专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2005017249A Icp analysis method 审中-公开
标题翻译： ICP分析方法
公开(公告)号：JP2005017249A
公开(公告)日：2005-01-20
申请号：JP2003186468
申请日：2003-06-30
申请人： Horiba Ltd , Murata Mfg Co Ltd , 株式会社堀場製作所 , 株式会社村田製作所
发明人： TANAKA SATORU , DAIDOJI HIDEHIRO , TAMURA TOSHIYUKI , NISHIMURA MASATO , TANIGUCHI SAKIKO
IPC分类号： G01N21/73
摘要： PROBLEM TO BE SOLVED: To provide an ICP analysis method for accurately analyzing components when using a spray chamber made of resin to analyze the plurality of components including Si in a hydrofluoric-acid coexistent specimen solution.
SOLUTION: In this ICP analysis method, the hydrofluoric-acid coexistent specimen solution 13 is supplied to a plasma torch 19 via the spray chamber 1 made of resin to analyze silicon or components including silicon in the specimen solution 13. In order to enhance the wettability of an inner wall of the spray chamber 1, a chemical for reducing surface tension is added to at least any of a standard solution, the specimen solution 13, or a cleaning liquid 14, supplied to the spray chamber 1.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种ICP分析方法，用于在使用由树脂制成的喷雾室时准确地分析组分，以分析包含氢氟酸共存样品溶液中的Si的多种成分。解决方案：在该ICP分析方法中，将氢氟酸共存样品溶液13经由由树脂制成的喷雾室1供给到等离子体焰炬19，以分析样品溶液13中的硅或包含硅的组分。为了提高喷雾室1的内壁的润湿性，将至少提供给喷雾室1的标准溶液，试样溶液13或清洗液14中的至少任意一种添加用于降低表面张力的化学品。
版权所有（C）2005，JPO＆NCIPI

2. 发明专利

JP2005106686A Composition analysis method 有权
标题翻译：组合分析方法
公开(公告)号：JP2005106686A
公开(公告)日：2005-04-21
申请号：JP2003341703
申请日：2003-09-30
申请人： Murata Mfg Co Ltd , 株式会社村田製作所
发明人： TAMURA TOSHIYUKI , KONISHI YOSHIO , TANIGUCHI SAKIKO , HIRAMATSU TAKASHI , NISHIMURA MASATO
IPC分类号： G01N21/73 , G01N1/28
摘要： PROBLEM TO BE SOLVED: To solve problems that element distribution and element composition in the total area of a substance from its surface down to its interior are not comprehended in detail by conventional chemical analysis and that a remarkably large number of points need to be collected and evaluated in order to perform evaluation from overall points of view as to instrumental analysis.
SOLUTION: This composition analysis method comprises a first process for eluting a substance containing a plurality of elements out of its surface into a solution, a second process for quantitatively analyzing elements eluted out of the substance into the solution, a third process for further eluting the substance with the elements having dissolved therein into the solution, and a fourth process for quantitatively analyzing elements eluted out of the substance in the third process into the solution. The composition of the substance from its surface down to its interior is analyzed by repeating the third and fourth processes. The elution speed of the substance is 0.5 wt.%/min or less.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：为了解决物质从表面到内部的总面积中的元素分布和元素组成不能通过常规化学分析详细理解的问题，并且需要非常大量的点收集和评估，以便从工具分析的总体角度进行评估。解决方案：该组合物分析方法包括将含有多个元素的物质从其表面洗脱到溶液中的第一种方法，用于定量分析从物质中洗脱出来的元素进入溶液的第二种方法，第三种方法将其中溶解有元素的物质进一步洗脱到溶液中，以及将第三次处理中从物质中洗脱的元素定量分析成溶液的第四种方法。通过重复第三和第四过程来分析物质从其表面到内部的组成。物质的洗脱速度为0.5重量％/分钟以下。版权所有（C）2005，JPO＆NCIPI

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式