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    • 13. 发明授权
    • Refractory metal capped low resistivity metal conductor lines and vias
    • 耐火金属封盖的低电阻金属导线和通孔
    • US5300813A
    • 1994-04-05
    • US841967
    • 1992-02-26
    • Rajiv V. JoshiJerome J. CuomoHormazdyar M. DalalLouis L. Hsu
    • Rajiv V. JoshiJerome J. CuomoHormazdyar M. DalalLouis L. Hsu
    • H01L21/28H01L21/312H01L21/316H01L21/318H01L21/768H01L23/498H01L23/522H01L23/532H01L29/440H01L29/460
    • H01L21/76843H01L21/76838H01L21/7684H01L21/76847H01L21/76849H01L21/76852H01L21/76877H01L23/49866H01L23/53223H01L23/53228H01L23/53233H01L23/53238H01L2924/0002H01L2924/09701Y10S148/015Y10S257/915Y10S438/959
    • A contact structure for a semiconductor device having a first refractory metal layer formed only at the bottom of a contact hole. The first refractory metal is selected from a group comprising titanium (Ti), titanium alloys or compounds such as Ti/TiN, tungsten (W), titanium/tungsten (Ti/W) alloys, or chromium (Cr) or tantalum (Ta) and their alloys or some other suitable material. A low resistivity layer comprising a single, binary or ternary metalization is deposited over the first refractory metal layer in the contact hole by a method such as PVD using evaporation or collimated sputtering. The low resistivity layer has side walls which taper inwardly toward one another with increasing height of the layer and the low resistivity layer does not contact the side walls of the contact hole. The low resistivity layer may be Al.sub.x Cu.sub.y (x+y=1; x.gtoreq.0, y.gtoreq.0), ternary alloys such as Al-Pd-Cu or multicomponent alloys such as Al-Pd-Nb-Au. A second refractory metal layer is deposited over the low resistivity layer. The second refractory metal layer may be tungsten, cobalt, nickel, molybdenum or alloys/compounds such as Ti/TiN. The first and second refractory metal layers completely encapsulate the low resistivity layer. The first and second refractory metal layers can comprise an alloy containing silicon with a higher incorporated silicon content near the top of the contact hold present as a distinct or graded composition than at a location closer to the bottom of the contact hole.
    • 一种用于半导体器件的接触结构,其具有仅在接触孔的底部形成的第一难熔金属层。 第一难熔金属选自钛(Ti),钛合金或Ti / TiN,钨(W),钛/钨(Ti / W)合金或铬(Cr)或钽(Ta) 及其合金或其他合适的材料。 包含单一二元或三元金属化的低电阻率层通过诸如使用蒸发或准直溅射的PVD的方法沉积在接触孔中的第一难熔金属层上。 低电阻率层具有随着层的高度逐渐向内逐渐向内逐渐变细的侧壁,低电阻层不接触接触孔的侧壁。 低电阻率层可以是AlxCuy(x + y = 1; x> = 0,y> = 0),诸如Al-Pd-Cu的三元合金或诸如Al-Pd-Nb-Au的多组分合金。 在低电阻率层上沉积第二难熔金属层。 第二耐火金属层可以是钨,钴,镍,钼或诸如Ti / TiN的合金/化合物。 第一和第二难熔金属层完全封装低电阻率层。 第一和第二难熔金属层可以包含含有硅的合金,其中接合保持层的顶部附近具有更高的掺入硅含量,作为不同或分级的组成,而不是靠近接触孔底部的位置。
    • 17. 发明授权
    • Growth of polycrystalline semiconductor film with intermetallic
nucleating layer
    • 具有金属间成核层的多晶半导体膜的生长
    • US4132571A
    • 1979-01-02
    • US765497
    • 1977-02-03
    • Jerome J. CuomoThomas H. DiStefanoRobert Rosenberg
    • Jerome J. CuomoThomas H. DiStefanoRobert Rosenberg
    • C23C14/02C23C16/00C30B11/12C30B23/02C30B25/02C30B25/18B01J17/26
    • C30B29/06C23C14/02C23C16/003C30B11/12C30B23/02C30B25/18Y10S148/061Y10S148/154
    • A method is disclosed for fabricating a thin elemental semiconductor, e.g., Si or Ge, film with columnar grains in a filamentary structure, by the use of an intermetallic compound incorporating the elemental semiconductor to form a nucleating layer for the growth of the semiconducting film. The semiconductor is grown from vapor phase by the technique of either vacuum evaporation or chemical vapor deposition, e.g., by decomposition of SiH.sub.4. The semiconductor e.g., Si, is initially deposited onto a thin film of a specific metal, e.g., Pt or Ni, on any inert substrate, e.g., SiO.sub.2 or Al.sub.2 O.sub.3, which is held at a temperature, e.g., 900.degree. C, above the eutectic point, i.e., 830.degree. C, of an intermetallic compound and the metallic film, and below the eutectic point, i.e., 979.degree. C, of another intermetallic compound and the semiconductor.Deposition of the semiconductor onto the metallic film produces a layer of liquid comprising the semiconductor and metal, which increases in thickness until the metallic layer is completely consumed. Additional deposition of the semiconductor produces a supersaturated liquid from which large crystallites of the intermetallic precipitate. With increasing deposition of semiconductor, the crystallites of intermetallic material continue to grow until they consume all of the metal in the liquid, at which point no liquid remains. Continuing deposition of semiconductor material results in the growth of filamentary crystallites of the semiconductor out of the intermetallic surface. The result is a columnar film of the semiconductor with a filamentary structure originating from the crystallites of intermetallic nucleating material.
