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    • 25. 发明授权
    • Inspecting method, inspecting apparatus, and defect correcting method
    • 检查方法,检查装置和缺陷修正方法
    • US5532615A
    • 1996-07-02
    • US158843
    • 1993-11-24
    • Naofumi KondoMikio KatayamaMasaya OkamotoMakoto MiyagoKiyoshi NakazawaYuzuru KanemoriMakoto Tachibana
    • Naofumi KondoMikio KatayamaMasaya OkamotoMakoto MiyagoKiyoshi NakazawaYuzuru KanemoriMakoto Tachibana
    • G09G3/00G01R31/02
    • G09G3/006G09G2330/10
    • This invention provides an inspecting method, an inspecting apparatus, and a defect correcting method, for an active matrix substrate including: a gate bus line; a source bus line; a pixel electrode; a switching element for driving the pixel electrode; and a pair of electrodes constituting an auxiliary capacitance. The inspecting method includes: a step of disposing a counter substrate having a face on which a counter electrode is formed so that the face faces the active matrix substrate with a liquid crystal layer interposed therebetween, and connecting signal supplying terminals to gate bus lines and source bus lines and the counter electrode; and a detection step of detecting a defect on the active matrix substrate by performing at least one of a first signal generating step, a second signal generating step, and a third signal generating step. The first, second, and third signal generating steps all include alternately applying an ON signal for turning on the switching element and an OFF signal for turning off the switching element to the gate bus line. The first signal generating step includes applying a first detecting signal having a voltage which changes before the ON signal is applied to the source bus line. The second signal generating step includes applying a second detecting signal having a voltage which changes before and after the ON signal is applied. The third signal generating step includes applying a third detecting signal having a voltage which changes after the ON signal is applied.
    • 本发明提供了一种用于有源矩阵基板的检查方法,检查装置和缺陷校正方法,包括:栅极总线; 源总线; 像素电极; 用于驱动像素电极的开关元件; 以及构成辅助电容的一对电极。 检查方法包括:将具有面对面的对置基板设置在其上形成有相对电极的步骤,使得面向有源矩阵基板的面朝向液晶层,并将信号提供端子连接到栅极总线和源极 总线和对电极; 以及检测步骤,通过执行第一信号产生步骤,第二信号产生步骤和第三信号产生步骤中的至少一个来检测有源矩阵衬底上的缺陷。 第一,第二和第三信号产生步骤都包括交替地施加用于接通开关元件的ON信号和用于将开关元件截止到栅极总线的OFF信号。 第一信号产生步骤包括将具有在ON信号被施加之前改变的电压的第一检测信号施加到源总线上。 第二信号产生步骤包括施加具有在ON信号被施加之前和之后变化的电压的第二检测信号。 第三信号产生步骤包括施加在施加ON信号之后改变的电压的第三检测信号。
    • 29. 发明授权
    • Matrix type display device
    • 矩阵式显示装置
    • US5745201A
    • 1998-04-28
    • US725261
    • 1996-10-02
    • Katsuhiro KawaiSatoshi YabutaMasaya OkamotoMasaru Kajitani
    • Katsuhiro KawaiSatoshi YabutaMasaya OkamotoMasaru Kajitani
    • G02F1/1343G02F1/13G02F1/1335G02F1/136G02F1/1362G02F1/1368G09F9/30H01L21/336H01L29/786G02F1/1333
    • G02F1/1309G02F1/133512G02F2001/136268
    • An object of the invention is to facilitate identifying the display color of each pixel during a test process and to apply a correction to a defective switching device in accordance with a test criterion established for each display color. On one transparent substrate, there are formed gate wiring and source wirings intersecting at right angles to each other so that insulation therebetween is maintained, and a pixel electrode and a TFT device are formed for each pixel, thus constructing one substrate member. On another transparent substrate, there is formed a counter electrode facing the pixel electrodes, and identifying means for identifying the display color of each pixel is formed on the side opposite from the side where the counter electrode is formed, the identifying means then being covered with a light-blocking member, thus constructing the another substrate member. The light-blocking member contains openings formed therethrough in portions facing the pixel electrodes. Since the display color of each pixel can be identified using the identifying means, a defective switching device in a pixel can be corrected in accordance with a correction criterion established for each display color.
    • 本发明的目的是便于在测试过程期间识别每个像素的显示颜色,并根据为每个显示颜色建立的测试标准对缺陷开关设备应用校正。 在一个透明基板上形成栅极布线和源极布​​线,彼此成直角交叉,从而保持它们之间的绝缘,并且为每个像素形成像素电极和TFT器件,从而构成一个基板部件。 在另一透明基板上形成面对像素电极的对置电极,并且在与形成对置电极的一侧相反的一侧形成用于识别每个像素的显示颜色的识别装置,然后识别装置被覆盖 遮光构件,从而构成另一基板构件。 遮光构件包括在与像素电极相对的部分中形成的开口。 由于可以使用识别装置来识别每个像素的显示颜色,所以可以根据为每个显示颜色建立的校正标准来校正像素中的有缺陷的切换装置。