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    • 121. 发明公开
    • METHOD AND SYSTEM FOR TESTING AN ELECTRONIC UNIT
    • 用于测试电子单元的方法和系统
    • EP3191856A1
    • 2017-07-19
    • EP15760196.4
    • 2015-09-09
    • Enics AG
    • FEDERLEY, KristianMATTILA, Jukka
    • G01R31/28
    • G01R31/2834G01R31/2839G01R31/31703
    • A method of testing an electronic unit by comparing resulting signal shapes from the unit to be tested and a known functioning unit. The method includes powering off the units for testing and feeding one or more predefined signal shapes of two or more different frequencies as input signals to the known functioning unit and to the unit to be tested at corresponding test points. The method further includes measuring the resulting signal shapes from both units at corresponding measurement points and comparing at least one resulting signal shape from the known functioning unit with the corresponding resulting signal shape from the unit to be tested. The method also includes detecting a fault in the unit to be tested on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested.
    • 本发明的方法和系统旨在通过将由系统的信号发生器(1)创建的一个或多个预定义的信号形状作为输入信号馈送到已知的功能单元(3a)和用于测试电子单元 待测试单元(3b)在相应的测试点(10a,10b)。 在相应的测量点(8d,8e,8f和8g,8h,8i)同时或分开地用系统的测量仪器(4)从两个单元(3a,3b)测量得到的信号形状。 然后将来自良品单元(3a)的至少一个结果信号形状与来自待测试单元(3b)的相应结果信号形状进行比较。 基于从待测试单元接收的所得信号形状在时间轴上的现有信号形状失真来检测待测试单元(3b)中的故障。 被测电子单元(3b)与电子功能单元(3a)同时或可互换地包含在系统中。 所得到的信号形状通过将其转换为描述信号形状的离散值来呈现。 当在系统中的计算机可读介质中运行时,本发明的计算机程序产品执行方法步骤。 本发明的方法用于电子产品生产测试,电子维修中的故障识别,制造和维修中的部件测试或者伪造部件识别。
    • 123. 发明公开
    • Time-domain reflectometer de-embed probe
    • De-embeddete Sonde eines Zeitbereichsreflektometers
    • EP2853912A1
    • 2015-04-01
    • EP14186466.0
    • 2014-09-25
    • Tektronix, Inc.
    • Knierim, DanielHickman, Barton
    • G01R35/00G01R31/319G01R1/067
    • G01R31/31908G01R1/06772G01R27/28G01R31/2839G01R35/002
    • A de-embed probe (100) including an input (114, 116) configured to connect to a device under test, a memory (108), a signal generator (102) connected to the input, the signal generator configured to generate a test signal, and a controller (110) connected to the signal generator and configured to control the signal generator. The de-embed probe may be used in a test and measurement system. The test and measurement system also includes a test and measurement instrument including a processor connected to the controller of the de-embed probe, the processor configured to provide instructions (120) to the controller, and a test and measurement input to receive an output (118) from the de-embed probe.
    • 包括被配置为连接到被测设备的输入端(114,116)的解嵌入探头(100),存储器(108),连接到输入端的信号发生器(102),所述信号发生器被配置为产生测试 信号和连接到信号发生器并被配置为控制信号发生器的控制器(110)。 去嵌入探针可用于测试和测量系统。 测试和测量系统还包括测试和测量仪器,其包括连接到解嵌入探测器的控制器的处理器,所述处理器被配置为向控制器提供指令(120),以及测试和测量输入以接收输出( 118)从去嵌入探针。