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    • 32. 发明授权
    • Guard rings with local coupling capacitance
    • 具有局部耦合电容的保护环
    • US08587023B2
    • 2013-11-19
    • US11137241
    • 2005-05-25
    • Cheng Hung Lee
    • Cheng Hung Lee
    • H01L29/74
    • H01L21/765H01L27/0629H01L27/0921
    • A guard ring system is disclosed for protecting an integrated circuit comprising. It has a first guard ring area formed by a well in the substrate, a capacitor area formed within the first guard ring area which further includes two well contacts formed into the well and biased by a first supply voltage, and a dielectric layer placed between the two contacts on the well with its first side in contact with the well. A second supply voltage complementary to the first supply voltage is applied to a second side of the dielectric layer so that a voltage difference across the dielectric layer provides a local capacitance embedded therein.
    • 公开了用于保护集成电路的保护环系统,包括: 它具有由衬底中的阱形成的第一保护环区域,形成在第一保护环区域内的电容器区域,其还包括形成在阱中并由第一电源电压偏置的两个阱触点,以及置于 井的两个接触点,其第一面与井接触。 与第一电源电压互补的第二电源电压被施加到电介质层的第二侧,使得跨介电层的电压差提供嵌入其中的局部电容。
    • 34. 发明授权
    • Eight-transistor SRAM memory with shared bit-lines
    • 具有共享位线的八晶体管SRAM存储器
    • US08320163B2
    • 2012-11-27
    • US12750430
    • 2010-03-30
    • Cheng Hung Lee
    • Cheng Hung Lee
    • G11C11/00G11C8/16
    • G11C8/16G11C11/412
    • An integrated circuit structure includes a first static random access memory (SRAM) cell including a first read-port and a first write-port; and a second SRAM cell including a second read-port and a second write-port. The first SRAM cell and the second SRAM cell are in a same row and arranged along a row direction. A first word-line is coupled to the first SRAM cell. A second word-line is coupled to the second SRAM cell. A read bit-line is coupled to the first SRAM cell and the second SRAM cell, wherein the read bit-line extends in a column direction perpendicular to the row direction. A write bit-line is coupled to the first SRAM cell and the second SRAM cell.
    • 集成电路结构包括包括第一读取端口和第一写入端口的第一静态随机存取存储器(SRAM)单元; 以及包括第二读取端口和第二写入端口的第二SRAM单元。 第一SRAM单元和第二SRAM单元位于同一行中并沿着行方向布置。 第一字线耦合到第一SRAM单元。 第二字线耦合到第二SRAM单元。 读位线耦合到第一SRAM单元和第二SRAM单元,其中读位线在垂直于行方向的列方向上延伸。 写位线耦合到第一SRAM单元和第二SRAM单元。
    • 35. 发明申请
    • Asymmetric Sense Amplifier Design
    • 非对称检测放大器设计
    • US20120213010A1
    • 2012-08-23
    • US13030722
    • 2011-02-18
    • Ching-Wei WuKuang Ting ChenCheng Hung Lee
    • Ching-Wei WuKuang Ting ChenCheng Hung Lee
    • G11C7/10G11C7/06H01L25/00
    • G11C7/08G11C7/065
    • A circuit includes a first inverter including a first PMOS transistor and a first NMOS transistor, and a second inverter including a second PMOS transistor and a second NMOS transistor. A first node is connected to gates of the first PMOS transistor and the first NMOS transistor and drains of the second PMOS transistor and the second NMOS transistor. A second node is connected to gates of the second PMOS transistor and the second NMOS transistor and drains of the first PMOS transistor and the first NMOS transistor. The circuit further includes a first capacitor having a first capacitance connected to the first node; and a second capacitor having a second capacitance connected to the second node. The second capacitance is greater than the first capacitance.
    • 电路包括:第一反相器,包括第一PMOS晶体管和第一NMOS晶体管;以及第二反相器,包括第二PMOS晶体管和第二NMOS晶体管。 第一节点连接到第一PMOS晶体管和第一NMOS晶体管的栅极以及第二PMOS晶体管和第二NMOS晶体管的漏极。 第二节点连接到第二PMOS晶体管和第二NMOS晶体管的栅极以及第一PMOS晶体管和第一NMOS晶体管的漏极。 电路还包括具有连接到第一节点的第一电容的第一电容器; 以及具有连接到第二节点的第二电容的第二电容器。 第二电容大于第一电容。
    • 40. 发明授权
    • Memory circuit having decoding circuits and method of operating the same
    • 具有解码电路的存储电路及其操作方法
    • US08634268B2
    • 2014-01-21
    • US12912971
    • 2010-10-27
    • Cheng Hung LeeHsu-Shun Chen
    • Cheng Hung LeeHsu-Shun Chen
    • G11C8/10
    • G11C8/10G11C11/418
    • The present application discloses a memory circuit having a first decoder coupled to a first memory bank and configured to receive a plurality of address control signals and to generate a first plurality of cell selection signals responsive to the plurality of address control signals and a second decoder coupled to a second memory bank and configured to receive a plurality of inverted address control signals and to generate a second plurality of cell selection signals responsive to the plurality of inverted address control signals. The memory circuit also has an address control signal buffer coupled to the second decoder and configured to convert the plurality of address control signals into the plurality of inverted address control signals.
    • 本申请公开了一种存储器电路,其具有耦合到第一存储体并被配置为接收多个地址控制信号并且响应于多个地址控制信号产生第一多个小区选择信号的第一解码器, 耦合到第二存储体并且被配置为接收多个反相地址控制信号,并响应于所述多个反相地址控制信号产生第二多个单元选择信号。 存储器电路还具有耦合到第二解码器的地址控制信号缓冲器,并且被配置为将多个地址控制信号转换成多个反相地址控制信号。