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    • 16. 发明授权
    • Semiconductor device
    • 半导体器件
    • US06849900B2
    • 2005-02-01
    • US10606755
    • 2003-06-27
    • Satoshi AidaShigeo KouzukiMasaru IzumisawaHironori YoshiokaWataru Saito
    • Satoshi AidaShigeo KouzukiMasaru IzumisawaHironori YoshiokaWataru Saito
    • H01L21/336H01L29/06H01L29/739H01L29/78H01L29/76H01L29/94H01L31/062H01L31/113H01L31/119
    • H01L29/7811H01L29/0634H01L29/0653H01L29/0696H01L29/7802
    • A semiconductor device includes: a semiconductor substrate of a first conductivity type; a semiconductor layer of a first conductivity type formed on a first main surface of the semiconductor substrate, the semiconductor layer including a first region for a cell portion and a second region for a terminating portion, the second region being positioned in an outer periphery of the first region, the terminating portion maintaining breakdown voltage by extending a depletion layer to relieve an electric field; junction pairs of semiconductor layers periodically arranged so as to form a line from the first region to the second region in a first direction parallel to the first main surface in the semiconductor layer and having mutually opposite conductivity types of impurities, each of the junction pair being composed of a first impurity diffusion layer of a second conductivity type formed from a surface of the semiconductor layer toward the semiconductor substrate and a second impurity diffusion layer of a first conductivity type formed from the surface of the semiconductor layer toward the semiconductor substrate and adjacently to the first impurity diffusion layer; a base layer of a second conductivity type selectively formed on each surface layer of the junction pairs which are formed in the first region, so as to connect with the first impurity diffusion layer and the second impurity diffusion layer in the same manner; a source layer of a first conductivity type selectively formed on each surface layer of the base layers of the second conductive type; a control electrode formed above each surface of the base layers and above each surface of the source layers via an insulating film; a first main electrode formed so as to cover the control electrode and to contact the source layers and the base layers in the same manner; and a second main electrode formed on a second main surface opposite to the first main surface of the semiconductor substrate.
    • 半导体器件包括:第一导电类型的半导体衬底; 形成在所述半导体衬底的第一主表面上的第一导电类型的半导体层,所述半导体层包括用于单元部分的第一区域和用于端接部分的第二区域,所述第二区域位于所述半导体衬底的外周中 第一区域,终端部分通过延伸耗尽层来缓和电场来保持击穿电压; 在半导体层中平行于第一主表面的第一方向上并且具有相互相反的导电类型的杂质的周期性地布置以便形成从第一区域到第二区域的线的结对对, 由半导体层的朝向半导体衬底的表面形成的第二导电类型的第一杂质扩散层和由半导体层的表面朝向半导体衬底形成的第一导电类型的第二杂质扩散层,并且相邻于 第一杂质扩散层; 选择性地形成在形成在第一区域的结对的每个表面层上的第二导电类型的基底层,以与第一杂质扩散层和第二杂质扩散层相同的方式连接; 选择性地形成在第二导电类型的基底层的每个表面层上的第一导电类型的源极层; 控制电极,其经由绝缘膜形成在所述基底层的每个表面上方和所述源极层的每个表面上方; 形成为覆盖控制电极并以相同的方式接触源极层和基极层的第一主电极; 以及形成在与所述半导体衬底的所述第一主表面相对的第二主表面上的第二主电极。
    • 17. 发明授权
    • Insulated gate semiconductor device
    • 绝缘栅半导体器件
    • US06700156B2
    • 2004-03-02
    • US10321613
    • 2002-12-18
    • Wataru SaitohIchiro OmuraSatoshi Aida
    • Wataru SaitohIchiro OmuraSatoshi Aida
    • H01L2976
    • H01L29/7802H01L29/0696H01L29/0878H01L29/1095H01L29/42368H01L29/42372H01L29/7395H01L29/7813
    • An insulated gate semiconductor device includes a first semiconductor layer of a first conductivity type. A plurality of second semiconductor layers of a second conductivity type selectively formed in a surface area of the first semiconductor layer. At least one third semiconductor layer of the first conductivity type is formed in a surface area of each of the second semiconductor layers. A fourth semiconductor layer is formed on a bottom of the first semiconductor layer. At least one fifth semiconductor layer of the second conductivity type is provided in the first semiconductor layer and connected to at least one of the plurality of second semiconductor layers. The fifth semiconductor layer has impurity concentration that is lower than that of the second semiconductor layers.
    • 绝缘栅半导体器件包括第一导电类型的第一半导体层。 选择性地形成在第一半导体层的表面区域中的多个第二导电类型的第二半导体层。 第一导电类型的至少一个第三半导体层形成在每个第二半导体层的表面区域中。 在第一半导体层的底部形成第四半导体层。 第二导电类型的至少一个第五半导体层被提供在第一半导体层中并连接到多个第二半导体层中的至少一个。 第五半导体层的杂质浓度低于第二半导体层的杂质浓度。
    • 19. 发明授权
    • Lithotrity apparatus having a missed-shot preventive function
    • US5243985A
    • 1993-09-14
    • US707784
    • 1991-05-30
    • Satoshi AidaNobuyuki Iwama
    • Satoshi AidaNobuyuki Iwama
    • A61B17/22
    • A61B17/2258
    • An electromagnetic induction type lithotrity apparatus, having a shock-wave source utilizing electromagnetic induction to generate a shock-wave, and focusing means to focus the shock-wave at a predetermined position, for focusing and irradiating the shock-wave toward a stone in the body of a patient which is located at the predetermined position, thereby pulverizing the stone. The apparatus comprising a drive section (sending section) for driving the shock-wave source by a voltage lower than that for generating the shock-wave so as to send a low-pressure wave lower in pressure than the shock-wave to the inside of the body, an echo receiving section, including a piezoelectric film arranged in front of the shock-wave source, for receiving a low-pressure echo reflected from the body, an echo detecting section for detecting the intensity of an echo, among the echoes received by the echo receiving section, reflected by a focal zone of the shock-wave, and a control section for comparing the intensity of the echo detected by the echo detecting section with a predetermined value, sending a predetermined signal to the drive section (sending section) based on the comparison result, switching the drive voltage of the shock-wave source to a high voltage sufficient for lithotrity, and generating a signal for driving the shock-wave source.