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11. 发明授权

US07965133B2 Compensation techniques for reducing power consumption in digital circuitry 有权
标题翻译：用于降低数字电路功耗的补偿技术
公开(公告)号：US07965133B2
公开(公告)日：2011-06-21
申请号：US12160373
申请日：2007-10-31
申请人： Joseph Anidjar , Mohammad S. Mobin , Gregory W. Sheets , Vladimir Sindalovsky , Lane A. Smith
发明人： Joseph Anidjar , Mohammad S. Mobin , Gregory W. Sheets , Vladimir Sindalovsky , Lane A. Smith
IPC分类号： G05F1/10
CPC分类号： H03K19/00369
摘要： A compensation circuit for reducing power consumption in at least one digital circuit includes a first sample circuit connected to a first supply voltage, a second sample circuit connected to a second supply voltage, and a controller connected to the first and second sample circuits. The first and second sample circuits are substantially functionally equivalent to one another but optimized for different regions of operation within a specified range of PVT conditions. The controller is operative to receive respective output signals from the first and second sample circuits, to monitor a functionality of the second sample circuit relative to the first sample circuit, and to adjust a level of the second supply voltage to ensure correct operation of the second sample circuit throughout the specified range of PVT conditions. The digital circuit is operative from the second supply voltage.
摘要翻译：用于降低至少一个数字电路中的功耗的补偿电路包括连接到第一电源电压的第一采样电路，连接到第二电源电压的第二采样电路和连接到第一和第二采样电路的控制器。第一和第二采样电路基本上在功能上彼此相等，但是在PVT条件的指定范围内针对不同操作区域进行了优化。控制器可操作以从第一和第二采样电路接收相应的输出信号，以监测第二采样电路相对于第一采样电路的功能，并调整第二电源电压的电平，以确保第二采样电路的正常工作采样电路在指定的PVT条件范围内。数字电路从第二电源电压工作。

12. 发明申请

US20100290513A1 METHOD AND APPARATUS FOR INTEGRAL STATE INITIALIZATION AND QUALITY OF LOCK MONITORING IN A CLOCK AND DATA RECOVERY SYSTEM 有权
标题翻译：综合状态初始化和时钟和数据恢复系统中的监控质量的方法与装置
公开(公告)号：US20100290513A1
公开(公告)日：2010-11-18
申请号：US12846390
申请日：2010-07-29
申请人： Pervez M. Aziz , Gregory W. Sheets , Vladimir Sindalovsky
发明人： Pervez M. Aziz , Gregory W. Sheets , Vladimir Sindalovsky
IPC分类号： H04B17/00
CPC分类号： H03L7/0807 , H03L7/087 , H03L7/093 , H04L7/0004 , H04L7/0331
摘要： Methods and apparatus are provided for improving the performance of second order CDR systems. The integral state of the CDR system is initialized to a value that is based on an expected frequency profile that may be known a priori for certain applications. One or more quality of lock (QOL) metrics are also monitored that are derived from the integral register state value. A quality of a locking between a received signal and a local clock generated by a Clock and Data Recovery (CDR) system is evaluated by monitoring a state value of an integral register in a digital loop filter of the CDR system; evaluating one or more predefined criteria based on the integral register state value; and identifying a poor lock condition if the one or more predefined criteria are not satisfied.
摘要翻译：提供了用于提高二级CDR系统的性能的方法和装置。 CDR系统的整体状态被初始化为基于对于某些应用可以是先验已知的预期频率分布的值。还监视从积分寄存器状态值导出的一个或多个锁定质量（QOL）度量。通过监视CDR系统的数字环路滤波器中的积分寄存器的状态值来评估由时钟和数据恢复（CDR）系统产生的接收信号和本地时钟之间的锁定的质量; 基于积分寄存器状态值来评估一个或多个预定标准; 并且如果不满足一个或多个预定标准，则识别差的锁定条件。

