专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

21. 发明专利

JP2008164546A Fluorescent x-ray analysis method 审中-公开
标题翻译：荧光X射线分析方法
公开(公告)号：JP2008164546A
公开(公告)日：2008-07-17
申请号：JP2006356831
申请日：2006-12-29
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , KAMETANI AYA
IPC分类号： G01N23/223 , G01N1/28
摘要： PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analysis method which performs high-sensitivity qualitative analyses and high-accuracy quantitative analysis of elements contained in a solid sample, only by carrying out simple pretreatments.
SOLUTION: A solid sample, such as, a powder sample is weighed, the weighed solid sample is dissolved in a liquid, such as an acid, to prepare a solution, the fluorescent X-ray analysis of the solubilized sample adjusted in the concentration of the solid sample in the solution is performed, and the element to be analyzed in the solubilized sample is calculated by using a calibration curve to be converted to the concentration of the analyzed in the solid sample. The effects of the main component or the matrix of the solid sample is lowered, to quantify the element with high accuracy with the same effects as those of glass beads methods. Even the elements that do not completely dissolve in the solution, can be analyzed, simply by performing the fluorescent X-ray analysis of a solution in which a precipitate is dispersed, a filtered precipitate, or a precipitate that has sedimented in the solution.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种荧光X射线分析方法，其仅通过进行简单的预处理来进行固体样品中包含的元素的高灵敏度定性分析和高精度定量分析。＆lt; P＆gt;解决方案：称量固体样品如粉末样品，将称重的固体样品溶解在液体如酸中以制备溶液，将溶解样品的荧光X射线分析调整为进行固体样品在溶液中的浓度，并且通过使用校正曲线计算待溶解样品中要分析的元素，以将其转化为固体样品中分析的浓度。降低固体样品的主要成分或基质的影响，以与玻璃珠方法相同的效果，以高精度量化该元素。即使是不完全溶解在溶液中的元素也可以简单地通过对其中分散有沉淀物的溶液进行荧光X射线分析，过滤的沉淀物或沉淀在溶液中的沉淀物进行分析。版权所有（C）2008，JPO＆INPIT

22. 发明专利

JP2005017249A Icp analysis method 审中-公开
标题翻译： ICP分析方法
公开(公告)号：JP2005017249A
公开(公告)日：2005-01-20
申请号：JP2003186468
申请日：2003-06-30
申请人： Horiba Ltd , Murata Mfg Co Ltd , 株式会社堀場製作所 , 株式会社村田製作所
发明人： TANAKA SATORU , DAIDOJI HIDEHIRO , TAMURA TOSHIYUKI , NISHIMURA MASATO , TANIGUCHI SAKIKO
IPC分类号： G01N21/73
摘要： PROBLEM TO BE SOLVED: To provide an ICP analysis method for accurately analyzing components when using a spray chamber made of resin to analyze the plurality of components including Si in a hydrofluoric-acid coexistent specimen solution.
SOLUTION: In this ICP analysis method, the hydrofluoric-acid coexistent specimen solution 13 is supplied to a plasma torch 19 via the spray chamber 1 made of resin to analyze silicon or components including silicon in the specimen solution 13. In order to enhance the wettability of an inner wall of the spray chamber 1, a chemical for reducing surface tension is added to at least any of a standard solution, the specimen solution 13, or a cleaning liquid 14, supplied to the spray chamber 1.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种ICP分析方法，用于在使用由树脂制成的喷雾室时准确地分析组分，以分析包含氢氟酸共存样品溶液中的Si的多种成分。解决方案：在该ICP分析方法中，将氢氟酸共存样品溶液13经由由树脂制成的喷雾室1供给到等离子体焰炬19，以分析样品溶液13中的硅或包含硅的组分。为了提高喷雾室1的内壁的润湿性，将至少提供给喷雾室1的标准溶液，试样溶液13或清洗液14中的至少任意一种添加用于降低表面张力的化学品。
版权所有（C）2005，JPO＆NCIPI

23. 发明专利

JP2004212166A Icp emission spectrophotometer 有权
公开(公告)号：JP2004212166A
公开(公告)日：2004-07-29
申请号：JP2002380968
申请日：2002-12-27
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , DAIDOJI HIDEHIRO
IPC分类号： G01N21/73 , H05H1/30 , H05H1/42
摘要： PROBLEM TO BE SOLVED: To provide an emission spectrophotometer capable of reducing the cost for purge processing by shortening the gas purge processing time, and having improved detection accuracy. SOLUTION: This ICP (inductively coupled plasma) emission spectrophotometer has a light emitting part 1 for emitting light in plasma flame from a measuring component element included in a measuring object sample, and a detection part 8 for detecting emission spectrum intensity, and performs quantitative analysis of the measuring component element by using the emission spectrum intensity. The spectrophotometer is provided with an input line 22 for allowing purge gas to flow into the detection part 8, and an output line 24 for allowing the purge gas flowing into the detection part 8 to flow out, and is constituted so that the purge gas is allowed to flow into the detection part 8 through the input line 22 and then to flow out from the output line 24, and that the gas flowing out is guided to the light emitting part 1. By this constitution, when the input line and the output line are opened, the purge gas is allowed to flow into the detection part through the input line, and the detection part is purged by the gas, and if the gas pressure exceeds, for example, a room temperature atmospheric pressure, the gas is allowed to flow out from the input line, and thereby the purge gas always flows in the detection part, and deterioration of the purge gas in the detection part is reduced. Hereby, the detection performance is stabilized, and the detection accuracy of the emission spectrum from the light emitting part is heightened. COPYRIGHT: (C)2004,JPO&NCIPI

