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    • 33. 发明申请
    • Apparatus and Method for Testing Non-Contact Pads of a Semiconductor Device to be Tested
    • 用于测试要测试的半导体器件的非接触焊盘的装置和方法
    • US20110291690A1
    • 2011-12-01
    • US12784121
    • 2010-05-20
    • Yi-Shao LaiTsung-Yueh TsaiMing-Kun ChenI.L. LinKen JuangMing-Hsiang Cheng
    • Yi-Shao LaiTsung-Yueh TsaiMing-Kun ChenI.L. LinKen JuangMing-Hsiang Cheng
    • G01R31/26
    • G01R1/0483G01R1/0466G01R31/2886
    • The present invention relates to an apparatus and a method for testing non-contact pads of a semiconductor device to be tested. The apparatus includes an insulating body, at least one testing module and a plurality of probes. The insulating body includes an accommodating cavity, a lower opening and at least one side opening. The side opening communicates with the accommodating cavity and the lower opening. The testing module is disposed in the side opening, and each testing module includes a circuit board and an active chip. The active chip is disposed on to and electrically connected to the circuit board. The active chip has a plurality of testing pads exposed to the accommodating cavity. The probes are disposed in the lower opening. Whereby, the non-contact pads of the semiconductor device to be tested face but not in physically contact with the testing pads of the active chip, so as to test the proximity communication between the non-contact pads of the semiconductor device and the testing pads of the active chip.
    • 本发明涉及一种用于测试待测半导体器件的非接触焊盘的装置和方法。 该装置包括绝缘体,至少一个测试模块和多个探针。 绝缘体包括容纳腔,下开口和至少一个侧开口。 侧开口与容纳腔和下开口连通。 测试模块设置在侧开口中,每个测试模块包括电路板和有源芯片。 有源芯片设置在电路板上并与电路板电连接。 有源芯片具有暴露于容纳腔的多个测试焊盘。 探针设置在下开口中。 因此,要测试的半导体器件的非接触焊盘面对但不与有源芯片的测试焊盘物理接触,以便测试半导体器件的非接触焊盘与测试焊盘之间的接近连接 的有源芯片。
    • 37. 发明申请
    • SEMICONDUCTOR PACKAGE AND METHOD FOR MAKING THE SAME
    • 半导体封装及其制造方法
    • US20110309516A1
    • 2011-12-22
    • US12819796
    • 2010-06-21
    • Yi-Shao LaiTsung-Yueh TsaiMing-Kun ChenHsiao-Chuan ChangMing-Hsiang Cheng
    • Yi-Shao LaiTsung-Yueh TsaiMing-Kun ChenHsiao-Chuan ChangMing-Hsiang Cheng
    • H01L23/538H01L21/768H01L21/60
    • H01L23/48H01L23/481H01L24/48H01L25/0657H01L2224/16225H01L2224/48091H01L2224/48227H01L2225/06513H01L2225/06531H01L2225/06541H01L2924/00014H01L2924/1815H01L2224/45099H01L2224/45015H01L2924/207
    • The present invention relates to a semiconductor package and a method for making the same. The semiconductor package includes a first chip and a second chip. The first chip comprises a first active surface, at least one first non-top metal layer and a plurality of first signal coupling pads. The first non-top metal layer is disposed adjacent to and spaced apart from the first active surface by a second distance. The first signal coupling pads are disposed on the first non-top metal layer. The second chip is electrically connected to the first chip. The second chip comprises a second active surface, at least one second non-top metal layer and a plurality of third signal coupling pads. The second active surface faces the first active surface of the first chip. The second non-top metal layer is disposed adjacent to and spaced apart from the second active surface by a fourth distance. The third signal coupling pads are disposed on the second non-top metal layer and capacitively coupled to the first signal coupling pads of the first chip, so as to provide proximity communication between the first chip and the second chip. Whereby, the gap variation between the first signal coupling pads of the first chip and the third signal coupling pads of the second chip is under stringent control of the second distance and the fourth distance. Therefore, the mass-production yield of the semiconductor package is increased.
    • 半导体封装及其制造方法技术领域本发明涉及半导体封装及其制造方法。 半导体封装包括第一芯片和第二芯片。 第一芯片包括第一有源表面,至少一个第一非顶部金属层和多个第一信号耦合焊盘。 第一非顶部金属层设置成与第一有源表面相邻并间隔开第二距离。 第一信号耦合焊盘设置在第一非顶部金属层上。 第二芯片电连接到第一芯片。 第二芯片包括第二有源表面,至少一个第二非顶部金属层和多个第三信号耦合焊盘。 第二活性表面面向第一芯片的第一有效表面。 第二非顶部金属层被布置成与第二有源表面相邻并且与第二有源表面间隔开第四距离。 第三信号耦合焊盘设置在第二非顶部金属层上,并电容耦合到第一芯片的第一信号耦合焊盘,从而提供第一芯片与第二芯片之间的接近通信。 由此,第一芯片的第一信号耦合焊盘与第二芯片的第三信号耦合焊盘之间的间隙变化受到第二距离和第四距离的严格控制。 因此,半导体封装的批量生产量增加。