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    • 11. 发明授权
    • High resolution surface potential microscope
    • 高分辨率表面电位显微镜
    • US08087289B2
    • 2012-01-03
    • US12172640
    • 2008-07-14
    • John D. AlexanderSergei Magonov
    • John D. AlexanderSergei Magonov
    • G01N23/00
    • G01Q60/30
    • A scanning probe system and method for using the same are disclosed. The system includes a probe that interacts with a specimen. The probe is caused to vibrate at a first frequency of the probe. A probe deflection signal indicative of an oscillation amplitude of the probe is generated and used to set the z-position probe position to maintain a property of the probe deflection signal at the first frequency at a predetermined value. A probe signal, having a DC and an AC component is applied between the specimen and the probe. The amplitude of a frequency component of the deflection signal at a mixing frequency of the first frequency and the second frequency is measured and used to generate an image or adjust the DC component.
    • 公开了一种扫描探针系统及其使用方法。 该系统包括与样品相互作用的探针。 使探针以探针的第一频率振动。 产生指示探针的振荡幅度的探针偏转信号,并用于设定z位置探针位置,以将探测偏转信号的特性保持在第一频率处于预定值。 在样本和探针之间施加具有DC和AC分量的探针信号。 测量在第一频率和第二频率的混合频率处的偏转信号的频率分量的振幅,并用于产生图像或调整DC分量。
    • 12. 发明申请
    • High Resolution Surface Potential Microscope
    • 高分辨率表面电位显微镜
    • US20100005868A1
    • 2010-01-14
    • US12172640
    • 2008-07-14
    • John D. AlexanderSergei Magonov
    • John D. AlexanderSergei Magonov
    • G01B5/28
    • G01Q60/30
    • A scanning probe system and method for using the same are disclosed. The system includes a probe that interacts with a specimen. The probe is caused to vibrate at a first frequency of the probe. A probe deflection signal indicative of an oscillation amplitude of the probe is generated and used to set the z-position probe position to maintain a property of the probe deflection signal at the first frequency at a predetermined value. A probe signal, having a DC and an AC component is applied between the specimen and the probe. The amplitude of a frequency component of the deflection signal at a mixing frequency of the first frequency and the second frequency is measured and used to generate an image or adjust the DC component.
    • 公开了一种扫描探针系统及其使用方法。 该系统包括与样品相互作用的探针。 使探针以探针的第一频率振动。 产生指示探针的振荡幅度的探针偏转信号,并用于设定z位置探针位置,以将探测偏转信号的特性保持在第一频率处于预定值。 在样本和探针之间施加具有DC和AC分量的探针信号。 测量在第一频率和第二频率的混合频率处的偏转信号的频率分量的振幅,并用于产生图像或调整DC分量。
    • 14. 发明授权
    • Single axis vibration reducing system
    • 单轴减振系统
    • US5811821A
    • 1998-09-22
    • US694690
    • 1996-08-09
    • John D. AlexanderMichael D. Kirk
    • John D. AlexanderMichael D. Kirk
    • F16F15/02G05D19/02H01J37/00
    • F16F15/02G05D19/02F16F2230/08Y10S977/872
    • A single-axis active vibration reducing system for reducing vibrations in an object in a single axis. The vibration isolation system enables the sensing of motion of the center of mass of an object along a single axis and, with the proper positioning of a single sensor-actuator pair with feedback operation, the dampening of vibrations of the object along that axis. Due to the positioning and alignment of the actuator, the vibration isolation system of the present invention does not introduce appreciable off-axis vibration. The vibration reducing system includes an actuator positioned on the object to impart an actuation force along an actuator axis to reduce vibrations of the object in the vibrational axis without imparting substantial motion to the object other than in the vibrational axis.
    • 单轴主动减振系统,用于减少单个轴上物体的振动。 振动隔离系统使得能够沿着单个轴检测物体的质心的运动,并且通过具有反馈操作的单个传感器 - 致动器对的适当定位,沿着该轴阻尼物体的振动。 由于致动器的定位和对准,本发明的隔振系统不会产生明显的离轴振动。 减振系统包括定位在物体上的致动器,以沿着致动器轴线施加致动力,以减少物体在振动轴线中的振动,而不会对振动轴线以外的物体施加相当大的运动。