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    • 23. 发明专利
    • PURIFICATION OF RAW QUARTZ POWDER
    • JP2000095534A
    • 2000-04-04
    • JP26987098
    • 1998-09-24
    • TOSHIBA CERAMICS CO
    • FUJIWARA MARIKOTOKUTAKE FUMIO
    • C03B20/00C03C1/02
    • PROBLEM TO BE SOLVED: To rapidly, surely and economically attain a target purity by analyzing a liq. etchant after plural etchings to investigate the degree of contamination of the surface and inside of raw quartz powder and selecting a predetermined purification method based on the degree of contamination to purify the powder. SOLUTION: When the degree of contamination of the surface is higher than a critical degree of contamination and only the degree of internal contamination close to the surface is higher than the critical degree, acid treatment for removing the surface contaminant and etching by hydrofluoric acid are applied. When the internal contaminant is uniformly distributed and the degree of the internal contamination is higher than the critical degree, acid treatment and gas treatment are applied, and, when the degree of the internal contamination is lower than the critical degree, acid treatment is applied. Further, when the degree of the surface contamination is higher than the critical degree and only the degree of the internal contamination close to the surface is higher than the critical degree, etching is conducted by hydrofluoric acid, and gas treatment is applied when the internal contamination is higher than the critical degree.
    • 24. 发明专利
    • DROPLET SUPPLY/COLLECTION DEVICE FOR ANALYZING SILICON WAFER SURFACE
    • JP2000019084A
    • 2000-01-21
    • JP20129598
    • 1998-07-01
    • TOSHIBA CERAMICS CO
    • NAGAMINE YOSHINOBUTANAKA MASAFUMITOKUTAKE FUMIO
    • G01N1/28G01N33/00H01L21/66
    • PROBLEM TO BE SOLVED: To automatically supply and collect a droplet by vertically arranging a cylindrical droplet collection pipe with a droplet take-in port at the lower end in the rear side in the rotary direction of a rotary stand vertically at the upper portion of the rotary stand so that it can elevate and move horizontally and incorporating a droplet supply/collection means (capillary) in the collection pipe. SOLUTION: A droplet collection pipe 3 is moved and a lower end is positioned directly above the center part of a silicon wafer 2 on a rotary stand 1, a solenoid valve 10 is switched and a required amount of HF system solution is dropped onto the wafer 2 through a liquid-feeding pipe 7 and a capillary 5, and then the solenoid valve 10 is switched, and the capillary 5 is connected to a breathing pipe 9. A solution dropped onto the wafer 2 reacts with an oxide film and is scattered while taking in impurities, and forms a droplet 12 at various locations. Then, when the collection pipe 3 is moved in the radial direction of the rotary stand 1 while rotating the rotary stand 1, the droplet 12 is taken into the collection pipe 3 from a droplet take-in port 4 and rises in the capillary 5, and is carried to an analysis device via a connection pipe 8. Static electricity being generated in the collection pipe 3 and the capillary 5 is discharged via the grounding wire.
    • 25. 发明专利
    • QUARTZ GLASS CRUCIBLE AND ITS PRODUCTION
    • JPH11199370A
    • 1999-07-27
    • JP392198
    • 1998-01-12
    • TOSHIBA CERAMICS CO
    • SHINPO MASARUTOKUTAKE FUMIO
    • C03B20/00C30B15/10C30B29/06
    • PROBLEM TO BE SOLVED: To produce a quartz glass crucible capable of suppressing local corrosion and crystallization of an inner surface, and impurity contamination of a silicon molten liquid, and ensiling the corrective action against deterioration of the surface of the crucible, and overcoming of inconvenience of treatment by forming the inner surface of a crucible wall out of a transparent quartz glass layer covering a layer containing a crystallization improver. SOLUTION: A metal ion (e.g. an alkali ion) is used as a crystallization improver. The concentration to be used is over 0 ppm but not over 500 ppm (e.g. 50 ppm). The thickness of a transparent quartz glass layer is over 0 mm and not over 1 mm (e.t. 6-800 μm). A layer containing the crystallization improver is rapidly crystallized before the pulling-up of the single crystal when a polycrystal silicon is melted at a high temperature of >=1,400 deg.C because of the double layered structure of the inner surface of the crucible. When the single crystal is pulled up thereafter, the transparent quartz glass layer is slowly crystallized on the surface layer side by using such crystallized layer as a nuclear and as a result, the whole surface of the crucible is in a state covered with the crystal.
