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101. 发明申请

US20130271054A1 ELECTRIC TOOL 审中-公开
标题翻译：电动工具
公开(公告)号：US20130271054A1
公开(公告)日：2013-10-17
申请号：US13989480
申请日：2011-12-06
申请人： Masahiro Watanabe
发明人： Masahiro Watanabe
IPC分类号： H02P7/14
CPC分类号： H02P7/14 , B25B21/00 , B25F5/00
摘要： An electric tool may include an electric motor, a switch operable by a user for adjusting the rotational speed of the electric motor, an operation amount detection device configured to detect the operation amount of the switch, and an operation amount indicating device coupled to the operation amount detection device and configured to indicate the detected operation amount to the user.
摘要翻译：电动工具可以包括电动机，可由用户操作的用于调节电动机的转速的开关，被配置为检测开关的操作量的操作量检测装置，以及与操作耦合的操作量指示装置量检测装置，并且被配置为向用户指示检测到的操作量。

102. 发明申请

US20130265030A1 Power Conversion Device, Control Device for Power Conversion Device, and Control Method for Power Conversion Device 有权
标题翻译：电力转换装置，电力转换装置控制装置及电力转换装置的控制方法
公开(公告)号：US20130265030A1
公开(公告)日：2013-10-10
申请号：US13993804
申请日：2011-12-01
申请人： Eisuke Kuroda , Yasuo Sato , Masahiro Watanabe , Taichiro Kawahara
发明人： Eisuke Kuroda , Yasuo Sato , Masahiro Watanabe , Taichiro Kawahara
IPC分类号： H02J3/24
CPC分类号： H02J3/24 , G06Q10/06 , G06Q50/06 , H02J3/383 , H02J3/386 , Y02E10/563 , Y02E10/763 , Y04S10/54
摘要： A command system of a power conditioning system of the present invention receives return pattern information including a time instance and an upper output limit, and issues a command with respect to the upper output limit of the power conditioning system, the return pattern information being for preventing the frequency of an isolated power system, which is calculated by a planning server, from causing a sharp change.
摘要翻译：本发明的功率调节系统的命令系统接收包括时间实例和上限输出限制的返回模式信息，并且发出关于功率调节系统的上限输出的命令，返回模式信息用于防止由计划服务器计算的隔离电力系统的频率引起急剧变化。

103. 发明授权

US08532646B2 Mobile communication system using adaptive multi-antenna 有权
标题翻译：移动通信系统采用自适应多天线
公开(公告)号：US08532646B2
公开(公告)日：2013-09-10
申请号：US12715689
申请日：2010-03-02
申请人： Masahiro Watanabe , Makoto Yoshida , Hiroshi Fujita
发明人： Masahiro Watanabe , Makoto Yoshida , Hiroshi Fujita
IPC分类号： H04W4/00
CPC分类号： H04B7/0413 , H04B7/0613 , H04B7/0689
摘要： A mobile communication system using an adaptive multiantenna realizes improvement of reception characteristics, effective use of the band, and optimization of the throughput in comparison with a system in which application of the same multiantenna communication method is continued irrespective of a variation of the number of radio relay stations. The mobile communication system comprises a radio base station, a radio relay station, and mobile terminal stations for communicating with the radio base station through a radio relay station. The radio base station has a multiantenna and is characterized in that the radio base station judges if there is any variation of the number of radio relay stations when the radio base station carries out transmission through a radio relay station, and the radio base station communicates with the mobile terminal station by switching the multiantenna communication method using the multiantenna depending on the delay time of the feedback signal from the mobile terminal station if there is a variation of the number of radio relay stations.
摘要翻译：与使用同一多天线通信方法的系统相比，使用自适应多天线的移动通信系统实现接收特性的改善，频带的有效使用和吞吐量的优化，而与无线电的数量的变化无关中继站。移动通信系统包括无线电基站，无线电中继站和用于通过无线电中继站与无线电基站进行通信的移动终端站。无线基站具有多天线，其特征在于，无线基站通过无线中继站进行无线基站的发送时，判断无线中继站的数量是否存在变化，无线基站与如果存在无线电中继站的数量的变化，则根据来自移动终端站的反馈信号的延迟时间，通过使用多天线切换多天线通信方法。