13. 发明授权

US07773667B2 Pseudo asynchronous serializer deserializer (SERDES) testing 有权
标题翻译：伪异步串行器解串器（SERDES）测试
公开(公告)号：US07773667B2
公开(公告)日：2010-08-10
申请号：US11181286
申请日：2005-07-14
申请人： Vladimir Sindalovsky , Lane A. Smith , Ronald Lamar Freyman , Max Jay Olsen
发明人： Vladimir Sindalovsky , Lane A. Smith , Ronald Lamar Freyman , Max Jay Olsen
IPC分类号： H04B3/46 , H04B17/00 , H04Q1/20
CPC分类号： G01R31/31715
摘要： The various embodiments of the invention provide an apparatus, system and method of asynchronous testing a serializer and deserializer data communication apparatus (SERDES) for determining frequency and phase locking to pseudo asynchronous input data having a continual phase offset. An exemplary apparatus includes a data sampler adapted to sample input serial data and to provide output data; a controlled tap delay with a selected tap having a phase offset from the input serial data, in which the selected tap is selectively coupleable to the data sampler to provide pseudo asynchronous input serial data; a first variable delay control adapted to delay a reference frequency provided to the controlled tap delay in response to the pseudo asynchronous input serial data; and a second delay control adapted to adjust the plurality of taps in response to the pseudo asynchronous input serial data. In additional embodiments, the pseudo asynchronous input serial data is provided from an interpolated phase from at least two selected taps.
摘要翻译：本发明的各种实施例提供了用于确定频率和相位锁定到具有连续相位偏移的伪异步输入数据的串行器和解串器数据通信装置（SERDES）的异步测试的装置，系统和方法。示例性装置包括适于对输入串行数据进行采样并提供输出数据的数据采样器; 具有与输入串行数据相位偏移的所选抽头的受控抽头延迟，其中所选择的抽头选择性地耦合到数据采样器以提供伪异步输入串行数据; 第一可变延迟控制器，其适于响应于所述伪异步输入串行数据延迟提供给受控抽头延迟的参考频率; 以及适于响应于所述伪异步输入串行数据来调整所述多个抽头的第二延迟控制。在另外的实施例中，伪异步输入串行数据从来自至少两个选择的抽头的内插相位提供。

14. 发明授权

US07711043B2 Method and apparatus for determining latch position for decision-feedback equalization using single-sided eye 失效
标题翻译：用于使用单面眼确定用于判决反馈均衡的闩锁位置的方法和装置
公开(公告)号：US07711043B2
公开(公告)日：2010-05-04
申请号：US11540946
申请日：2006-09-29
申请人： Mohammad S. Mobin , Gary E. Schiessler , Gregory W. Sheets , Vladimir Sindalovsky , Lane A. Smith
发明人： Mohammad S. Mobin , Gary E. Schiessler , Gregory W. Sheets , Vladimir Sindalovsky , Lane A. Smith
IPC分类号： H03H7/30 , H03H7/40 , H03K5/159
CPC分类号： H04L25/03057 , H04L2025/03503
摘要： Methods and apparatus are provided for determining the threshold position of one or more latches employed for decision-feedback equalization. A threshold position of a latch employed by a decision-feedback equalizer is determined by constraining input data such that the input data only contains transitions from a first binary value; obtaining a plurality of samples of a single-sided data eye associated with the constrained input data; and determining a threshold position of the latch based on the samples. The constrained input data can comprise (i) transitions from a binary value of 1 to a binary value of 0 or 1; or (ii) transitions from a binary value of 0 to a binary value of 0 or 1. The size of the single-sided data eye can be obtained by analyzing a histogram associated with the single-sided data eye to identify a region having a constant hit count.
摘要翻译：提供了用于确定用于判决反馈均衡的一个或多个锁存器的阈值位置的方法和装置。通过约束输入数据来确定由判决反馈均衡器采用的锁存器的阈值位置，使得输入数据仅包含来自第一二进制值的转换; 获得与所述约束输入数据相关联的单面数据眼睛的多个样本; 以及基于所述样本确定所述锁存器的阈值位置。受约束的输入数据可以包括（i）从二进制值1到二进制值0或1的转换; 或（ii）从二进制值0到二进制值0或1的转换。单面数据眼的大小可以通过分析与单面数据眼相关联的直方图来识别具有不断的命中数。

15. 发明申请

US20090175395A1 DATA ALIGNMENT METHOD FOR ARBITRARY INPUT WITH PROGRAMMABLE CONTENT DESKEWING INFO 有权
标题翻译：具有可编程内容描述信息的仲裁输入的数据对齐方法
公开(公告)号：US20090175395A1
公开(公告)日：2009-07-09
申请号：US11969440
申请日：2008-01-04
申请人： Yasser AHMED , Xingdong Dai , Vladimir Sindalovsky , Lane Smith
发明人： Yasser AHMED , Xingdong Dai , Vladimir Sindalovsky , Lane Smith
IPC分类号： H04L7/00
CPC分类号： H03M9/00 , H04L7/005 , H04L7/04
摘要： In an exemplary embodiment, a data alignment system comprises a First-In First-Out register (FIFO), a programmable pattern generator connected to the FIFO, and a controller connected to the programmable pattern generator and the FIFO. The FIFO is configured to provide data to or receive data from a first data lane of a serial data link having one or more lanes. Each data lane of the serial data link is configured to transmit a respective serial data stream. The programmable pattern generator is configured to generate a plurality of alignment symbols. The controller is configured to manage the alignment of the one or more data lanes of the serial data link and the insertion of a selected one of the plurality of alignment symbols into each of the serial data streams.
摘要翻译：在示例性实施例中，数据对准系统包括先进先出寄存器（FIFO），连接到FIFO的可编程模式发生器和连接到可编程模式发生器和FIFO的控制器。 FIFO被配置为向具有一个或多个通道的串行数据链路的第一数据通道提供数据或从其接收数据。串行数据链路的每个数据通道被配置为发送相应的串行数据流。可编程模式发生器被配置为生成多个对准符号。控制器被配置为管理串行数据链路的一个或多个数据通道的对准以及将多个对准符号中选择的一个对准符号插入到每个串行数据流中。

