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101. 发明专利

JPS53125211A METHOD AND APPARATUS FOR PATENTING OF STEEL WIRE ROD 失效
公开(公告)号：JPS53125211A
公开(公告)日：1978-11-01
申请号：JP4015177
申请日：1977-04-07
申请人： KOBE STEEL LTD
发明人： TAKAHASHI EIJI , SHIMAZU SHINICHI , OKI YASUHIRO , ISHIGAMI OSAMU
IPC分类号： C21D9/56 , C21D1/19 , C21D1/20
摘要： PURPOSE:To decrease the cost of treatment and to improve the working environment, by cooling the steel wire rod austenitized by heating using the air sent under pressure which is sent in the reverse direction for the wire rod and thus by causing the pearlite of bainite transformation.

102. 发明专利

JPS5240413A PROCESS FOR HEAT TREATING METALLIC MATERIAL BY MEANS OF FLUIDIZED BED 失效
公开(公告)号：JPS5240413A
公开(公告)日：1977-03-29
申请号：JP11703075
申请日：1975-09-26
申请人： KOBE STEEL LTD
发明人： TAKAHASHI EIJI , SHIMIZU MASARU , OKI YASUHIRO , ISHIGAMI OSAMU
IPC分类号： C21D1/00 , C21D1/44 , C21D1/53 , C21D9/567
摘要： PURPOSE:Deterioration in fluidization and dropin heat exchanging capacity caused by the mixing of scale into the fluidized bed is prevented.

103. 发明专利

JP2014215085A 混練機用温度計审中-公开
标题翻译：千斤顶温度计
公开(公告)号：JP2014215085A
公开(公告)日：2014-11-17
申请号：JP2013090531
申请日：2013-04-23
申请人：株式会社神戸製鋼所 , Kobe Steel Ltd
发明人： MANABE CHITAKA , FUKUI TOSHIHIDE , TAKAHASHI EIJI , YAMANE YASUAKI , TANAKA YUSUKE
IPC分类号： G01J5/00 , G01J5/02
CPC分类号： G01J5/00 , G01J5/02
摘要：【課題】混練物の放射率変動の影響を受けることなく混練物の温度を測定することができる、放射測温を利用した混練機用温度計を提供する。【解決手段】混練機内の混練物に先端部を接しさせて当該混練物の温度を測定する混練機用温度計100で、先端が閉じられた筒状の閉端管1と、前記閉端管の内部に配置され、前記閉端管の先端部の内面1aから放射される赤外線エネルギーを検出する放射温度計部20と、を備えている。【選択図】図1
摘要翻译：要解决的问题：提供一种使用辐射温度测量的捏合机温度计，其可以测量捏合产物的温度而不受捏合产物的发射率波动的影响。解决方案：一种用于捏合机的温度计100，使其尖端进入在捏合机中与捏合物接触以测量捏合产品的温度包括：具有封闭端的圆柱形封闭端管1; 以及辐射温度计部20，其设置在封闭端部管内，并且检测从封闭端部管的前端部的内表面1a发出的红外线能量。

104. 发明专利

JP2014182019A Apparatus and method for shape measurement 有权
标题翻译：形状测量的装置和方法
公开(公告)号：JP2014182019A
公开(公告)日：2014-09-29
申请号：JP2013056985
申请日：2013-03-19
申请人： Kobe Steel Ltd , 株式会社神戸製鋼所
发明人： SAKOTA HISAKAZU , KATAYAMA RYO , TAKAHASHI EIJI
IPC分类号： G01B11/24 , G01B11/08
摘要： PROBLEM TO BE SOLVED: To provide an apparatus and method for simply measuring a shape and dimension of a measuring object having a periodic structure such as a deformed steel bar.SOLUTION: The shape measuring apparatus measures a surface shape of a measuring object in which knots are longitudinally and periodically formed, by a light-section method, where the measuring object moves longitudinally at a prescribed speed, and irradiates a light sectioning line in a direction crossing with the moving direction of the measuring object. When v is the moving speed of the measuring object, L is an interval between the knots, w is a longitudinal length of the knots and n and m are positive integers, the irradiated measuring object is photographed at a frame rate f represented by the following expression: f=v/nL±(1/m)*(w/v).
摘要翻译：要解决的问题：提供简单地测量具有诸如变形钢筋等周期性结构的测量对象的形状和尺寸的装置和方法。解决方案：形状测量装置测量测量对象的表面形状，其中结纵向和周期地形成，其中测量对象以规定的速度纵向移动，并且沿与测量对象的移动方向交叉的方向照射光分割线。当v是测量对象的移动速度时，L是节点之间的间隔，w是节点的纵向长度，n和m是正整数，照射的测量对象以下列代表的帧速率f拍摄表达式：f = v / nL±（1 / m）*（w / v）。

