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    • 14. 发明申请
    • Internal voltage generator of semiconductor device
    • 半导体器件的内部电压发生器
    • US20080001582A1
    • 2008-01-03
    • US11717662
    • 2007-03-14
    • Jong-Chern LeeSun-Hye Shin
    • Jong-Chern LeeSun-Hye Shin
    • G05F1/10
    • G05F1/465
    • An internal voltage generator of a semiconductor memory device is capable of changing driving abilities between standby and active modes, to respond faster in the active mode and prevent a leakage current in the standby mode. The internal voltage generator of a semiconductor memory device comprises a driving controller for generating drive control signals having information about standby and active modes, a first voltage generator enabled by the drive control signals for comparing an internal voltage with a reference voltage in the standby and active modes, a first driver for generating the internal voltage according to a comparison performed by the first voltage generator, a second voltage generator enabled by the drive control signal for comparing the internal voltage with the reference voltage in the active mode, and a second driver for generating the internal voltage according to a comparison performed by the second voltage generator.
    • 半导体存储器件的内部电压发生器能够改变待机模式和有源模式之间的驱动能力,以便在待机模式下更快地响应并防止在待机模式下的漏电流。 半导体存储器件的内部电压发生器包括用于产生具有关于待机和有功模式的信息的驱动控制信号的驱动控制器,通过用于将内部电压与待机和有效模式下的参考电压进行比较的驱动控制信号使能的第一电压发生器 模式,用于根据由第一电压发生器进行的比较产生内部电压的第一驱动器,通过用于将内部电压与活动模式中的参考电压进行比较的驱动控制信号使能的第二电压发生器和用于 根据由第二电压发生器执行的比较产生内部电压。
    • 16. 发明授权
    • Delay locked loop and method for driving the same
    • 延迟锁定环和驱动方法
    • US08446197B2
    • 2013-05-21
    • US12755949
    • 2010-04-07
    • Seung-Joon AhnJong-Chern Lee
    • Seung-Joon AhnJong-Chern Lee
    • H03L7/00
    • H03L7/0814H03L7/07
    • A delay locked loop includes a delay pulse generation unit, a coding unit, and a delay line. The delay pulse generation unit is configured to generate a delay pulse having a certain width. The coding unit is configured to code the delay pulse and output a code value. The delay line is configured to delay an input clock by the code value, and generate a delayed locked clock. The delay pulse has a logic high level state during a third period equivalent to a difference between a first period, which corresponds to an integer multiple of the input clock, and a second period, which is a certain replica delay period.
    • 延迟锁定环包括延迟脉冲产生单元,编码单元和延迟线。 延迟脉冲产生单元被配置为产生具有一定宽度的延迟脉冲。 编码单元被配置为对延迟脉冲进行编码并输出代码值。 延迟线被配置为通过代码值来延迟输入时钟,并产生延迟的锁定时钟。 延迟脉冲在与第一周期(对应于输入时钟的整数倍)和第二周期(在某个复制延迟周期)之间的差值的第三周期内具有逻辑高电平状态。
    • 19. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US08233339B2
    • 2012-07-31
    • US12875803
    • 2010-09-03
    • Hyun-Su YoonJong-Chern LeeSeung-Joon Ahn
    • Hyun-Su YoonJong-Chern LeeSeung-Joon Ahn
    • G11C7/00
    • G11C7/22G11C7/222G11C2207/2272
    • A semiconductor memory device includes an open-loop-type delay locked loop (DLL) configured to generate a clock signal locked by reflecting a first delay amount which actually occurs in a data path and a second delay amount which is required for locking the clock signal, a latency control unit configured to shift an inputted command according to a latency code value corresponding to the first delay amount and latency information, and output the shifted command, and an additional delay line configured to delay the shifted command according to a delay code value corresponding to the second delay amount, and output the command of which operation timing is controlled.
    • 半导体存储器件包括开环型延迟锁定环(DLL),其被配置为通过反映实际发生在数据路径中的第一延迟量和锁定时钟信号所需的第二延迟量来产生锁定的时钟信号 等待时间控制单元,被配置为根据与第一延迟量和等待时间信息相对应的等待时间码值来移位输入的命令,并输出移位的命令;以及附加延迟线,被配置为根据延迟代码值来延迟移位的命令 对应于第二延迟量,并且输出控制哪个操作定时的命令。