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    • 12. 发明授权
    • Method for fabricating CMOS device
    • 制造CMOS器件的方法
    • US06194256B1
    • 2001-02-27
    • US09340427
    • 1999-06-28
    • Jong Wook LeeGyu Seog Cho
    • Jong Wook LeeGyu Seog Cho
    • H01L21336
    • H01L21/84H01L27/1203
    • Disclosed is a method for fabricating CMOS device using a SOI substrate, and more particularly the method for fabricating CMOS device capable of improving mobility of electron and hole. The present invention provides a method for fabricating CMOS device comprising the steps of: providing an SOI substrate having a stacking structure of a base layer, a buried oxide layer and a semiconductor layer, wherein the SOI substrate is divided into a first region where a PMOS is formed later and a second region where an NMOS is formed later; forming first field oxide films to be contacted with the buried oxide layer by applying a thermal oxidation to a selected portion of the semiconductor layer being disposed in the first region of the SOI substrate; forming trenches with a depth to be contacted with the buried oxide layer in a selected portion of the semiconductor layer being disposed in the second region of the SOI substrate and then forming second field oxide films by filling the trenches with an insulating layer; and forming the PMOS in the portion of the semiconductor layer being defined by those first field oxide films, and the NMOS in the portion of the semiconductor layer being defined by those second field oxide films.
    • 公开了一种使用SOI衬底制造CMOS器件的方法,更具体地说,涉及一种能够改善电子和空穴的迁移率的CMOS器件的制造方法。 本发明提供了一种制造CMOS器件的方法,包括以下步骤:提供具有基底层,掩埋氧化物层和半导体层的堆叠结构的SOI衬底,其中SOI衬底被分成第一区域,其中PMOS 稍后形成NMOS,稍后形成NMOS的第二区域; 通过对设置在所述SOI衬底的所述第一区域中的所述半导体层的选定部分施加热氧化来形成与所述掩埋氧化物层接触的第一场氧化物膜; 在半导体层的选定部分中形成具有与掩埋氧化物层接触的深度的沟槽,其设置在SOI衬底的第二区域中,然后通过用绝缘层填充沟槽来形成第二场氧化膜; 并且在半导体层的由第一场氧化物膜定义的部分中形成PMOS,半导体层的部分中的NMOS由那些第二场氧化物膜限定。
    • 15. 发明授权
    • Audio and video synchronizing apparatus and method
    • 音视频同步装置及方法
    • US07982803B2
    • 2011-07-19
    • US11401798
    • 2006-04-10
    • Jong Wook Lee
    • Jong Wook Lee
    • H04N7/54H04N5/06
    • H04N5/775H04N5/04
    • Provided is an audio video synchronizing apparatus and method in a video processing equipment. It is detected whether or not an external device connected to an audio/video output port of the video processing equipment is an audio system, and an audio signal synchronized with a video signal outputted to a display device of the video processing equipment is provided to the audio system through an audio output port when the detection result shows that the external device is the audio system. Accordingly, a vide signal on a screen is synchronized with an audio signal outputted from the audio system.
    • 提供了一种视频处理设备中的音频视频同步装置和方法。 检测连接到视频处理设备的音频/视频输出端口的外部设备是否是音频系统,并且将与输出到视频处理设备的显示设备的视频信号同步的音频信号提供给 音频系统通过音频输出端口,当检测结果显示外部设备是音频系统时。 因此,屏幕上的视频信号与从音频系统输出的音频信号同步。
    • 20. 发明授权
    • SOI device with double gate and method for fabricating the same
    • 具有双栅极的SOI器件及其制造方法
    • US06352872B1
    • 2002-03-05
    • US09712705
    • 2000-11-14
    • Hyung Ki KimJong Wook Lee
    • Hyung Ki KimJong Wook Lee
    • H01L21338
    • H01L29/66772H01L29/42384H01L29/4908H01L29/78648
    • A silicon-on-insulator (SOI) device having a double gate, comprising: a supporting substrate; a first insulating layer formed over the supporting substrate; a first silicon layer formed over the first insulating layer, the first silicon layer including a first impurity region of a first conductivity disposed in a central portion thereof and intrinsic regions disposed at the both sides of the first impurity region; a second insulating layer formed over the first silicon layer; a second silicon layer formed over the second insulating layer, the second silicon layer including a second impurity region of a second conductivity disposed in a central portion thereof and third impurity regions of first conductivities disposed at the both sides of the second impurity region; a third insulating layer formed over the second impurity region; and a polysilicon layer doped with impurity ions of first conductivities, formed over the third insulating layer.
    • 一种具有双栅极的绝缘体上硅(SOI)器件,包括:支撑衬底; 形成在所述支撑基板上的第一绝缘层; 形成在所述第一绝缘层上的第一硅层,所述第一硅层包括设置在所述第一绝缘层的中心部分的第一导电性的第一杂质区和设置在所述第一杂质区两侧的本征区; 形成在所述第一硅层上的第二绝缘层; 形成在所述第二绝缘层上的第二硅层,所述第二硅层包括布置在其中心部分的具有第二导电性的第二杂质区和设置在所述第二杂质区两侧的第一导电性的第三杂质区; 形成在第二杂质区上的第三绝缘层; 以及在第三绝缘层上形成掺杂有第一导电性的杂质离子的多晶硅层。