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    • 26. 发明申请
    • SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME
    • 半导体结构及其形成方法
    • WO2013117155A1
    • 2013-08-15
    • PCT/CN2013/071398
    • 2013-02-05
    • GUO, LeiLI, Yuan
    • GUO, LeiLI, Yuan
    • H01L21/20H01L33/00H01L29/02H01L21/02
    • H01L29/1075H01L21/0237H01L21/02439H01L21/02521H01L21/02639H01L21/02647H01L29/2003
    • A method for forming a semiconductor structure is provided. The method comprises steps of: providing a substrate (100); forming a first single crystal semiconductor layer (200) on the substrate (100); etching the first single crystal semiconductor layer (200) to form a plurality of holes or trenches extending to a top surface of the substrate (100), or etching the first single crystal semiconductor layer (200) and the substrate (100) to form a plurality of holes or trenches extending into the substrate (100); etching the substrate (100) through the plurality of holes or trenches to form a porous structure in a region under the top surface of the substrate (100), thus forming a patterned structure on the porous structure; and depositing a single crystal semiconductor material to form a second single crystal semiconductor layer (300) on the patterned structure.
    • 提供一种形成半导体结构的方法。 该方法包括以下步骤:提供衬底(100); 在所述基板(100)上形成第一单晶半导体层(200); 蚀刻第一单晶半导体层(200)以形成延伸到衬底(100)的顶表面的多个孔或沟槽,或蚀刻第一单晶半导体层(200)和衬底(100)以形成 多个孔或沟槽延伸到衬底(100)中; 通过所述多个孔或沟槽蚀刻所述衬底(100)以在所述衬底(100)的顶表面下方的区域中形成多孔结构,从而在所述多孔结构上形成图案化结构; 以及沉积单晶半导体材料以在所述图案化结构上形成第二单晶半导体层(300)。
    • 27. 发明申请
    • SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME
    • 半导体结构及其形成方法
    • WO2013117153A1
    • 2013-08-15
    • PCT/CN2013/071388
    • 2013-02-05
    • GUO, LeiLI, Yuan
    • GUO, LeiLI, Yuan
    • H01L21/02
    • H01L29/1075H01L21/0237H01L21/02439H01L21/02521H01L21/02639H01L21/02647H01L21/0265H01L29/2003
    • A method for forming a semiconductor structure is provided. The method comprises steps of: providing a substrate (100); forming a first single crystal semiconductor layer (200) on the substrate (100); etching the first single crystal semiconductor layer (200) to form a plurality of holes or trenches extending to a top surface of the substrate (100), or etching the first single crystal semiconductor layer (200) and the substrate (100) to form a plurality of holes or trenches extending into the substrate (100); etching the substrate (100) through the plurality of holes or trenches to form a plurality of supporting structures (1001) in a region under the top surface of the substrate (100), thus forming a patterned structure; and depositing a single crystal semiconductor material to form a second single crystal semiconductor layer (300) on the patterned structure.
    • 提供一种形成半导体结构的方法。 该方法包括以下步骤:提供衬底(100); 在所述基板(100)上形成第一单晶半导体层(200); 蚀刻第一单晶半导体层(200)以形成延伸到衬底(100)的顶表面的多个孔或沟槽,或蚀刻第一单晶半导体层(200)和衬底(100),以形成 多个孔或沟槽延伸到衬底(100)中; 通过所述多个孔或沟槽蚀刻所述衬底(100)以在所述衬底(100)的顶表面下方的区域中形成多个支撑结构(1001),从而形成图案化结构; 以及沉积单晶半导体材料以在所述图案化结构上形成第二单晶半导体层(300)。
    • 28. 发明申请
    • SEMICONDUCTOR VOLTAGE TRANSFORMATION STRUCTURE
    • 半导体电压转换结构
    • WO2013067969A1
    • 2013-05-16
    • PCT/CN2012/084417
    • 2012-11-09
    • GUO, Lei
    • GUO, Lei
    • H01L31/12
    • H01L31/125H01L31/173
    • A semiconductor voltage transformation structure is provided. The semiconductor voltage transformation structure comprises: a first electrode layer (100); an electricity-to-light conversion layer (102) formed on the first electrode layer (100); a second electrode layer (104) formed on the electricity-to-light conversion layer (102); a first isolation layer (106) formed on the second electrode layer (104); a third electrode layer formed (108) on the first isolation layer (106); a light-to-electricity conversion layer (110) formed on the third electrode layer (108); and a fourth electrode layer ( 112 ) formed on the light-to-electricity conversion layer (110), in which the first isolation layer (106), the second electrode layer (104) and the third electrode layer (108) are transparent to a working light emitted by the electricity-to-light conversion layer (102).
