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    • 8. 发明授权
    • Captured synchronous DRAM fails in a working environment
    • 捕获的同步DRAM在工作环境中失败
    • US06467053B1
    • 2002-10-15
    • US09340804
    • 1999-06-28
    • Brian J. ConnollySteven A. GrundonBruce G. HazelzetMark W. KelloggJames R. Mallabar
    • Brian J. ConnollySteven A. GrundonBruce G. HazelzetMark W. KelloggJames R. Mallabar
    • G06F11277
    • G11C29/56G11C29/56012G11C2029/5602
    • A Synchronous DRAM memory test assembly that converts a normal PC or Workstation with a synchronous bus into a memory tester. The test assembly may be split into two segments: a diagnostic card and an adapter card to limit mechanical load on the system socket as well as permit varying form factors. This test assembly architecture supports memory bus speeds of 66 MHz and above, and provides easy access for a logic analyzer. The test assembly supports Registered and Unbuffered Synchronous DRAM products. The test assembly permits good and questionable synchronous modules to be compared using an external logic analyzer. It permits resolution of in-system fails that occur uniquely in system environments and may be otherwise difficult or impossible to replicate. The test assembly re-drives the system clocks with a phase lock loop (PLL) buffer to a memory module socket on the test assembly to permit timing adjustments to minimize the degradation to the system's memory bus timings due to the additional wire length and loading. The test assembly is programmable to adjust to varying bus timings such as: CAS (column address strobe) Latencies and Burst Length variations. It is designed with Field Programmable Gate Arrays (FPGAs) to allow for changes internally without modifying the test assembly.
    • 同步DRAM存储器测试组件,其将具有同步总线的普通PC或工作站转换为存储器测试器。 测试组件可以分为两个部分:诊断卡和适配卡,以限制系统插座上的机械负载以及允许变化的外形尺寸。 该测试组件架构支持66 MHz及以上的内存总线速度,并为逻辑分析仪提供方便的访问。 测试组件支持注册和非缓冲同步DRAM产品。 测试组件允许使用外部逻辑分析仪比较好的和有问题的同步模块。 它允许解决在系统环境中唯一发生的系统内故障,并且可能难以或不可能复制。 测试组件使用锁相环(PLL)缓冲区将系统时钟重新驱动到测试组件上的存储器模块插槽,以允许定时调整,以最大限度地减少系统的存储器总线时序由于额外的电线长度和负载而的劣化。 测试组件可编程为适应变化的总线时序,例如:CAS(列地址选通)延迟和突发长度变化。 它设计有现场可编程门阵列(FPGA),可在内部进行更改,无需修改测试组件。
    • 9. 发明授权
    • Synchronous memory packaged in single/dual in-line memory module and
method of fabrication
    • 封装在单/双列直插式存储器模块中的同步存储器和制造方法
    • US5513135A
    • 1996-04-30
    • US349154
    • 1994-12-02
    • Timothy J. DellLina S. FarahGeorge C. FengMark W. Kellogg
    • Timothy J. DellLina S. FarahGeorge C. FengMark W. Kellogg
    • G11C5/00G11C5/06
    • G11C5/06G11C5/04
    • Multiple synchronous dynamic random access memories (SDRAMs) are packaged in a single or a dual in-line memory module to have similar physical and architectural characteristics of dynamic random access memories (DRAMs) packaged in single/dual in-line memory modules. A 168 pin SDRAM DIMM family is presented which requires no modification of existing connector, planar or memory controller components. The 168 pin SDRAM DIMM family includes 64 bit non-parity, 72 bit parity, 72 bit ECC and 80 bit ECC memory organizations. Special placement and wiring of decoupling capacitors about the SDRAMs and the buffer chips contained within the module are also presented to reduce simultaneous switching noises during read and write operations. A special wiring scheme for the decoupling capacitors is employed to reduce wiring inductance.
    • 多个同步动态随机存取存储器(SDRAM)被封装在单个或双列直插存储器模块中,以具有封装在单/双列直插式存储器模块中的动态随机存取存储器(DRAM)的类似物理和架构特性。 提供了一个168针SDRAM DIMM系列,不需要修改现有的连接器,平面或内存控制器组件。 168引脚SDRAM DIMM系列包括64位非奇偶校验,72位奇偶校验,72位ECC和80位ECC内存组织。 还提供了关于SDRAM和包含在模块内的缓冲器芯片的去耦电容器的特殊放置和布线,以减少读写操作期间的同时开关噪声。 采用去耦电容器的特殊布线方案来减少布线电感。
    • 10. 发明授权
    • Error correction code on add-on cards for writing portions of data words
    • 用于写入数据字部分的附加卡上的错误纠正码
    • US5452429A
    • 1995-09-19
    • US154191
    • 1993-11-17
    • Daniel P. FuocoChristopher M. HerringMark W. KelloggJorge E. Lenta
    • Daniel P. FuocoChristopher M. HerringMark W. KelloggJorge E. Lenta
    • G06F12/16G06F11/10
    • G06F11/1056G06F11/1052
    • The present invention provides a computer system and method of using the same. Add-on memory cards for the system are provided which cards have error correction code logic on the card, and logic to do partial writes of data words. The system has a central processing unit (CPU), a BUS interconnecting the CPU and the add-on memory cards. The CPU or associated components are configured to write data and read data from the add-on memory as several data bytes constituting data words. The system is further configured either within the CPU or as a separate function to generate parity bits associated with each of the bytes of data the CPU writes to the add-on memory and to read parity bits associated with data the CPU reads from the add-on memory and regenerate new parity bits and compare the newly generated parity bits with the original parity bits to detect data errors on data read from the add-on memory. The system itself does not contain error correction code (ECC). The add-on memory has ECC logic to identify any byte having a single bit error in the data bytes or the parity bits written by the CPU to the add-on memory and to correct all single bit errors in data read from the add-on memory to the CPU. The error correcting code includes logic to generate parity bits in the data bytes written by the CPU to the add-on memory and logic to compare the parity bits written by the CPU with those generated by the error correcting code logic.
    • 本发明提供一种计算机系统及其使用方法。 提供系统的附加存储卡,哪些卡在卡上具有纠错码逻辑,以及进行数据字的部分写入的逻辑。 该系统具有一个中央处理单元(CPU),一个连接CPU和附加存储卡的总线。 CPU或相关组件被配置为写入数据并从附加存储器读取数据作为构成数据字的几个数据字节。 该系统进一步配置在CPU内或作为单独功能,以产生与CPU写入附加存储器的每个数据字节相关联的奇偶校验位,并读取与CPU从附加存储器读取的数据相关联的奇偶校验位, 并重新生成新的奇偶校验位,并将新生成的奇偶校验位与原始奇偶校验位进行比较,以检测从附加存储器读取的数据上的数据错误。 系统本身不包含纠错码(ECC)。 附加存储器具有ECC逻辑,用于识别在数据字节中具有单个位错误的任何字节或由CPU向附加存储器写入的奇偶校验位,并校正从附件读取的数据中的所有单个位错误 内存到CPU。 纠错码包括在由CPU向附加存储器写入的数据字节中生成奇偶校验位的逻辑,以及将由CPU写入的奇偶校验位与由纠错码逻辑生成的奇偶校验位进行比较的逻辑。