    • 公开了通过使用掺入元素半导体的金属间化合物形成用于半导体膜的生长的成核层来制造薄元素半导体的方法,例如具有丝状结构的柱状晶粒的Si或Ge薄膜。 通过真空蒸发或化学气相沉积的技术,例如通过SiH 4的分解,从气相生长半导体。 半导体例如Si最初沉积在特定金属(例如Pt或Ni)的薄膜上,任何惰性基底上,例如SiO 2或Al 2 O 3,其保持在例如900℃以上的温度 共晶点,即830℃的金属间化合物和金属膜,低于另一种金属间化合物和半导体的共晶点,即979℃。
    • 18. 发明授权
    • Apparatus using amorphous magnetic compositions
    • 使用无定形磁性组合物的装置
    • US3965463A
    • 1976-06-22
    • US581078
    • 1975-05-27
    • Praveen ChaudhariJerome J. CuomoRichard J. Gambino
    • Praveen ChaudhariJerome J. CuomoRichard J. Gambino
    • G02F1/00G11B11/10G11B11/105G11C13/06G11C19/08H01F10/13G11C11/14
    • G02F1/0036G11B11/10G11B11/10582G11B11/10591G11C13/06G11C19/08G11C19/0808G11C19/085G11C19/0866H01F10/135G11C13/0004
    • Apparatus using amorphous magnetic compositions having uniaxial anisotropy include bubble domain apparatus, light modulating apparatus, permanent magnet systems, and tape and disc information handling systems. The amorphous magnetic composition can be prepared in thin film or bulk form or as particles in a binder. The anisotropy can be parallel to the plane of a film of this material or perpendicular to the film plane. The amorphous material is comprised of a single element or is a multicomponent system where as at least one of the components has an unimpaired spin so that the composition has a net magnetic moment. The amorphous composition exists as a microcrystalline structure having localized atomic ordering over a distance 25-100 A, or as a substantially amorphous structure where localized atomic ordering is over distances less than 25A. Binary and ternary compositions, either alloys or compounds, are suitable. The magnetic properties of the compositions can be changed during fabrication or after fabrication, and the compositions can be doped readily without adversely affecting magnetic properties.
    • 使用具有单轴各向异性的非晶磁性组合物的装置包括气泡域装置,光调制装置,永磁体系统以及磁带和盘信息处理系统。 非晶磁性组合物可以以薄膜或本体形式或作为粘合剂中的颗粒制备。 各向异性可以平行于该材料的膜的平面或垂直于膜平面。 无定形材料由单一元件组成或是多组分系统,其中至少一个组分具有未受损的自旋,使得组合物具有净磁矩。 无定形组合物存在为在距离25-100A处具有局部原子排序的微晶结构,或者作为基本上非晶体结构,其中局部原子排序超过距离小于25A。 二元和三元组合物,合金或化合物都是合适的。 组合物的磁性能可以在制造期间或制造后改变,并且可以容易地掺杂组合物而不会不利地影响磁性。
    • 20. 发明授权
    • Non-thermionic sputter material transport device, methods of use, and materials produced thereby
    • 非热离子溅射材料输送装置,使用方法和由此生产的材料
    • US06787010B2
    • 2004-09-07
    • US09997162
    • 2001-11-29
    • Jerome J. CuomoN. Mark Williams
    • Jerome J. CuomoN. Mark Williams
    • C23C1435
    • C30B23/02C23C14/0063C23C14/3428C23C14/354C23C14/355C30B29/403C30B29/406H01J37/3408
    • A sputter transport device comprises a sealed chamber, a negatively-biased target cathode holder disposed in the chamber, and a substrate holder disposed in the chamber and spaced at a distance from the target cathode. A target cathode is bonded to the target cathode holder. A magnetron assembly is disposed in the chamber proximate to the target cathode. A negatively-biased, non-thermionic electron/plasma injector assembly is disposed between the target cathode and the substrate holder. The injector assembly fluidly communicates with a gas source and includes a plurality of hollow cathodes. Each hollow cathode includes an orifice communicating with the chamber. The device can be used to produce thin-films and ultra-thick materials in polycrystalline, single-crystal and epitaxial forms, and thus to produce articles and devices that are useful as metallic or insulating coatings, and as bulk semiconductor and optoelectronic materials.
    • 溅射输送装置包括密封室,设置在室中的负偏压目标阴极保持器和设置在室中并与靶阴极间隔一定距离的衬底保持器。 目标阴极与目标阴极保持器结合。 磁控管组件设置在靠近目标阴极的腔室中。 负极偏置的非热电子/等离子体注入器组件设置在目标阴极和衬底保持器之间。 喷射器组件与气体源流体连通并且包括多个空心阴极。 每个空心阴极包括与腔连通的小孔。 该器件可用于以多晶,单晶和外延形式生产薄膜和超厚材料,从而生产可用作金属或绝缘涂层以及作为体半导体和光电子材料的制品和器件。