105. 发明专利

JP2012242138A Shape measuring device 审中-公开
标题翻译：形状测量装置
公开(公告)号：JP2012242138A
公开(公告)日：2012-12-10
申请号：JP2011109836
申请日：2011-05-16
申请人： Kobe Steel Ltd , 株式会社神戸製鋼所
发明人： KAJITA MASAKAZU , AMANAKA MASAHITO , TAKAHASHI EIJI
IPC分类号： G01B11/24 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To calculate at high speed not only shapes of front and rear surfaces of a solar battery wafer, but also a thickness of the solar battery wafer.SOLUTION: Light sources 121 and 131 irradiate front and rear surfaces of a solar battery wafer with a light cutting line CL. Cameras 122 and 132 perform continuous imaging of a light cutting line image of the front and rear surfaces of a measurement sample 500, every time the solar battery wafer is transported a predetermined distance. Measurement data calculating parts 123 and 133 calculate, as front surface measurement data and rear surface measurement data, gravity center coordinates where the light cutting line CL appears from an angle light cutting line image. A height data calculating part 143 calculates height data on the front and rear surfaces of the solar battery wafer from the front surface measurement data and the rear surface measurement data. A thickness data calculating part 146 obtains thickness data on the solar battery wafer from the height data of the front and rear surfaces of the solar battery wafer.
摘要翻译：要解决的问题：不仅高速计算太阳能电池晶片的前表面和后表面的形状，而且计算太阳能电池晶片的厚度。解决方案：光源121和131用光切割线CL照射太阳能电池晶片的前表面和后表面。每当太阳能电池晶片被输送预定距离时，照相机122和132对测量样品500的前表面和后表面的切光线图像进行连续成像。测量数据计算部123和133计算出来自角度光切割线图像的光切割线CL出现的重心坐标，作为前表面测量数据和后表面测量数据。高度数据计算部143从前表面测量数据和后表面测量数据计算太阳能电池晶片的前表面和后表面上的高度数据。厚度数据计算部分146从太阳能电池晶片的前表面和后表面的高度数据获得太阳能电池晶片上的厚度数据。版权所有（C）2013，JPO＆INPIT

106. 发明专利

JP2012018156A Surface shape measurement apparatus and surface shape measurement method 审中-公开
标题翻译：表面形状测量装置和表面形状测量方法
公开(公告)号：JP2012018156A
公开(公告)日：2012-01-26
申请号：JP2011004815
申请日：2011-01-13
申请人： Kobe Steel Ltd , 株式会社神戸製鋼所
发明人： AMANAKA MASAHITO , TAKAHASHI EIJI , KAJITA MASAKAZU
IPC分类号： G01B11/24
摘要： PROBLEM TO BE SOLVED: To provide a surface shape measurement apparatus and a surface shape measurement method capable of more accurately measuring the surface shape of a measured object in nm order in a relatively short time.SOLUTION: The surface shape measurement apparatus SA of the present invention deals with three or more measuring points of a measured object Ob per one measurement spot MP. For example, the surface shape measurement apparatus SA executes the steps of: dividing a measuring light ML generated in a measuring light generation unit 1A into three measuring lights in a measuring unit 2A in order to irradiate each of three measuring points P1 to P3 with the measuring light ML; irradiating each of the three measuring points P1 to P3 of the measured object Ob with the divided measuring light ML1 to ML3; making a pair of reflected lights RL1, RL2 to interfere with each other as well as making a pair of reflected lights RL2, RL3 to interfere with each other so as to use a common reflected light RL2, where RL1 to RL3 are reflected lights of the measuring lights ML1 to ML3; and obtaining the surface shape of the measured object Ob based on a first interfering light IL1 and a second interfering light IL2 obtained by the above light interference.
摘要翻译：解决的问题：提供一种表面形状测量装置和表面形状测量方法，其能够在相当短的时间内以nm为单位更准确地测量被测物体的表面形状。解决方案：本发明的表面形状测量装置SA处理每个测量点MP的测量对象Ob的三个或更多个测量点。例如，表面形状测量装置SA执行以下步骤：将在测量光发生单元1A中生成的测量光ML分成测量单元2A中的三个测量光，以便将三个测量点P1至P3中的每一个照射到测光ML; 将测量对象Ob的三个测量点P1至P3中的每一个与划分的测量光ML1至ML3照射; 使一对反射光RL1，RL2相互干扰，并使一对反射光RL2，RL3彼此干涉，以便使用公共反射光RL2，其中RL1至RL3是反射光测量灯ML1至ML3; 并且基于由上述光干涉获得的第一干涉光IL1和第二干涉光IL2获得测量对象Ob的表面形状。版权所有（C）2012，JPO＆INPIT