104. 发明授权

US08407811B2 Scanning probe microscope and method of observing sample using the same 有权
标题翻译：扫描探针显微镜及使用其的观察样品的方法
公开(公告)号：US08407811B2
公开(公告)日：2013-03-26
申请号：US12712745
申请日：2010-02-25
申请人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Makoto Okai , Motoyuki Hirooka
发明人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Makoto Okai , Motoyuki Hirooka
IPC分类号： G01Q60/24
CPC分类号： G01Q60/22 , G01Q70/12
摘要： In a scanning probe microscope, a nanotube and metal nano-particles are combined together to configure a plasmon-enhanced near-field probe having an optical resolution on the order of nanometers as a measuring probe in which a metal structure is embedded, and this plasmon-enhanced near-field probe is installed in a highly-efficient plasmon exciting unit to repeat approaching to and retracting from each measuring point on a sample with a low contact force, so that optical information and profile information of the surface of the sample are measured with a resolution on the order of nanometers, a high S/N ratio, and high reproducibility without damaging both of the probe and the sample.
摘要翻译：在扫描探针显微镜中，将纳米管和金属纳米粒子组合在一起构成具有纳米数量级的光学分辨率的等离子体增强型近场探针作为嵌入金属结构的测量探针，该等离子体激元增强的近场探头安装在高效的等离子体激元单元中，以低接触力重复接近和缩回样品上的每个测量点，从而测量样品表面的光学信息和轮廓信息分辨率为纳米级，高S / N比，高重现性，不损伤探头和样品。

105. 发明申请

US20120327429A1 Displacement Measurement Method and Apparatus Thereof, Stage Apparatus, and Probe Microscope 失效
标题翻译：位移测量方法及装置，舞台装置和探头显微镜
公开(公告)号：US20120327429A1
公开(公告)日：2012-12-27
申请号：US13605395
申请日：2012-09-06
申请人： Toshihiko Nakata , Masahiro Watanabe , Shuichi Baba , Mineo Nomoto
发明人： Toshihiko Nakata , Masahiro Watanabe , Shuichi Baba , Mineo Nomoto
IPC分类号： G01B11/14
CPC分类号： G01Q20/02 , G01B9/02014 , G01B9/02057 , G01B9/02058 , G01B9/02076 , G01B2290/45 , G01B2290/70 , G01S17/50
摘要： A displacement measurement method, an apparatus thereof, and a probe microscope. which enable stable measure an amount of displacement and a moving distance of an object under measurement with an accuracy of the sub-nanometer order or below without being affected by disturbances such as fluctuations of air and mechanical vibration. A pulsed beam is split into two; one beam is reflected by an object under measurement and then inputted to a delay optical path equivalent to one pulse period; and the other beam is sent through the same delay optical path in the opposite direction up to the object under measurement with a delay of one pulse period, and then reflected by the object under measurement. An optical phase variation caused by the movement of the object under measurement is obtained by subjecting the two pulsed beams to interference.
摘要翻译：位移测量方法，其装置和探针显微镜。这使得能够以亚纳米级或更低的精度稳定地测量被测物体的位移量和移动距离，而不受诸如空气波动和机械振动之类的扰动的影响。脉冲束被分成两部分; 一个光束被测量对象反射，然后输入到等于一个脉冲周期的延迟光路; 并且另一个光束在相对的方向上通过相同的延迟光路被发送到被测物体的一个脉冲周期的延迟，然后被测量对象反射。通过对两束脉冲光束进行干涉而获得由测量对象的运动引起的光学相位变化。

