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    • 14. 发明授权
    • Polishing apparatus
    • 抛光设备
    • US5951368A
    • 1999-09-14
    • US864906
    • 1997-05-29
    • Katsuhide WatanabeNoburu ShimizuIchiju Satoh
    • Katsuhide WatanabeNoburu ShimizuIchiju Satoh
    • B24B1/00
    • F16C32/044
    • The polishing apparatus can control the attitude of the top ring with respect to a surface of a turntable of a polishing apparatus is controlled so as to provide a uniform polish surface pressure across the entire polish surface. The polishing apparatus includes the turntable having an abrading surface, a top ring for holding an object to be polished to keep the object surface in moving contact with the abrading surface while rotating the turntable and the top ring, a magnetic bearing assembly for supporting a rotation shaft of the top ring by means of a thrust bearing device and at least one radial bearing device, and an attitude controller for controlling an orientation of the top ring with respect to the turntable through the magnetic bearing assembly.
    • 抛光装置可以控制顶环相对于抛光装置的转盘表面的姿态,以便在整个抛光表面上提供均匀的抛光表面压力。 抛光装置包括具有研磨表面的转盘,用于保持待抛光物体的顶环,用于在转动转台和顶环的同时使物体表面与研磨表面保持移动接触,用于支撑旋转的磁轴承组件 通过推力轴承装置和至少一个径向轴承装置的顶环的轴以及用于通过磁轴承组件控制顶环相对于转台的定向的姿态控制器。
    • 15. 发明授权
    • Polishing apparatus having interlock function
    • 具有互锁功能的抛光装置
    • US5904608A
    • 1999-05-18
    • US865993
    • 1997-05-30
    • Katsuhide Watanabe
    • Katsuhide Watanabe
    • B24B37/04B24B49/16G05B19/4063G05B19/416B24B51/00
    • B24B37/005B24B49/16G05B19/4063G05B19/416G05B2219/37434G05B2219/45199G05B2219/50113G05B2219/50205G05B2219/50276
    • A polishing apparatus is used for polishing a workpiece such as a semiconductor wafer to a flat mirror finish. The polishing apparatus has an interlock function includes a turntable having a polishing surface thereon, a top ring for holding a workpiece to be polished and pressing the workpiece against the polishing surface on the turntable, a first motor for rotating the turntable, and a second motor for rotating the top ring. The polishing apparatus further comprises a first actuator for lifting and lowering the top ring, a second actuator for moving the top ring in a horizontal direction, and a control unit for controlling the motors and the actuators. The control unit controls the motors and the actuators in such a manner that when an abnormality is detected in at least one of the motors and the actuators, at least one of the motors and the actuators other than that of the abnormality performs a predetermined operation.
    • 抛光装置用于将诸如半导体晶片的工件抛光到平面镜面。 抛光装置具有互锁功能,包括其上具有抛光表面的转台,用于保持要抛光的工件的顶环,并将工件压靠在转台上的抛光表面上,用于使转盘旋转的第一电动机和第二电动机 用于旋转顶环。 抛光装置还包括用于提升和降低顶环的第一致动器,用于沿水平方向移动顶环的第二致动器,以及用于控制电动机和致动器的控制单元。 所述控制单元以这样的方式控制所述电动机和所述致动器,即当至少一个所述电动机和所述致动器中检测到异常时,除了所述异常之外,所述电动机和所述致动器中的至少一个执行预定的操作。
    • 16. 发明授权
    • Electron microscope
    • 电子显微镜
    • US5814814A
    • 1998-09-29
    • US607613
    • 1996-02-27
    • Yoichi KanemitsuKatsuhide Watanabe
    • Yoichi KanemitsuKatsuhide Watanabe
    • H01J37/28H01J37/244
    • H01J37/28H01J2237/0216H01J2237/15H01J2237/248
    • An electron microscope has an electron gun for emitting an electron beam, a specimen holder for holding a specimen thereon, and a deflection coil for applying the electron beam from the electron gun to the specimen on the specimen holder. A controller produces a differential signal representing the difference between a signal from a vibration sensor which detects vibrations of the electron gun and a signal from another vibration sensor which detects vibrations of the specimen holder. The differential signal is added to a deflection signal for the deflection coil for thereby effecting feedforward control of the electron beam to cause the electron beam to reach the specimen on the specimen holder, irrespective of the vibrations of the electron gun and the specimen holder.
    • 电子显微镜具有用于发射电子束的电子枪,用于在其上保持试样的试样保持器和用于将来自电子枪的电子束施加到试样保持器上的试样的偏转线圈。 控制器产生表示来自检测电子枪的振动的振动传感器的信号与检测试样保持器的振动的另一振动传感器的信号之间的差的差分信号。 差分信号被加到偏转线圈的偏转信号上,从而进行电子束的前馈控制,使电子束到达试样架上的试样,而与电子枪和试样架的振动无关。
    • 17. 发明授权
    • Zero-power control type vibration eliminating apparatus
    • 零功率控制型振动消除装置
    • US5449985A
    • 1995-09-12
    • US111412
    • 1993-08-25
    • Yoichi KanemitsuKatsuhide Watanabe
    • Yoichi KanemitsuKatsuhide Watanabe
    • F16F15/02F16F15/03G05D19/02G12B9/08H01J37/16
    • F16F15/03
    • There is provided a vibration eliminating apparatus utilizing a magnetic suspending system which achieves zero power control. The vibration eliminating apparatus includes a table on which equipment to be installed, magnetic yokes fixed on the table, control magnets for suspending the magnetic yokes from an installation floor, displacement sensors for measuring gaps between the control magnets and the magnetic yokes, power amplifiers for supplying exciting currents to the control magnets, and compensation circuits for controlling the exciting currents of the control magnets by supplying outputs from the displacement sensors to the power amplifiers. Each control magnet includes a permanent magnet for generating a bias magnetic flux and an electromagnet for generating a control magnetic flux to form a magnetic circuit. An integrated value of the exciting current fed to the electromagnet is fed back to the power amplifier.
    • 提供一种利用实现零功率控制的磁悬浮系统的振动消除装置。 振动消除装置包括:安装设备的桌子,固定在桌子上的磁轭,用于将磁轭悬挂在安装地板上的控制磁铁,用于测量控制磁铁与磁轭之间的间隙的位移传感器,用于 向控制磁体提供激励电流,以及补偿电路,用于通过将位移传感器的输出提供给功率放大器来控制控制磁体的励磁电流。 每个控制磁体包括用于产生偏磁通的永磁体和用于产生控制磁通以形成磁路的电磁体。 馈送到电磁体的励磁电流的积分值被反馈给功率放大器。