective second switches with a second voltage level, wherein a first and a second bit line are connectable as a bit line pair with a sense amplifier, wherein the sense amplifier amplifies a voltage difference between the first and the second bit line of the bit line pair, wherein the resistive element is able to change the resistance depending on an electrical voltage that is applied across the resistive element, and wherein the second voltage level is between the plate voltage level and the first voltage level.
    • 本发明涉及具有存储单元的存储器,其中存储单元包括电阻元件和开关,其中存储器单元与公共板线和各自的位线连接,其中公共板线提供板电压, 其中所述开关包括与用于控制所述开关状态的字线连接的控制输入,其中所述字线与提供所选字线的字线驱动器连接,其中所述位线与第二开关连接,其中, 第一位线可由具有第一电压电平的相应的第二开关连接,并且第二位线可由具有第二电压电平的各个第二开关连接,其中第一位线和第二位线可与读出放大器作为位线对连接 ,其中所述读出放大器放大位线对的第一和第二位线之间的电压差,其中, 静态元件能够根据施加在电阻元件上的电压来改变电阻,并且其中第二电压电平在板电压电平和第一电压电平之间。
    • 37. 发明申请
    • Memory write circuit
    • 存储器写入电路
    • US20070109840A1
    • 2007-05-17
    • US11273248
    • 2005-11-14
    • Dietmar Gogl
    • Dietmar Gogl
    • G11C11/00
    • G11C7/02G11C7/12G11C11/16
    • A design for a memory array that uses bi-directional write currents and that avoids switched ground connections for memory cells, thereby reducing signal loss and noise problems is described. Positive and negative current sources are provided to supply the bi-directional current that is used to write to a memory cell. These current sources may be selectively connected to bit lines that are electrically connected to the memory cells. Applying a positive current, from the positive current source, through a memory cell writes a “1”, and applying a negative current, from the negative current source, through a memory cell writes a “0”. Use of both a positive and a negative current source enables writing to the memory cells without relying on a switched ground connection to provide bi-directional current. This permits a ground connection of each memory cell to be connected to a fixed ground. An example in which this design is used with a spin injection magneto-resistive random access memory (MRAM) device is shown.
    • 描述了一种使用双向写入电流并避免用于存储器单元的开关接地连接的存储器阵列的设计,从而减少信号损耗和噪声问题。 提供正和负电流源以提供用于写入存储单元的双向电流。 这些电流源可以选择性地连接到电连接到存储器单元的位线。 从正电流源施加正电流通过存储单元写入“1”,并从负电流源施加负电流通过存储单元写入“0”。 使用正电流源和负电流源都可以对存储单元进行写操作,而无需依靠开关式接地连接来提供双向电流。 这允许每个存储单元的接地连接到固定地。 示出了这种设计与自旋注入磁阻随机存取存储器(MRAM)装置一起使用的示例。
    • 38. 发明授权
    • Sense amplifier bitline boost circuit
    • 感应放大器位线升压电路
    • US07161861B2
    • 2007-01-09
    • US10988787
    • 2004-11-15
    • Dietmar GoglHans-Heinrich Viehmann
    • Dietmar GoglHans-Heinrich Viehmann
    • G11C7/02G11C7/00
    • G11C5/145G11C7/06G11C7/12G11C11/16G11C2207/063
    • A current sense amplifier including clamping devices and a current mirror is configured to sense the resistance of an MTJ memory cell utilizing a bitline boost circuit to shorten the charging time for parasitic circuit capacitance. The bitline boost circuit includes a source follower coupled to a reference voltage and a switch coupled to another voltage source. The switch is enabled to conduct during an initial period of sensing the resistance of the memory cell. The source follower in the bitline boost circuit is configured to clamp the voltage of an input signal at substantially the same level as the clamping devices, and to provide additional current to shorten the period for charging parasitic capacitance. The resulting current sense amplifier can be used to implement a memory device with fast and reliable read times and low manufacturing cost.
    • 包括钳位装置和电流镜的电流检测放大器被配置为使用位线升压电路感测MTJ存储器单元的电阻,以缩短寄生电路电容的充电时间。 位线升压电路包括耦合到参考电压的源极跟随器和耦合到另一个电压源的开关。 在感测存储单元的电阻的初始时段期间,该开关能够导通。 位线升压电路中的源极跟随器被配置为将输入信号的电压钳位在与钳位装置基本相同的电平上,并提供额外的电流以缩短对寄生电容充电的周期。 所得到的电流检测放大器可用于实现具有快速可靠的读取时间和低制造成本的存储器件。
    • 40. 发明申请
    • MRAM with coil for creating offset field
    • 带有线圈的MRAM用于创建偏移场
    • US20060114713A1
    • 2006-06-01
    • US10998808
    • 2004-11-30
    • Daniel BraunDietmar Gogl
    • Daniel BraunDietmar Gogl
    • G11C11/00
    • H01L27/222G11C11/16
    • An MRAM memory chip includes a plurality of magnetoresistive memory cells each including a magnetic tunnel junction having first (fixed) and second (free) magnetic regions, where the second magnetic region includes at least two ferromagnetic layers that are antiferromagnetically coupled, wherein a coil surrounds the memory chip for creating a magnetic offset field. Further, a method of writing to an MRAM chip includes bringing the memory cells into an active state exhibiting a reduced switching field before writing thereto and bringing the memory cells into a passive state exhibiting enlarged switching field after writing thereto.
    • MRAM存储器芯片包括多个磁阻存储单元,每个磁阻存储单元包括具有第一(固定)和第二(自由)磁区的磁性隧道结,其中第二磁区包括反铁磁耦合的至少两个铁磁层,其中线圈围绕 用于产生磁偏移场的存储芯片。 此外,写入MRAM芯片的方法包括在写入之前使存储单元进入呈现减小的开关场的有效状态,并且在写入之后使存储单元成为展现放大开关场的被动状态。