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    • 26. 发明授权
    • Direct-write afocal electron-beam semiconductor lithography
    • 直写无电子束半导体光刻技术
    • US5478698A
    • 1995-12-26
    • US105261
    • 1993-08-12
    • Michael D. RostokerNicholas F. PaschJoe Zelayeta
    • Michael D. RostokerNicholas F. PaschJoe Zelayeta
    • H01J37/317G03F7/20H01J37/30
    • B82Y15/00B82Y10/00B82Y40/00H01J37/3174H01J2237/06341H01J2237/31735Y10S430/143Y10S977/855
    • A technique is describe for effecting very-high resolution semiconductor lithography using direct-write afocal electron-beam exposure of a sensitized wafer. A positioning mechanism and needle-like probe similar to those used in scanning-tunneling microscopy are used in conjunction with a controllable electron field emission source to produce a near-field electron beam capable of exposing an electron-beam sensitive resist on a wafer surface. Conventional e-beam resists are used. The technique can be used in conjunction with scanning-tunneling-like operation of the apparatus to record the appearance and nature of the wafer surface, thereby providing information about the location of underlying features. This location information can be used to assist in aligning the exposure patterns to existing structures in the semiconductor wafer. A multi-probe embodiment with separately controllable field emission sources provides for improved productivity by permitting contemporaneous exposure of multiple sites on a single wafer.
    • 描述了一种技术,用于使用致敏晶片的直接写入无电子束曝光来实现非常高分辨率的半导体光刻。 与扫描隧道显微镜中使用的类似的定位机构和针状探针与可控电子场发射源结合使用以产生能够在晶片表面上暴露电子束敏感抗蚀剂的近场电子束。 使用常规电子束抗蚀剂。 该技术可以与装置的扫描隧道式操作一起使用,以记录晶片表面的外观和性质,从而提供关于底层特征的位置的信息。 该位置信息可用于帮助将曝光图案对准半导体晶片中的现有结构。 具有单独可控的场致发射源的多探针实施例通过允许在单个晶片上同时曝光多个位置来提供提高的生产率。
    • 28. 发明授权
    • Interior bond pad arrangements for alleviating thermal stresses
    • 用于减轻热应力的内部粘结垫布置
    • US5453583A
    • 1995-09-26
    • US58117
    • 1993-05-05
    • Michael D. RostokerNicholas F. PaschJoe Zelayeta
    • Michael D. RostokerNicholas F. PaschJoe Zelayeta
    • H01L23/485H05K1/00
    • H01L24/06H01L2224/0401H01L2224/05554H01L2224/49171H01L2924/01005H01L2924/01013H01L2924/01014H01L2924/01033H01L2924/01039H01L2924/01082H01L2924/014H01L2924/10253H01L2924/14H01L2924/351
    • A technique for reducing thermally-induced mechanical stresses on bond pads in semiconductor device assemblies is accomplished by grouping the bond pads into a relatively small (compared to the total area of the die) sub-area within an interior area (generally away from the periphery) of the die. By keeping the bond pad layout small (tightly grouped, or oriented along a single row, or axis), differential thermally induced displacements between the bond pads are minimized, or are controlled in one dimension. Further, the bond pads may be disposed in a small area near the center of thermal expansion (centroid) of the die or near a heat-producing circuit element to minimize absolute thermal displacements of individual bond pads from the centroid or the circuit element. Overlapping sub-area patterns may be used, and grouped bond pads may be used in conjunction with (including overlapping of) traditional die-periphery located bond pads. Other aspects involve disposing the bond pads into an elongated pattern to minimize thermal displacement primarily in one direction, and orienting a lead frame or the like to accommodate any thermal migration of the bond pads in a controlled direction.
    • 减小半导体器件组件中的接合焊盘上的热诱导机械应力的技术是通过将接合焊盘分组成内部区域(通常远离外围部分)相对较小(与模具的总面积相比)的子区域 )的死亡。 通过保持接合焊盘布局小(紧密组合,或沿着单个行或轴定向),接合焊盘之间的差异热诱导位移被最小化,或者被控制在一个维度上。 此外,接合焊盘可以设置在靠近管芯的热膨胀(中心)的中心附近的小区域中,或靠近发热电路元件,以最小化单个接合焊盘与质心或电路元件的绝对热位移。 可以使用重叠的子区域图案,并且分组的接合焊盘可以与传统的芯片周边定位的焊盘结合使用(包括重叠)。 其他方面涉及将接合焊盘设置成细长图案以最小化主要在一个方向上的热位移,并且定向引线框架等以适应接合焊盘在受控方向上的任何热迁移。
    • 30. 发明授权
    • System having input-output drive reduction
    • 具有输入输出驱动减少的系统
    • US5696403A
    • 1997-12-09
    • US626468
    • 1996-04-02
    • Michael D. RostokerNicholas F. Pasch
    • Michael D. RostokerNicholas F. Pasch
    • H01L23/522H01L23/552
    • H01L23/5222H01L2224/48227H01L2924/10253H01L2924/13091H01L2924/15311
    • An electronic system utilizing at least one integrated circuit that has reduced drive requirements for the input and output pads of the integrated circuit die. The integrated circuit of the system has an intermediate structure added between the output connection pad and substrate to reduce the amount of electron charge required to charge the output pad capacitance of the integrated circuit to a substantially negligible amount. In addition, an intermediate structure may be added between an input connection pad and substrate of the integrated circuit to reduce the amount of electron charge required to charge the input pad capacitance to a substantially negligible amount. In the present invention, a transistor amplifier driver is connected to the intermediate structure between the output pad and substrate to charge the capacitance that exists between the intermediate structure and substrate so that the voltage potential of the intermediate structure is substantially the same value as the output pad voltage value. In similar fashion, a transistor amplifier driver is connected to the intermediate structure between the input pad and substrate to charge the capacitance that exists between the intermediate structure and substrate so that the voltage potential of the intermediate structure is substantially the same value as the input pad voltage value.
    • 一种使用至少一个集成电路的电子系统,该集成电路降低了对集成电路管芯的输入和输出焊盘的驱动要求。 该系统的集成电路具有添加在输出连接焊盘和衬底之间的中间结构,以减少将集成电路的输出焊盘电容充电至基本可忽略的量所需的电子电荷量。 此外,可以在输入连接焊盘和集成电路的基板之间添加中间结构,以减少将输入焊盘电容充电至基本可忽略的量所需的电子电荷量。 在本发明中,晶体管放大器驱动器连接到输出焊盘和衬底之间的中间结构,以对存在于中间结构和衬底之间的电容进行充电,使得中间结构的电压电位基本上与输出的值相同 焊盘电压值。 以类似的方式,晶体管放大器驱动器连接到输入焊盘和衬底之间的中间结构,以对存在于中间结构和衬底之间的电容进行充电,使得中间结构的电压电位与输入焊盘基本相同 电压值。