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    • 16. 发明申请
    • METHOD FOR MANUFACTURING A SEMICONDUCTOR-ON-INSULATOR SUBSTRATE FOR MICROELECTRONICS AND OPTOELECTRONICS
    • 微电子和光电子半导体绝缘体衬底的制造方法
    • US20090017602A1
    • 2009-01-15
    • US12144992
    • 2008-06-24
    • Jean-Francois DAMLENCOURTLaurent CLAVELIER
    • Jean-Francois DAMLENCOURTLaurent CLAVELIER
    • H01L21/00
    • H01L21/02516H01L21/0242H01L21/02422H01L21/0245H01L21/02502H01L21/02532H01L21/02639H01L21/02664
    • The method includes the following steps: supplying a substrate comprising a support having one face made of a dielectric material supporting a strained silicon thin layer having a or orientation, formation of a first mask on a portion of the strained silicon thin layer, epitaxy of Si1−xGex on the portion of the layer not masked by the first mask, germanium condensation, until a strained germanium layer is obtained, which rests on the face of the support made of a dielectric material, the strained germanium layer then being covered by a silicon oxide layer, elimination of the first mask and of the silicon oxide layer, formation of a second mask on said semi-conducting thin layer exposed via the previous step, the second mask protecting a region of the remaining strained germanium portion and at least one region of the strained silicon portion, the second mask exposing a remaining strained germanium portion, epitaxial growth of germanium on the remaining strained germanium portion, in order to obtain a germanium thick layer, elimination of the second mask.
    • 该方法包括以下步骤:提供包括具有一个表面的支撑体的基底,该表面由电介质材料构成,该介电材料支撑具有<110>或<111>取向的应变硅薄层,在应变硅的一部分上形成第一掩模 薄层,在未被第一掩模掩蔽的层的部分上的Si1-xGex的外延,锗缩合,直到获得应变锗层,其位于由介电材料制成的支撑体的表面上,应变锗层 然后被氧化硅层覆盖,消除第一掩模和氧化硅层,在通过前一步骤暴露的所述半导体薄层上形成第二掩模,第二掩模保护剩余的应变锗的区域 部分和应变硅部分的至少一个区域,第二掩模暴露剩余的应变锗部分,锗在剩余的应变锗上的外延生长 为了获得锗厚层,消除了第二个掩模。