106. 发明申请

US20120325650A1 SPUTTERING TARGET, METHOD FOR MANUFACTURING SPUTTERING TARGET, AND METHOD FOR FORMING THIN FILM 审中-公开
公开(公告)号：US20120325650A1
公开(公告)日：2012-12-27
申请号：US13603502
申请日：2012-09-05
申请人： Shunpei Yamazaki , Tetsunori Maruyama , Yuki Imoto , Hitomi Sato , Masahiro Watanabe , Mitsuo Mashiyama , Kenichi Okazaki , Motoki Nakashima , Takashi Shimazu
发明人： Shunpei Yamazaki , Tetsunori Maruyama , Yuki Imoto , Hitomi Sato , Masahiro Watanabe , Mitsuo Mashiyama , Kenichi Okazaki , Motoki Nakashima , Takashi Shimazu
IPC分类号： C23C14/08 , C23C14/34
CPC分类号： C23C14/08 , B28B11/243 , C04B35/453 , C04B35/64 , C04B2235/3284 , C04B2235/3286 , C04B2235/76 , C23C14/086 , C23C14/3414 , C23C14/345 , H01L21/02565 , H01L21/02631 , H01L29/24 , H01L29/66969 , H01L29/7869
摘要： There have been cases where transistors formed using oxide semiconductors are inferior in reliability to transistors formed using amorphous silicon. Thus, in the present invention, a semiconductor device including a highly reliable transistor formed using an oxide semiconductor is manufactured. An oxide semiconductor film is deposited by a sputtering method, using a sputtering target including an oxide semiconductor having crystallinity, and in which the direction of the c-axis of a crystal is parallel to a normal vector of the top surface of the oxide semiconductor. The target is formed by mixing raw materials so that its composition ratio can obtain a crystal structure.

107. 发明申请

US20120307605A1 Thermally Assisted Magnetic Recording Head Inspection Method and Apparatus 有权
标题翻译：热辅助磁记录头检测方法和装置
公开(公告)号：US20120307605A1
公开(公告)日：2012-12-06
申请号：US13482065
申请日：2012-05-29
申请人： Kaifeng Zhang , Takenori Hirose , Masahiro Watanabe , Shinji Homma , Tsuneo Nakagomi , Teruaki Tokutomi , Toshihiko Nakata , Takehiro Tachizaki
发明人： Kaifeng Zhang , Takenori Hirose , Masahiro Watanabe , Shinji Homma , Tsuneo Nakagomi , Teruaki Tokutomi , Toshihiko Nakata , Takehiro Tachizaki
IPC分类号： G11B13/04
CPC分类号： G11B5/455 , G11B2005/0021
摘要： In a method and an apparatus for inspecting a thermally assisted magnetic recording head element, a specimen is mounted on a table movable in a plane of a scanning probe microscope device, evanescent light is generated from a portion of light emission of evanescent light of the specimen, scattered light of the evanescent light is detected by moving the table in the plane while a cantilever of the scanning probe microscope having a probe is vertically vibrated in the vicinity of a surface of the specimen, and an intensity distribution of the evanescent light emitted from the portion of light emission of evanescent light or a surface profile of the portion of light emission of evanescent light of the specimen is inspected using position information of generation of the evanescent light based on the detected scattered light.
摘要翻译：在用于检查热辅助磁记录头元件的方法和装置中，将样本安装在可在扫描探针显微镜装置的平面中移动的台上，从所述样本的渐逝光的发光部分产生ev逝光通过在平面中移动台来检测ev逝光的散射光，同时具有探针的扫描探针显微镜的悬臂在试样的表面附近垂直振动，并且从from射光发射的ev逝光的强度分布使用基于检测到的散射光的ev逝光的产生的位置信息来检查ev逝光的发光部分或试样的ev逝光的发光部分的表面轮廓。

108. 发明申请

US20120269532A1 Fixing Device And Image Forming Apparatus Incorporating Same 有权
标题翻译：固定装置和图像形成装置相同
公开(公告)号：US20120269532A1
公开(公告)日：2012-10-25
申请号：US13432391
申请日：2012-03-28
申请人： Masahiro Watanabe
发明人： Masahiro Watanabe
IPC分类号： G03G15/20
CPC分类号： G03G15/2032 , G03G15/2017
摘要： A fixing device includes a moving assembly that moves a second rotary body and an airflow guide between a first position and a second position, the first position where the second rotary body contacts a first rotary body to form a fixing nip therebetween through which a recording medium bearing an unfixed toner image is conveyed and a constant first interval between the second rotary body and the airflow guide is smaller than a variable second interval between the second rotary body and an exhaust duct, the second position where the second rotary body is isolated from the first rotary body and the constant first interval between the second rotary body and the airflow guide is equivalent to the variable second interval between the second rotary body and the exhaust duct.
摘要翻译：定影装置包括移动组件，该移动组件使第二旋转体和气流引导件在第一位置和第二位置之间移动，第二旋转体与第一旋转体接触以在其间形成定影夹持部的第一位置，传送未定影的调色剂图像，并且第二旋转体和气流引导件之间的恒定的第一间隔小于第二旋转体与排气管之间的可变的第二间隔，第二位置，第二旋转体与第二旋转体第一旋转体和第二旋转体与气流引导件之间的恒定的第一间隔等于第二旋转体和排气管之间的可变的第二间隔。