24. 发明专利

DE102009011636A1 未知
公开(公告)号：DE102009011636A1
公开(公告)日：2009-09-10
申请号：DE102009011636
申请日：2009-03-04
申请人： HORIBA LTD
发明人： TANAKA SATORU
IPC分类号： G01J4/00 , G01N21/21

25. 发明专利

JPH10260175A ANALYTICAL METHOD FOR CARBON AND/OR SULFUR IN SOLID SAMPLE 失效
公开(公告)号：JPH10260175A
公开(公告)日：1998-09-29
申请号：JP8447697
申请日：1997-03-17
申请人： HORIBA LTD
发明人： OGURA YOSHIKO , OKAYAMA JUNJI , TANAKA SATORU
IPC分类号： G01N31/12 , G01N1/22 , G01N33/20
摘要： PROBLEM TO BE SOLVED: To obtain an analytical method in which a carbon component and a sulfur component can be analyzed with high accuracy by a method wherein an Ni foil or an Al foil is placed on a fine powder sample which is put into a heating container and it is heated and oxidized in a heating furnace while oxygen is being supplied. SOLUTION: A heating container 1 is placed in a resistance heating furnace, an Ni foil 3 is placed on a fine powder sample 2 inside the heating container 1, and tin particles 4 are placed on it. The weight of the fine powder sample 2 composed of, e.g. SiO is set at about 0.05g, the weight of the tin particles 4 is set at about 0.7g, the weight of the Ni foil 3 is set at about 0.1g, and its shape size is set at about 6×55×0.1mm. Oxygen gas flows inside the resistance heating furnace at a considerable speed. The surface of the fine powder sample 2 which is easy to float is pressed by the Ni foil 3, the flow of the oxygen on the surface of the fine powder sample 2 is stabilized, carbon and sulfur are easy to react so as to prevent them from being scattered, and the fine powder sample 2 is burned completely. Thereby, a carbon component and a sulfur component can be measured with high accuracy.

26. 发明专利

JP2003240718A ICP EMISSION SPECTROMETRIC APPARATUS 审中-公开
公开(公告)号：JP2003240718A
公开(公告)日：2003-08-27
申请号：JP2002037559
申请日：2002-02-15
申请人： HORIBA LTD
发明人： DAIDOJI HIDEHIRO , TANAKA SATORU
IPC分类号： G01N21/73
摘要： PROBLEM TO BE SOLVED: To provide an ICP emission spectrometric apparatus capable of quantitatively analyzing an ingredient such as nitrogen or the like contained in the atmosphere. SOLUTION: The ICP emission spectrometric apparatus 1 has a light emitting part 3 for generating a measuring ingredient element contained in a sample S to be measured in a plasma flame 2, and a detecting part 4 for detecting the emitted light spectral intensity, thereby quantitatively analyzing the ingredient element by using the spectral intensity of the light L. In the apparatus 1, an outer tube 8 for generating the plasma flame 2 therein and preventing the atmosphere from being engulfed into the flame 2 is provided, and a through hole 10 for guiding the light L generated in the flame 2 to the detection part 4 is formed at the position corresponding to the light emitting part 2a of the tube 8. COPYRIGHT: (C)2003,JPO

27. 发明专利

JP2003149156A SOLUTION SPECIMEN SUPPLY DEVICE FOR ICP EMISSION SPECTROPHOTOMETER 审中-公开
公开(公告)号：JP2003149156A
公开(公告)日：2003-05-21
申请号：JP2001351090
申请日：2001-11-16
申请人： HORIBA LTD
发明人： DAIDOJI HIDEHIRO , TANAKA SATORU , KATO TAKAO , TOKUDA WATARU
IPC分类号： G01N21/73 , G01N1/00
摘要： PROBLEM TO BE SOLVED: To provide a solution specimen supply device for the ICP emission spectrophotometer, capable of stably supplying solution specimens to the nebulizer provided at the first stage of the spray chamber and of resisting organic solvents high in dissolving power. SOLUTION: In this solution specimen supply device wherein a solution specimen 20 is supplied by a peristaltic pump 25 to a nebulizer 2 provided at the first stage of a spray chamber 1, tubes 30a, 30b to be pressed by tube pressers 29 in the peristaltic pump 25 are formed of a polyolefin based synthetic rubber.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式