107. 发明专利

JP2012002596A Three-dimensional shape measuring device 审中-公开
标题翻译：三维形状测量装置
公开(公告)号：JP2012002596A
公开(公告)日：2012-01-05
申请号：JP2010136315
申请日：2010-06-15
申请人： Kobe Steel Ltd , Kobelco Kaken:Kk , 株式会社コベルコ科研 , 株式会社神戸製鋼所
发明人： KAJITA MASAKAZU , SAKOTA HISAKAZU , TAKAHASHI EIJI , YAMASHITA HIDEYUKI , SENOO KAZUNOBU
IPC分类号： G01B11/24 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To provide a three-dimensional shape measuring device that removes a curvature component of a light cutting line to accurately calculate cross-sectional shape data of a solar cell wafer.SOLUTION: A wafer shape data acquisition part 221 acquires wafer shape data defining a shape of a light cutting line from a wafer image. A standard planar shape data acquisition part 222 varies height of a standard plane through several levels to acquire standard planar shape data defining a shape of a light cutting line at each level from a standard planar image. A shape correction part 341 specifies standard planar shape data of a shape most resembling the wafer shape data from a standard planar shape data storage part 80 and calculates difference between the specified standard planar shape data and the wafer shape data as corrected wafer shape data. A cross-sectional shape calculation part 342 calculates cross-sectional data of the wafer from the corrected wafer shape data calculated in the shape correction part 341.
摘要翻译：要解决的问题：提供一种去除光切割线的曲率分量以精确地计算太阳能电池晶片的横截面形状数据的三维形状测量装置。晶片形状数据获取部221从晶片图像获取限定光切割线的形状的晶片形状数据。标准平面形状数据获取部分222将标准平面的高度改变到几个级别，以获得从标准平面图像在每个级别定义光切割线的形状的标准平面形状数据。形状校正部分341从标准平面形状数据存储部分80指定最类似于晶片形状数据的形状的标准平面形状数据，并且计算指定的标准平面形状数据和晶片形状数据之间的差作为校正的晶片形状数据。横截面形状计算部分342根据在形状校正部分341中计算的校正的晶片形状数据来计算晶片的横截面数据。版权所有：（C）2012，JPO＆INPIT

108. 发明专利

JP2011245517A Welding sensor 有权
标题翻译：焊接传感器
公开(公告)号：JP2011245517A
公开(公告)日：2011-12-08
申请号：JP2010121836
申请日：2010-05-27
申请人： Kobe Steel Ltd , 株式会社神戸製鋼所
发明人： ASANO TATSURO , OKAMOTO AKIRA , HIDA MASATOSHI , TAKAHASHI EIJI
IPC分类号： B23K31/00 , B08B5/00 , B23K9/095 , B23K9/32
摘要： PROBLEM TO BE SOLVED: To provide a welding sensor capable of reducing influence of purge air to a shield gas while effectively preventing scattered substances from adhering to a protector with the purge air of a minimum flow rate by rectifying the purge air.SOLUTION: The welding sensor includes: a sensor housing 4 which houses a projector 2 capable of emitting detection light L to a welding workpiece W, and a camera 3 imaging the welding workpiece W to which the detection light L is emitted; a cover 5 fitted in a side of the welding workpiece W for closing the sensor housing 4, and provided with a projection window 6 for the projector 2 and an imaging window 7 for the camera 3; a translucent protector 8 arranged inside of the housing of the projection window 6 and the imaging window 7 of the cover 5 for covering the projector 2 and the camera 3; and a first air jetting mechanism 9 provided between the protector 8 and the cover 5, and jetting the purge air P from each inner peripheral portion of the projection window 6 and the imaging window 7 to each center portion.
摘要翻译：要解决的问题：提供一种焊接传感器，其能够减少吹扫空气对屏蔽气体的影响，同时通过对净化空气进行整流来有效地防止散射物质与具有最小流量的吹扫空气粘附到保护器上。焊接传感器包括：传感器壳体4，其容纳能够向焊接工件W发射检测光L的投影仪2;摄像机3，其对发射检测光L的焊接工件W进行成像; 安装在焊接工件W侧的盖5，用于关闭传感器壳体4，并且设置有用于投影仪2的投影窗6和用于照相机3的成像窗口7; 布置在投影窗6的壳体内部的半透明保护器8和用于覆盖投影仪2和照相机3的盖5的成像窗口7; 以及设置在保护器8和盖5之间的第一空气喷射机构9，并且将喷射空气P从投影窗6和成像窗口7的每个内周部分喷射到每个中心部分。版权所有（C）2012，JPO＆INPIT