    • 29. 发明专利
    • Photocatalytic filter and photocatalytic deodorization apparatus using the same
    • 光化学过滤器和光化学除臭装置
    • JP2006026507A
    • 2006-02-02
    • JP2004207999
    • 2004-07-15
    • Toshiba Ceramics Co Ltd東芝セラミックス株式会社
    • ZHOU ZHONGHUATOKUTAKE FUMIOISHII TATSUYAYO HIENSUZUKI TAKASHI
    • B01J35/02A61L9/00A61L9/01A61L9/20B01D53/86B01J35/10
    • PROBLEM TO BE SOLVED: To provide a photocatalytic filter having photocatalysis and consequently excellent deodorizing performance and a photocatalytic deodorization apparatus in which the photocatalytic filter is used and which exhibits a maximum deodorizing result efficiently. SOLUTION: The photocatalytic deodorization apparatus is constituted so that an ultraviolet lamp 2 is put between two pieces of the plate-shaped photocatalytic filters 1 each of which is obtained by forming a titanium oxide film of ≤1 μm film thickness on the surface layer of a ceramic skeleton and has ≥5 m 2 /cm 3 surface area. The optical intensity on the light receiving surface of the photocatalytic filter is ≥0.5 mW/cm 2 when the light having 365 nm wavelength is emitted from the ultraviolet lamp 2. The ratio of the minimum value to the maximum value in an optical intensity distribution on the light receiving surface is controlled to be 0.5 to 1.0. COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供一种具有光催化和因此良好的除臭性能的光催化过滤器和其中使用光催化过滤器的光催化除臭装置,并且其有效地表现出最大的除臭效果。 解决方案:光催化除臭装置构成为将紫外线灯2放置在两片板状光催化过滤器1之间,每个板状光催化过滤器1通过在表面上形成厚度≤1μm的氧化钛膜而获得 陶瓷骨架层,并具有≥5m 2 / cm 3 表面积。 当从紫外线灯2发出365nm波长的光时,光催化滤光片的光接收表面的光强度为≥0.5mW/ cm·SP> 2 。最小值与最大值之比 将受光面上的光强度分布的值控制在0.5〜1.0。 版权所有(C)2006,JPO&NCIPI
    • 30. 发明专利
    • Titanium dioxide microparticle, method for producing the same, and method for producing visible-ray-activatable photocatalyst
    • 二氧化钛微球,其生产方法和生产可见光活化光催化剂的方法
    • JP2005047786A
    • 2005-02-24
    • JP2003301137
    • 2003-08-26
    • Toshiba Ceramics Co Ltd東芝セラミックス株式会社
    • ZHOU ZHONGHUATOKUTAKE FUMIOKONDO HIROYUKIYAMAGUCHI HIROSHIISHII TATSUYA
    • B01D53/86B01J27/24B01J31/38B01J35/02B01J35/08B01J35/10B01J37/08C01G23/047
    • PROBLEM TO BE SOLVED: To provide titanium dioxide microparticles which exhibit higher photocatalysis than the conventional upon being irradiated with visible rays and develop photocatalysis excellent in stability and persistence, to provide a method for producing the same, and to provide a method for producing a visible-ray-activatable photocatalyst. SOLUTION: The titanium dioxide microparticles are obtained by heat-treating titanium dioxide microparticles as a raw material at 500 to 620°C in a reducing gas atmosphere containing a nitrogen-containing gas to dope the titanium dioxide with at least one member selected from C, H, and S and with N. The obtained titanium dioxide microparticles are characterized in that the concentration of the formed acetone gas is at least 500 ppm or higher when the concentration is measured by placing a 10 cm-square uniform layer of 0.2 g of the titanium microparticles in a one-liter gas bag, setting the initial isopropanol gas concentration at 1,500±150 ppm, and irradiating the sample with light from an ultraviolet-filtered fluorescent lamp for 1 hour at an intensity at a wavelength of 420 nm of 0.5 mW/cm 2 . COPYRIGHT: (C)2005,JPO&NCIPI
    • 解决的问题:为了提供在照射可见光线时显示比常规光催化更高的二氧化钛微粒,并且开发出稳定性和持久性优异的光催化剂,以提供其制备方法,并提供一种方法 产生可见光激活的光催化剂。 解决方案:二氧化钛微粒通过在含有含氮气体的还原性气体气氛中在500-620℃下以二氧化钛微粒为原材料进行热处理,以选择至少一种选择的二氧化钛 得到的二氧化钛微粒的特征在于,当通过放置10cm 2的均匀的0.2层的0.2倍浓度时,形成的丙酮气体的浓度为至少500ppm以上 g的钛微粒在1升气囊中,将初始异丙醇气体浓度设定在1,500±150ppm,并用来自紫外线过滤的荧光灯的光以420nm的强度照射样品1小时 为0.5mW / cm 2 SP / 2。 版权所有(C)2005,JPO&NCIPI