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    • 22. 发明授权
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US08605514B2
    • 2013-12-10
    • US12885066
    • 2010-09-17
    • Yasuhiro ShiinoEietsu Takahashi
    • Yasuhiro ShiinoEietsu Takahashi
    • G11C11/40
    • G11C16/10G11C11/5628G11C16/0483
    • According to one embodiment, a nonvolatile semiconductor memory device comprises a first memory cell, a second memory cell, and a control circuit. The first memory cell is connected to a first word line. The second memory cell is connected to a second word line which is adjacent to the first word line and has a width different from a width of the first word line. The control circuit applies a first voltage to the first word line and a second voltage different from the first voltage to the second word line. At least one of the first voltage and the second voltage is corrected by the control circuit based on write loop counts of the first memory cell and the second memory cell when the first memory cell and the second memory cell are write target cells in a write operation.
    • 根据一个实施例,非易失性半导体存储器件包括第一存储单元,第二存储单元和控制电路。 第一存储单元连接到第一字线。 第二存储单元连接到与第一字线相邻的第二字线,并且具有与第一字线的宽度不同的宽度。 控制电路将第一电压施加到第一字线,并将第一电压与第一电压不同于第二字线。 当第一存储单元和第二存储单元在写入操作中写入目标单元时,基于第一存储单元和第二存储器单元的写入循环计数,控制电路校正第一电压和第二电压中的至少一个电压 。
    • 24. 发明授权
    • Nonvolatile semiconductor memory device and operating method thereof
    • 非易失性半导体存储器件及其操作方法
    • US08422301B2
    • 2013-04-16
    • US13169414
    • 2011-06-27
    • Yasuhiro ShiinoEietsu TakahashiYuji Takeuchi
    • Yasuhiro ShiinoEietsu TakahashiYuji Takeuchi
    • G11C11/34
    • G11C11/5628G11C16/10G11C16/3418
    • A nonvolatile semiconductor memory device in accordance with an embodiment includes a memory cell array. A control unit performs control of repeating a write operation, a write verify operation, and a step-up operation, the write operation being an operation to apply a write pulse voltage to a selected memory cell and an intermediate voltage to an unselected memory cell. The control unit controls the step-up operation such that, in a first period, the intermediate voltage is maintained at a constant value, and, in a second period, the intermediate voltage is raised by a certain value. The control unit controls the step-up operation such that the first period includes an operation to raise the write pulse voltage by a first step-up value, and the second period includes an operation to raise the write pulse voltage by a second step-up value smaller than the first step-up value.
    • 根据实施例的非易失性半导体存储器件包括存储单元阵列。 控制单元执行重复写入操作,写入验证操作和升压操作的控制,写入操作是将写入脉冲电压施加到所选择的存储器单元和中间电压到未选择存储单元的操作。 控制单元控制升压操作,使得在第一时间段中,中间电压保持在恒定值,并且在第二时间段内将中间电压升高一定值。 控制单元控制升压操作,使得第一周期包括用于将写入脉冲电压升高第一升压值的操作,并且第二周期包括通过第二升压升高写入脉冲电压的操作 值小于第一升压值。
    • 25. 发明申请
    • NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
    • 非易失性半导体存储器件
    • US20120206968A1
    • 2012-08-16
    • US13457560
    • 2012-04-27
    • Yasuhiro ShiinoEietsu Takahashi
    • Yasuhiro ShiinoEietsu Takahashi
    • G11C16/04
    • G11C16/0483G11C11/5635G11C16/08G11C16/10G11C16/14G11C16/16G11C16/28G11C16/3404G11C16/3413G11C16/344G11C16/3445G11C16/3463G11C2211/5621
    • A nonvolatile semiconductor memory device includes a control circuit configured to control a soft program operation of setting nonvolatile memory cells to a first threshold voltage distribution state of the nonvolatile memory cells. When a characteristic of the nonvolatile memory cells is in a first state, the control circuit executes the soft program operation by applying a first voltage for setting the nonvolatile memory cells to the first threshold voltage distribution state to first word lines, and applying a second voltage higher than the first voltage to a second word line. When the characteristic of the nonvolatile memory cells is in a second state, the control circuit executes the soft program operation by applying a third voltage equal to or lower than the first voltage to the first word lines and applying a fourth voltage lower than the second voltage to the second word line.
    • 非易失性半导体存储器件包括:控制电路,被配置为控制将非易失性存储器单元设置为非易失性存储单元的第一阈值电压分布状态的软编程操作。 当非易失性存储单元的特性处于第一状态时,控制电路通过将用于将非易失性存储单元设置为第一阈值电压分布状态的第一电压施加到第一字线来执行软编程操作,并且施加第二电压 高于第一个电压到第二个字线。 当非易失性存储单元的特性处于第二状态时,控制电路通过向第一字线施加等于或低于第一电压的第三电压并施加低于第二电压的第四电压来执行软编程操作 到第二个字线。
    • 26. 发明申请
    • NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
    • 非易失性半导体存储器件
    • US20110063917A1
    • 2011-03-17
    • US12878624
    • 2010-09-09
    • Yasuhiro ShiinoEietsu Takahashi
    • Yasuhiro ShiinoEietsu Takahashi
    • G11C16/04
    • G11C16/0483G11C11/5635G11C16/08G11C16/10G11C16/14G11C16/16G11C16/28G11C16/3404G11C16/3413G11C16/344G11C16/3445G11C16/3463G11C2211/5621
    • A nonvolatile semiconductor memory device includes a control circuit configured to control a soft program operation of setting nonvolatile memory cells to a first threshold voltage distribution state of the nonvolatile memory cells. When a characteristic of the nonvolatile memory cells is in a first state, the control circuit executes the soft program operation by applying a first voltage for setting the nonvolatile memory cells to the first threshold voltage distribution state to first word lines, and applying a second voltage higher than the first voltage to a second word line. When the characteristic of the nonvolatile memory cells is in a second state, the control circuit executes the soft program operation by applying a third voltage equal to or lower than the first voltage to the first word lines and applying a fourth voltage lower than the second voltage to the second word line.