109. 发明专利

JP2011141260A Device and method for inspecting tyre shape 有权
标题翻译：用于检查轮胎形状的装置和方法
公开(公告)号：JP2011141260A
公开(公告)日：2011-07-21
申请号：JP2010068107
申请日：2010-03-24
申请人： Kobe Steel Ltd , 株式会社神戸製鋼所
发明人： TAKAHASHI EIJI , SAKOTA HISAKAZU , TSUJI TOSHIYUKI , TAKEDA GEN , MURAKAMI MASAO
IPC分类号： G01B11/24
CPC分类号： G01B11/0608 , G01M17/027 , G01N21/95 , G06T7/001 , G06T2207/30164
摘要： PROBLEM TO BE SOLVED: To calculate and acquire only the height of indentation defects by subtracting a height portion of original indentation marks, even when the indentation defects exist on the indentation marks in piles.
SOLUTION: A shape defect of a sidewall surface of an inspection tire is inspected based on an indentation removal image acquired as a result of a difference processing process via following processes, namely: a mask image generation process wherein boundary lines, which are the contours of indentation marks, are detected in a sample original image, which is a two-dimensional image of the sidewall surface of a sample tire, and a mask image displaying the location of the boundary lines is generated; a height offset image generation process wherein a height offset image is generated, which is acquired by removing a region corresponding to the locations of boundary lines shown on the mask image in the sample original image, and by classifying the height of a residual domain by using a plurality of discrete height thresholds; and the difference processing process wherein a height offset image is subtracted from an inspection image which is a two-dimensional image of the sidewall surface of the inspection tire, and a boundary region shown by the mask image is removed.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：即使在桩中的凹痕上存在凹痕缺陷，也可以通过减去原始凹痕标记的高度部分来计算和获取压痕缺陷的高度。解决方案：基于通过以下处理作为差处理处理的结果而获取的凹痕去除图像来检查检查轮胎的侧壁表面的形状缺陷，即：掩模图像生成处理，其中边界线是在作为样本轮胎的侧壁表面的二维图像的样本原始图像中检测出凹痕的轮廓，并且生成显示边界线的位置的掩模图像; 高度偏移图像生成处理，其中生成高度偏移图像，其通过去除与样本原始图像中的掩模图像上显示的边界线的位置相对应的区域而获取，并且通过使用对残留域的高度进行分类多个离散高度阈值; 以及差分处理过程，其中从作为检查轮胎的侧壁表面的二维图像的检查图像中减去高度偏移图像，并且去除由掩模图像示出的边界区域。版权所有（C）2011，JPO＆INPIT

110. 发明专利

JP2011043355A Sodium ion detection reagent, sodium ion detection method, and sodium ion detector 审中-公开
标题翻译：碘离子检测试剂，钠离子检测方法和钠离子检测器
公开(公告)号：JP2011043355A
公开(公告)日：2011-03-03
申请号：JP2009190239
申请日：2009-08-19
申请人： Kobe Steel Ltd , 株式会社神戸製鋼所
发明人： KIMURA KEIICHI , MACHIYA KOJI , KATAYAMA AKIRA , TAKAHASHI EIJI
IPC分类号： G01N21/77 , C07C205/23 , C07C245/08 , G01N21/41 , G01N21/78 , G01N25/16
CPC分类号： G01N21/78 , C07C205/23 , C07C245/08 , C09B29/00 , C09B57/00
摘要： PROBLEM TO BE SOLVED: To provide a sodium ion detection reagent capable of highly precisely detecting sodium ions even when the concentration of the sodium ions is lower in a sample; a sodium ion detection method using the sodium ion detection reagent; and a sodium ion detector.
SOLUTION: A sodium ion detection reagent comprising a compound having calix[4]arene and a coloring organic group color-developable by proton dissociation equilibrium in the molecule is used. Specifically, a sodium ion detection method is used that detects sodium ions in a sample by measuring as an object to be measured one that has captured sodium ion by the sodium ion detection reagent through a photothermal conversion measuring method, for example.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：即使当样品中钠离子的浓度较低时，提供能够高精度检测钠离子的钠离子检测试剂; 使用钠离子检测试剂的钠离子检测方法; 和钠离子检测器。解决方案：使用包含具有杯[4]芳烃的化合物和通过在分子中通过质子解离平衡显色的着色有机基团的钠离子检测试剂。具体而言，例如使用钠离子检测方法，其通过例如通过钠离子检测试剂测定作为被测定对象的钠离子检测试剂，检测样品中的钠离子。版权所有（C）2011，JPO＆INPIT

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