16. 发明授权

US07425856B2 Phase interpolator with output amplitude correction 有权
标题翻译：具有输出幅度校正的相位内插器
公开(公告)号：US07425856B2
公开(公告)日：2008-09-16
申请号：US11479749
申请日：2006-06-30
申请人： Christopher J. Abel , Joseph Anidjar , Vladimir Sindalovsky , Craig B. Ziemer
发明人： Christopher J. Abel , Joseph Anidjar , Vladimir Sindalovsky , Craig B. Ziemer
IPC分类号： H03H11/16
CPC分类号： H03K5/13 , H03K2005/00052 , H03K2005/00156 , H03K2005/00195
摘要： A phase interpolator generates a phase-interpolated output clock signal Z from two phase-offset input clock signals A and B, where the interpolation angle of the output clock is based on a weight value W. The phase interpolator has A-side and B-side circuitry, each having (1) an array of parallel current mirrors, (2) a block of parallel switches, where each switch is connected in series with a corresponding current mirror, and (3) an encoder that controls the corresponding switches based on the weight value W. The total current through the phase interpolator varies with interpolation angle, such that, for example, the variation in output amplitude with interpolation angle is reduced. In general, individual bit values in weight value W are not used to control individual switches for all interpolation angles.
摘要翻译：相位插值器从两个相位偏移输入时钟信号A和B产生相位插值输出时钟信号Z，其中输出时钟的插值角基于权重值W.相位内插器具有A侧和B- 每个电路具有（1）并联电流镜阵列，（2）一组并联开关，其中每个开关与相应的电流镜串联连接，以及（3）编码器，其基于重量值W.通过相位内插器的总电流随内插角度变化，使得例如，具有内插角度的输出幅度的变化减小。通常，重量值W中的各个位值不用于控制各个开关的所有插补角度。

17. 发明授权

US07330060B2 Method and apparatus for sigma-delta delay control in a delay-locked-loop 失效
标题翻译：延迟锁定环路中Σ-Δ延迟控制的方法和装置
公开(公告)号：US07330060B2
公开(公告)日：2008-02-12
申请号：US11221387
申请日：2005-09-07
申请人： Christopher J. Abel , Abhishek Duggal , Peter C. Metz , Vladimir Sindalovsky
发明人： Christopher J. Abel , Abhishek Duggal , Peter C. Metz , Vladimir Sindalovsky
IPC分类号： H03L7/06
CPC分类号： H03L7/0812 , H03L7/089 , H03L7/093
摘要： Methods and apparatus are provided for sigma-delta delay control in a Delay-Locked-Loop that employs a delay line to generate a clock signal based on a reference signal. A first value is generated if a clock signal has a time lead relative to a reference signal; and a second value is generated if a clock signal has a time lag relative to a reference signal. The first and second values are accumulated to generate an N bit digital word; and the N bit digital word is reduced to an M bit digital word, where M is less than N. Thereafter, the M bit digital word can be converted to an analog bias signal. The reducing step can be performed, for example, by a sigma-delta modulator. The high frequency quantization noise generated by the sigma-delta modulator can be filtered using a low pass filter. The converting step can be performed by a digital-to-analog converter, such as a master/slave digital-to-analog converter.
摘要翻译：提供了延迟锁定环中的Σ-Δ延迟控制的方法和装置，其采用延迟线来基于参考信号产生时钟信号。如果时钟信号相对于参考信号具有时间导通，则产生第一值; 并且如果时钟信号相对于参考信号具有时滞，则产生第二值。累积第一和第二值以产生N位数字字; 并将N位数字字减少为M位数字字，其中M小于N.此后，M位数字字可以转换为模拟偏置信号。还原步骤可以由例如Σ-Δ调制器进行。可以使用低通滤波器对由Σ-Δ调制器产生的高频量化噪声进行滤波。转换步骤可以由诸如主/从数字模拟转换器之类的数 - 模转换器执行。

