会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 17. 发明授权
    • Magnetoresistive memory apparatus
    • 磁阻存储装置
    • US06903400B2
    • 2005-06-07
    • US10788319
    • 2004-03-01
    • Hideyuki KikuchiMasashige SatoKazuo Kobayashi
    • Hideyuki KikuchiMasashige SatoKazuo Kobayashi
    • H01L27/105H01L21/8246H01L21/8247H01L27/22H01L29/76H01L31/062H01L43/08
    • B82Y10/00H01L27/228
    • A magnetoresistive memory apparatus with a semiconductor substrate having a plurality of intersecting, non-contacting word lines and bit lines constituting a matrix, and a plurality of ferromagnetic tunnel junction devices located adjacent each intersection of the plurality of lines, each junction device having, disposed one upon another via insulating layers, free layers having variable magnetization directions and fixed magnetization layers having fixed magnetization directions, with magnetized information being written to the memory device at an intersection selected by magnetization electric currents supplied to the lines, the magnetized information read out by detecting the resistance variance of electric currents flowing through the memory device due to the tunnel effect. The plurality of junction devices deviate from the intersections of the plurality of lines, and between the lines are non-contacting free layer extended portions being extensions from only the free layer, to shorten the interval there between.
    • 一种具有半导体衬底的磁阻存储器件,具有多个相交的非接触字线和构成矩阵的位线,以及多个铁磁隧道结器件,位于多条线的每个交叉点附近,每个接合器件都具有 通过绝缘层,具有可变磁化方向的自由层和具有固定磁化方向的固定磁化层彼此依次通过磁化信息在由提供给线路的磁化电流选择的交点处被写入存储器件中,磁化信息由 检测由于隧道效应而流过存储器件的电流的电阻方差。 多个接合装置偏离多个线路的交叉点,并且线路之间的非接触自由层延伸部分仅从自由层延伸,以缩短其间的间隔。
    • 18. 发明授权
    • TMR sensor film using a tantalum insertion layer and systems thereof
    • 使用钽插入层的TMR传感器膜及其系统
    • US08570691B2
    • 2013-10-29
    • US13082098
    • 2011-04-07
    • Masashige SatoKojiro Komagaki
    • Masashige SatoKojiro Komagaki
    • G11B5/33G11B5/127
    • G11B5/3909
    • In one embodiment, a tunnel magnetoresistance (TMR) head includes a lead layer above a substrate, a seed layer above the lead layer, an antiferromagnetic (AFM) layer above the seed layer, a first ferromagnetic layer above the AFM layer, a second ferromagnetic layer above the first ferromagnetic layer, a coupling layer between the first and second ferromagnetic layers, the coupling layer causing a magnetization of the second ferromagnetic layer to be coupled to a magnetization of the first ferromagnetic layer, a fixed layer above the second ferromagnetic layer, an insertion layer adjacent the fixed layer or in the fixed layer, a barrier layer above the fixed layer, a free layer above the barrier layer, and a cap layer above the free layer. In another embodiment, the insertion layer is from about 0.05 nm to 0.3 nm in thickness and includes Ta, Ti, Hf, and/or Zr, and the free layer includes CoFeB.
    • 在一个实施例中,隧道磁阻(TMR)头包括衬底上的引线层,引线层上的晶种层,种子层上方的反铁磁(AFM)层,AFM层上方的第一铁磁层,第二铁磁 在所述第一铁磁层之上的层,在所述第一和第二铁磁层之间的耦合层,所述耦合层引起所述第二铁磁层的磁化耦合到所述第一铁磁层的磁化,所述第二铁磁层上方的固定层, 与固定层或固定层相邻的插入层,固定层上方的阻挡层,阻挡层上方的自由层以及自由层上方的覆盖层。 在另一个实施例中,插入层的厚度为约0.05nm至0.3nm,并且包括Ta,Ti,Hf和/或Zr,并且自由层包括CoFeB。