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    • 111. 发明申请
    • Increasing the surface area of a memory cell capacitor
    • 增加存储单元电容器的表面积
    • US20080237796A1
    • 2008-10-02
    • US11731193
    • 2007-03-30
    • Brian S. DoyleRobert S. ChauVivek DeSuman DattaDinesh Somasekhar
    • Brian S. DoyleRobert S. ChauVivek DeSuman DattaDinesh Somasekhar
    • H01L29/92H01L21/20
    • H01L28/91H01L27/10817H01L27/10852
    • Methods and apparatuses to increase a surface area of a memory cell capacitor are described. An opening in a second insulating layer deposited over a first insulating layer on a substrate is formed. The substrate has a fin. A first insulating layer is deposited over the substrate adjacent to the fin. The opening in the second insulating layer is formed over the fin. A first conducting layer is deposited over the second insulating layer and the fin. A third insulating layer is deposited on the first conducting layer. A second conducting layer is deposited on the third insulating layer. The second conducting layer fills the opening. The second conducting layer is to provide an interconnect to an upper metal layer. Portions of the second conducting layer, third insulating layer, and the first conducting layer are removed from a top surface of the second insulating layer.
    • 描述了增加存储单元电容器的表面积的方法和装置。 形成了沉积在基板上的第一绝缘层上的第二绝缘层中的开口。 衬底具有翅片。 第一绝缘层沉积在邻近鳍片的衬底上。 第二绝缘层上的开口形成在鳍上。 第一导电层沉积在第二绝缘层和鳍上。 第三绝缘层沉积在第一导电层上。 在第三绝缘层上沉积第二导电层。 第二导电层填充开口。 第二导电层是提供与上金属层的互连。 从第二绝缘层的顶表面去除第二导电层,第三绝缘层和第一导电层的部分。
    • 112. 发明申请
    • Error-detection flip-flop
    • 错误检测触发器
    • US20070168848A1
    • 2007-07-19
    • US11323675
    • 2005-12-30
    • James TschanzSubhasish MitraVivek De
    • James TschanzSubhasish MitraVivek De
    • G06F11/00
    • G01R31/31937G01R31/31726
    • An error-detection flip-flop is disclosed for identifying timing errors in digital circuits. The error-detection flip-flop is a master-slave flip-flop including logic to determine whether an input signal is received during a predetermined clock period, signifying a timing error. The error-detection flip-flop produces a variable-length error pulse, which may be combined with other error pulses and converted to a stable signal for sampling by error-correction circuitry. The error-detection flip-flop does not increase the clocking power of the digital circuit and consumes little additional circuit area.
    • 公开了用于识别数字电路中的定时误差的错误检测触发器。 误差检测触发器是主从触发器,其包括用于确定在预定时钟周期期间是否接收到输入信号的逻辑,表示定时误差。 误差检测触发器产生可变长度误差脉冲,其可以与其他误差脉冲组合并转换成用于由纠错电路进行采样的稳定信号。 误差检测触发器不会增加数字电路的时钟功率,并且消耗少量额外的电路面积。