18. 发明申请

US20070217558A1 Method and apparatus for improving linearity in clock and data recovery systems 有权
标题翻译：提高时钟和数据恢复系统线性度的方法和装置
公开(公告)号：US20070217558A1
公开(公告)日：2007-09-20
申请号：US11375828
申请日：2006-03-15
申请人： Christopher Abel , Joseph Anidjar , Vladimir Sindalovsky , Craig Ziemer
发明人： Christopher Abel , Joseph Anidjar , Vladimir Sindalovsky , Craig Ziemer
IPC分类号： H04L7/00
CPC分类号： H04L7/0008
摘要： Disclosed is a system and method for improving the linearity of a clock and data recovery (CDR) circuit. A data stream is received and the phase of a clock signal is adjusted using two interpolators. The data stream is then recovered using the clock signal.
摘要翻译：公开了一种用于提高时钟和数据恢复（CDR）电路的线性度的系统和方法。接收数据流，并使用两个内插器调整时钟信号的相位。然后使用时钟信号恢复数据流。

19. 发明申请

US20070052463A1 Method and apparatus for sigma-delta delay control in a Delay-Locked-Loop 失效
标题翻译：延迟锁定环中Σ-Δ延迟控制的方法和装置
公开(公告)号：US20070052463A1
公开(公告)日：2007-03-08
申请号：US11221387
申请日：2005-09-07
申请人： Christopher Abel , Abhishek Duggal , Peter Metz , Vladimir Sindalovsky
发明人： Christopher Abel , Abhishek Duggal , Peter Metz , Vladimir Sindalovsky
IPC分类号： H03L7/06
CPC分类号： H03L7/0812 , H03L7/089 , H03L7/093
摘要： Methods and apparatus are provided for sigma-delta delay control in a Delay-Locked-Loop that employs a delay line to generate a clock signal based on a reference signal. A first value is generated if a clock signal has a time lead relative to a reference signal; and a second value is generated if a clock signal has a time lag relative to a reference signal. The first and second values are accumulated to generate an N bit digital word; and the N bit digital word is reduced to an M bit digital word, where M is less than N. Thereafter, the M bit digital word can be converted to an analog bias signal. The reducing step can be performed, for example, by a sigma-delta modulator. The high frequency quantization noise generated by the sigma-delta modulator can be filtered using a low pass filter. The converting step can be performed by a digital-to-analog converter, such as a master/slave digital-to-analog converter.
摘要翻译：提供了延迟锁定环中的Σ-Δ延迟控制的方法和装置，其采用延迟线来基于参考信号产生时钟信号。如果时钟信号相对于参考信号具有时间导通，则产生第一值; 并且如果时钟信号相对于参考信号具有时滞，则产生第二值。累积第一和第二值以产生N位数字字; 并将N位数字字减少为M位数字字，其中M小于N.此后，M位数字字可以转换为模拟偏置信号。还原步骤可以由例如Σ-Δ调制器进行。可以使用低通滤波器对由Σ-Δ调制器产生的高频量化噪声进行滤波。转换步骤可以由诸如主/从数字模拟转换器之类的数 - 模转换器执行。

20. 发明授权

US06732311B1 On-chip debugger 失效
标题翻译：片上调试器
公开(公告)号：US06732311B1
公开(公告)日：2004-05-04
申请号：US09564438
申请日：2000-05-04
申请人： Frederick Harrison Fischer , Scott A. Segan , Vladimir Sindalovsky
发明人： Frederick Harrison Fischer , Scott A. Segan , Vladimir Sindalovsky
IPC分类号： G06F1100
CPC分类号： G06F11/27
摘要： An integrated circuit debugger incorporated into an integrated circuit, allowing direct access to internal points within the integrated circuit. By having direct access to internal points within the integrated circuit, the debugger is capable of faster and more accurate debugging. The debugger is able to directly access internal points of the integrated circuit which were previously inaccessible or only accessible indirectly for debugging, such as memory addresses, memory data, read/write strobes, and internal chip states. In addition, by accessing internal points of the integrated circuits directly, debugging instructions can be performed in real-time with minimal interruption to the operation of the integrated circuit.
摘要翻译：集成电路调试器，集成在集成电路中，允许直接访问集成电路内的内部点。通过直接访问集成电路内的内部点，调试器能够更快更准确的调试。调试器能够直接访问先前无法访问或只能间接访问集成电路的内部点，用于调试，如存储器地址，存储器数据，读/写选通和内部芯片状态。此外，通过直接访问集成电路的内部点，可以实时地执行调试指令，同时最小化集成电路的操作中断。

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