    • 非易失性半导体存储器件包括:控制电路,被配置为控制将非易失性存储器单元设置为非易失性存储单元的第一阈值电压分布状态的软编程操作。 当非易失性存储单元的特性处于第一状态时,控制电路通过将用于将非易失性存储单元设置为第一阈值电压分布状态的第一电压施加到第一字线来执行软编程操作,并且施加第二电压 高于第一个电压到第二个字线。 当非易失性存储单元的特性处于第二状态时,控制电路通过向第一字线施加等于或低于第一电压的第三电压并施加低于第二电压的第四电压来执行软编程操作 到第二个字线。
    • 28. 发明授权
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US08867277B2
    • 2014-10-21
    • US13601233
    • 2012-08-31
    • Tatsuo IzumiEietsu Takahashi
    • Tatsuo IzumiEietsu Takahashi
    • G11C11/34G11C16/08G11C16/10G11C16/12G11C16/30
    • G11C16/12G11C16/08G11C16/10G11C16/30
    • A first non-selected word line including a word line adjacent to a selected word line is applied with a first write pass voltage. Furthermore, a second non-selected word line which is a non-selected word line excluding the first non-selected word line is applied with a second write pass voltage smaller than a program voltage. A control circuit, in the write operation, raises the first write pass voltage toward a first target value by executing a voltage raising operation having a first voltage rise width, X times, and raises the second write pass voltage toward a second target value by executing a voltage raising operation having a second voltage rise width, Y times. The first voltage rise width is larger than the second voltage rise width, and X times is fewer than Y times.
    • 包括与选定字线相邻的字线的第一非选择字线被施加第一写通电压。 此外,作为除了第一未选择字线之外的未选择字线的第二非选择字线被施加小于编程电压的第二写入通过电压。 在写入操作中,控制电路通过执行具有第一电压上升幅度X倍的升压动作将第一写入通过电压提高到第一目标值,并且通过执行第二写入通过电压向第二目标值升高第二写入通过电压 具有第二电压上升宽度的升压操作Y次。 第一电压上升幅度大于第二电压上升幅度,X倍少于Y倍。
    • 29. 发明授权
    • Plastic lens array
    • 塑料透镜阵列
    • US4747667A
    • 1988-05-31
    • US860483
    • 1986-05-07
    • Akira TanakaEietsu TakahashiMasao TanakaMinoru TerashimaToshito Hara
    • Akira TanakaEietsu TakahashiMasao TanakaMinoru TerashimaToshito Hara
    • G03G15/00G02B3/00G02B17/00G02B17/08G02B27/18G02B13/26G02B5/04
    • G02B17/086G02B17/002G02B17/008G02B3/0068
    • A plastic lens array including the following members which are formed integrally as one block by a plastic material; a lens array body member; a plurality of object convex lenses into which the light from an object is made incident, the object convex lenses being arranged side by side in one row along one side of the lens array body member; a plurality of image convex lenses corresponding to the object convex lenses, and being arranged side by side in a row along an opposite side of the lens array body member; a plurality of image inverting portions corresponding to the object convex lenses, each of the image inverting portions having a pair of roof surfaces which are substantially normal to each other to invert the image of an object; a first reflecting surface arranged at the backs of the object convex lenses, for totally reflecting the incident light of an object through the object convex lenses with an angle exceeding a critical angle and for guiding the reflected light of the object to a roof surface in each pair of the roof surfaces; and a second reflecting surface arranged at the backs of the image convex lenses, for totally reflecting the inverted light of an object from the other roof surface in each pair of the roof surfaces with an angle exceeding the critical angle and for guiding the reflected light of an object to the image convex lenses.
    • 一种塑料透镜阵列,包括由塑料材料一体形成的下列构件; 透镜阵列体部件; 使来自物体的光入射到其中的多个物体凸透镜,物镜凸透镜沿着透镜阵列本体构件的一侧并排布置成一列; 多个与物体凸透镜相对应的图像凸透镜,并且沿着透镜阵列本体构件的相对侧并排布置; 对应于物体凸透镜的多个图像反转部分,每个图像翻转部分具有大致相互垂直的一对顶表面,以反转物体的图像; 第一反射面,布置在物体凸透镜的后部,用于通过物体凸透镜以超过临界角的角度全反射物体的入射光,并将物体的反射光引导到每个 一对屋顶表面; 以及布置在图像凸透镜的后部的第二反射表面,用于以超过临界角的角度全面地反映来自每对屋顶表面中的另一屋顶表面的物体的倒置的光,并且用于引导 图像凸透镜的对象。