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    • 23. 发明授权
    • High reliability memory module with a fault tolerant address and command bus
    • 高可靠性存储器模块,具有容错地址和命令总线
    • US07380179B2
    • 2008-05-27
    • US11406669
    • 2006-04-20
    • Kevin C. GowerBruce HazelzetMark W. KelloggDavid T. Perlman
    • Kevin C. GowerBruce HazelzetMark W. KelloggDavid T. Perlman
    • G06F11/00G11C29/00
    • H05K1/117G06F11/1044G11C5/04G11C2029/0409H05K2201/09145H05K2203/167
    • A high reliability dual inline memory module with a fault tolerant address and command bus for use in a server. The memory module is a card approximately 151.35 mm or 5.97 inches long provided with about a plurality of contacts of which some are redundant, a plurality of DRAMs, a phase lock loop, a 2 or 32K bit serial EE PROM and a 28 bit and a 1 to 2 register having error correction code (ECC), parity checking, a multi-byte fault reporting circuitry for reading via an independent bus, and real time error lines for determining and reporting both correctable errors and uncorrectable error conditions coupled to the server's memory interface chip and memory controller or processor such that the memory controller sends address and command information to the register via address/command lines together with check bits for error correction purposes to the ECC/Parity register. By providing the module with a fault tolerant address and command bus fault-tolerance and self-healing aspects necessary for autonomic computing systems compatible with industry-standards is realized. The memory module corrects single bit errors on the command or address bus and permits continuous memory operation independent of the existence of these errors and can determine any double bit error condition. The redundant contacts on the module prevents what would otherwise be single points of failure.
    • 具有容错地址和命令总线的高可靠性双列直插式存储器模块,用于服务器。 存储器模块是大约151.35mm或5.97英寸长的卡,其具有大约多个触点,其中一些是冗余的,多个DRAM,锁相环,2或32K位串行EE PROM和28位和 具有纠错码(ECC),奇偶校验,用于经由独立总线读取的多字节故障报告电路的1至2寄存器和用于确定和报告耦合到服务器存储器的可纠正错误和不可校正错误状况的实时错误行 接口芯片和存储器控制器或处理器,使得存储器控制器通过地址/命令行将地址和命令信息与用于纠错目的的校验位一起发送到ECC /奇偶校验寄存器。 通过为模块提供与行业标准兼容的自主计算系统所需的容错地址和命令总线容错和自修复方面。 存储器模块纠正命令或地址总线上的单位错误,并允许连续存储器操作,而不管这些错误是否存在,并且可以确定任何双位错误条件。 模块上的冗余联系人可防止出现单点故障。
    • 24. 发明授权
    • Carrier for test, burn-in, and first level packaging
    • 用于测试,老化和一级包装的载体
    • US07132841B1
    • 2006-11-07
    • US09588617
    • 2000-06-06
    • Claude L. BertinWayne F. EllisMark W. KelloggWilliam R. TontiJerzy M. ZalesinskiJames M. LeasWayne J. Howell
    • Claude L. BertinWayne F. EllisMark W. KelloggWilliam R. TontiJerzy M. ZalesinskiJames M. LeasWayne J. Howell
    • G01R31/26G01R31/28
    • G01R31/2867G11C5/04G11C29/06G11C29/1201G11C29/48G11C29/56016G11C29/785G11C2029/2602G11C2029/5602H01L22/22H01L22/32H01L2924/0002H01L2924/00
    • A plurality of semiconductor devices are provided on a carrier for testing or burning-in. The carrier is then cut up to provide single chip-on-carrier components or multi-chip-on-carrier components. The carrier is used as a first level package for each chip. Thus, the carrier serves a dual purpose for test and burn-in and for packaging. A lead reduction mechanism, such as a built-in self-test engine, can be provided on each chip or on the carrier and is connected to contacts of the carrier for the testing and burn-in steps. The final package after cutting includes at least one known good die and may include an array of chips on the carrier, such as a SIMM or a DIMM. The final package can also be a stack of chips each mounted on a separate carrier. The carriers of the stack are connected to each other through a substrate mounted along a side face of the stack that is electrically connected to a line of pads along an edge of each carrier. The carrier is formed of a flex material. It can also be formed of printed circuit board material. A window in the flex permits invoking redundancy on each chip after burn-in is complete, significantly improving yield as compared with present schemes that do not permit repair after burn-in.