    • 提供了半导体电压转换结构。 半导体电压转换结构包括:第一电极层(100); 形成在所述第一电极层(100)上的电光转换层(102)。 形成在所述电光转换层(102)上的第二电极层(104)。 形成在第二电极层(104)上的第一隔离层(106); 在第一隔离层(106)上形成的第三电极层(108); 形成在所述第三电极层(108)上的光电转换层(110)。 以及形成在所述光电转换层(110)上的第四电极层(112),其中所述第一隔离层(106),所述第二电极层(104)和所述第三电极层(108)对于 由电 - 光转换层(102)发射的工作光。
    • 29. 发明申请
    • SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
    • 半导体结构及其形成方法
    • WO2012163049A1
    • 2012-12-06
    • PCT/CN2011/082112
    • 2011-11-11
    • TSINGHUA UNIVERSITYWANG, JingGUO, Lei
    • WANG, JingGUO, Lei
    • H01L29/06H01L29/24H01L21/8234H01L27/088
    • H01L29/778H01L21/764H01L21/823412H01L21/823418H01L21/823481H01L29/66431
    • A semiconductor structure and a method for forming the same are provided. The semiconductor structure comprises: a Si substrate (1100); a plurality of convex structures (1200) formed on the Si substrate (1100), in which every two adjacent convex structures (1200) are separated by a cavity in a predetermined pattern, and the cavity between every two adjacent convex structures (1200) is less than 50nm in width; a first semiconductor film (1300), in which the first semiconductor film (1300) is formed between the every two adjacent convex structures (1200) and connected with tops of the every two adjacent convex structures (1200); a buffer layer (2100) formed on the first semiconductor film (1300); and a high-mobility III-V compound semiconductor layer (2000) formed on the buffer layer (2100).
    • 提供半导体结构及其形成方法。 半导体结构包括:Si衬底(1100); 形成在Si衬底(1100)上的多个凸起结构(1200),其中每两个相邻凸起结构(1200)以预定图案被空腔隔开,并且每两个相邻凸起结构(1200)之间的空腔是 宽度小于50nm; 第一半导体膜(1300),其中第一半导体膜(1300)形成在每两个相邻的凸起结构(1200)之间并与每两个相邻凸起结构(1200)的顶部连接; 形成在所述第一半导体膜(1300)上的缓冲层(2100); 和形成在缓冲层(2100)上的高迁移率III-V族化合物半导体层(2000)。
    • 30. 发明申请
    • DEVICE AND METHOD FOR FIELD EXPANSION
    • 用于现场扩展的装置和方法
    • WO2012159348A1
    • 2012-11-29
    • PCT/CN2011/077689
    • 2011-07-27
    • 3M INNOVATIVE PROPERTIES COMPANYZHANG, MingYANG, JinquanHUANG, ZhengXU, ZhigangMA, JiangjiangGUO, Lei
    • ZHANG, MingYANG, JinquanHUANG, ZhengXU, ZhigangMA, JiangjiangGUO, Lei
    • B29C61/00H02G15/18
    • H02G15/1826B29C55/24B29C61/065B29C63/18B29K2021/00H02G15/182Y10T29/4987Y10T29/53391Y10T29/53657
    • A device and a method for a field expansion. A support core (30) is inserted into the device by a field expansion apparatus. The field expansion apparatus has a pressure applying means (20) defining a radially expandable inner surface and a flat surface radially outwardly extending from the radially expandable inner surface. The device comprises an elastomeric tubing (10) and an adapter (40). The elastomeric tubing (10) has a forward end opposite a rearward end and an axial bore extending therethrough configured to receive the support core (30). The adapter (40) has a step portion (41) defined by a radial outer surface (42) and a flat surface (43) radially outwardly extending from the radial outer surface (42), and an axial bore (44) extending therethrough. The axial bore (44) has a diameter substantially the same as the diameter of the axial bore (12) of the elastomeric tubing (10). The adapter (40) is positioned substantially coaxially with the elastomeric tubing (10) between the pressure applying means (20) and the elastomeric tubing (10) such that, in response to inserting the support core (30) from the rearward end into the elastomeric tubing (10), the flat surface of the adapter (40) is pushed against the flat surface of the pressure applying means (20) by the elastomeric tubing (10); the interface between a rearward end of the adapter (40) and the forward end of the elastomeric tubing (10) is of high friction so that the adapter (40) and the elastomeric tubing (10) expand radially in unison, and the radial outer surface of the adapter (40) exerts a radially outward pressure against the radially expandable inner surface of the pressure applying means (20). device and method for field expansiondevice and method for field expansion
    • 一种用于现场扩展的设备和方法。 通过现场扩张装置将支撑芯(30)插入到装置中。 场扩展装置具有限定径向可膨胀的内表面的压力施加装置(20)和从径向可膨胀的内表面径向向外延伸的平坦表面。 该装置包括弹性管(10)和适配器(40)。 弹性体管道(10)具有与后端相对的前端和延伸穿过其构造成接纳支撑芯(30)的轴向孔。 适配器(40)具有由径向外表面(42)和从径向外表面(42)径向向外延伸的平坦表面(43)和从其延伸的轴向孔(44)限定的台阶部分(41)。 轴向孔(44)具有与弹性管(10)的轴向孔(12)的直径基本相同的直径。 适配器(40)与压力施加装置(20)和弹性体管(10)之间的弹性体管(10)基本上同轴地定位,使得响应于从后端将支撑芯(30)插入到 弹性管(10),适配器(40)的平坦表面通过弹性管(10)推压到压力施加装置(20)的平坦表面上。 适配器(40)的后端与弹性体管道(10)的前端之间的界面具有高摩擦力,使得适配器(40)和弹性体管道(10)一致地径向扩张,并且径向外部 适配器(40)的表面对压力施加装置(20)的径向可膨胀的内表面施加径向向外的压力。 现场扩展设备和方法,现场扩展方法