    • 在载体上提供多个半导体器件用于测试或烧录。 然后将载体切割以提供单个芯片上载波部件或多芯片载波部件。 载体用作每个芯片的第一级封装。 因此,载体用于测试和烧录和包装的双重目的。 可以在每个芯片或载体上提供诸如内置自检引擎的引线减少机构,并且连接到载体的触点用于测试和老化步骤。 切割后的最终包装包括至少一个已知的良好的模具,并且可以包括载体上的芯片阵列,例如SIMM或DIMM。 最终的包装也可以是一堆芯片,每个芯片都安装在单独的载体上。 堆叠的载体通过沿着堆叠的侧面安装的基板彼此连接,该基板沿着每个载体的边缘电连接到焊盘一排。 载体由柔性材料形成。 它也可以由印刷电路板材料形成。 柔性窗口允许在烧坏完成后在每个芯片上调用冗余度,与不允许在老化后修复的现有方案相比,显着提高产量。
    • 26. 发明授权
    • High density memory module with in-line bus switches being enabled in
response to read/write selection state of connected RAM banks to
improve data bus performance
    • 具有串行总线开关的高密度存储器模块响应于连接的RAM组的读/写选择状态而被使能,以提高数据总线性能
    • US6070217A
    • 2000-05-30
    • US76265
    • 1998-05-12
    • Brian J. ConnollyBruce G. HazelzetMark W. Kellogg
    • Brian J. ConnollyBruce G. HazelzetMark W. Kellogg
    • G11C5/00G06F13/16G06F13/40G11C11/401H01L27/10G06F13/00G06F12/00G06F12/06
    • G06F13/4068
    • Data line loading on high density modules with multiple DRAMs is minimized permitting the maximum memory density of systems of otherwise limited density to be increased without an ensuing performance degradation due to data line capacitive loading. First the single or dual in-line memory module (SIMM or DIMM) includes in-line bus switches. The bus switches are between the SIMM or DIMM module tabs (system) and random access memory devices (RAM) and are either in a high impedance (off) or active state depending on the READ/WRITE state of the RAM. When in the high impedance state, the effective loading of the module is that of the bit switch device. The logic for determining the READ/WRITE state may be embedded in an application specific integrated circuit (ASIC) that monitors bus activity and controls activation of the bus switches, be provided by a memory controller or, generated by the RAM itself. The bus switches are active when the RAM is performing a read or a write and inactive otherwise. The RAM is Fast Page Mode (FPM) and Extended Data Output (EDO) or Synchronous DRAM (SDRAM).
    • 在具有多个DRAM的高密度模块上的数据线负载被最小化,从而可以增加其他有限密度的系统的最大存储器密度,而不会由于数据线容性负载而导致随后的性能下降。 首先,单列或双列直插式内存模块(SIMM或DIMM)包括在线总线开关。 总线开关位于SIMM或DIMM模块选项卡(系统)和随机存取存储设备(RAM)之间,并且根据RAM的读/写状态,处于高阻抗(关闭)或活动状态。 当处于高阻态时,模块的有效负载是位开关器件的有效负载。 用于确定读/写状态的逻辑可以被嵌入到专用集成电路(ASIC)中,该专用集成电路监视总线活动并控制总线开关的激活,由存储器控制器提供或由RAM本身产生。 当RAM执行读或写操作时,总线开关处于活动状态。 RAM是快速页面模式(FPM)和扩展数据输出(EDO)或同步DRAM(SDRAM)。
    • 27. 发明授权
    • Narrow data width DRAM with low latency page-hit operations
    • 狭窄的数据宽度DRAM,具有低延迟页命中操作
    • US5969997A
    • 1999-10-19
    • US942825
    • 1997-10-02
    • Michael P. ClintonMarc R. FaucherErik L. HedbergMark W. KelloggWilbur D. Pricer
    • Michael P. ClintonMarc R. FaucherErik L. HedbergMark W. KelloggWilbur D. Pricer
    • G11C11/41G11C11/401G11C11/407G11C11/409G11C15/00
    • G11C11/409G11C11/407
    • A high speed Random Access Memory (RAM) array device includes several logical banks, each of which can be uniquely addressed. Each of these logical banks contains a unique memory array segment and associated page register, the latter serving as a temporary storage location during high-speed page hit operations. To reduce latency during an initial page hit, further array optimization is realized by segmenting each logical bank into two segments with one, smaller segment, comprising a faster random access memory (FRAM) for storing initial data in a data stream. A high speed page register connects the FRAM directly to a multiplexer/demultiplexer connected to the device I/O ports bypassing an internal bus protocol such that the initial data can be transferred between the FRAM and the I/O ports faster thereby improving page-hit latency. Hence, segmenting the logical banks to include only a small high speed segment results in a performance gain approaching what could be achieved by implementing the entire memory device with a high speed FRAM, but at much lower cost.
    • 高速随机存取存储器(RAM)阵列器件包括几个逻辑存储体,每个逻辑存储体可以被唯一地寻址。 这些逻辑组中的每一个包含唯一的存储器阵列段和相关联的页寄存器,后者在高速页命中操作期间用作临时存储位置。 为了在初始页面命中期间减少延迟,通过将每个逻辑存储体分割成具有一个较小段的两个段来实现进一步的阵列优化,其包括用于在数据流中存储初始数据的更快的随机存取存储器(FRAM)。 高速页寄存器将FRAM直接连接到绕过内部总线协议的设备I / O端口连接的多路复用器/解复用器,从而可以更快地在FRAM和I / O端口之间传输初始数据,从而提高页命中率 潜伏。 因此,将逻辑存储体分割为仅包含小的高速段导致通过以高速FRAM实现整个存储器件而可以以低得多的成本实现可达到的性能增益。