109. 发明授权

US08212227B2 Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus 有权
标题翻译：电子束曝光或系统检查或测量装置及其方法和高度检测装置
公开(公告)号：US08212227B2
公开(公告)日：2012-07-03
申请号：US12754181
申请日：2010-04-05
申请人： Masahiro Watanabe , Takashi Hiroi , Maki Tanaka , Hiroyuki Shinada , Yasutsugu Usami
发明人： Masahiro Watanabe , Takashi Hiroi , Maki Tanaka , Hiroyuki Shinada , Yasutsugu Usami
IPC分类号： A61N5/00 , G21G5/00
CPC分类号： H01J37/3174 , B82Y10/00 , B82Y40/00 , H01J37/20 , H01J37/21 , H01J37/222 , H01J37/226 , H01J37/265 , H01J37/28 , H01J37/304 , H01J2237/20235 , H01J2237/20292 , H01J2237/216 , H01J2237/2445 , H01J2237/24578 , H01J2237/2482 , H01J2237/2487 , H01J2237/2814 , H01J2237/2817 , H01J2237/2826 , H01J2237/304 , H01J2237/3175
摘要： An electron beam apparatus equipped with a height detection system includes an electron beam unit emitting an electron beam to the specimen, and a height detection system for detecting height of the specimen which is set on a table. The height detection system includes an illumination system configured to direct first and second beams of light through a mask with a multi-slit pattern to a surface of the specimen at substantially opposite azimuth angles and at substantially equal angles of incidence, first and second detectors which respectively detect first and second multi-slit images of the first and second beams reflected from the specimen and generate output signals thereof, and a device which receives the output signals and generates a comparison signal which is responsive to the height of the specimen. An objective lens of the electron beam unit is controlled in accordance with the comparison signal.
摘要翻译：配备有高度检测系统的电子束装置包括向样本发射电子束的电子束单元和用于检测设置在桌子上的样本的高度的高度检测系统。高度检测系统包括照明系统，其被配置为将第一和第二光束通过具有多狭缝图案的掩模以基本上相反的方位角和基本上相等的入射角度引导到样本的表面，第一和第二检测器分别检测从样本反射的第一和第二光束的第一和第二多个狭缝图像，并产生其输出信号;以及接收输出信号并产生响应于样本的高度的比较信号的装置。根据比较信号控制电子束单元的物镜。

110. 发明申请

US20120118220A1 INSTRUMENT DRIVE DEVICE 审中-公开
标题翻译：仪器驱动装置
公开(公告)号：US20120118220A1
公开(公告)日：2012-05-17
申请号：US13384733
申请日：2010-07-12
申请人： Masahiro Watanabe
发明人： Masahiro Watanabe
IPC分类号： G01D13/22
CPC分类号： G01D11/24 , G01D11/02
摘要： An instrument drive device configured in such a manner that a case body does not receive a load for press-fitting a pointer into a pointer shaft and that liquid, such as a lubricant, within the case body does not leak therefrom. An instrument drive device (1) comprises; a case body (12) provided with a first bearing section (13) and a second bearing section (14) which are through sections; a pointer shaft (6) pivotably supported by the first bearing section (13) and the second bearing section (14) and having a part which protrudes to the outside from the case body (12) and to which a pointer is mounted. The instrument drive device (1) is also provided with a bearing body (16) press-fitted into and held by the second bearing section (14) and restricting the movement of the pointer shaft (6) in the axial direction. The second bearing section (14) is provided with a shaft support section (14a) for pivotably supporting the pointer shaft (6), and also with a holding section (14b) into which the bearing body (16) is press-fitted and held. The diameter of the holding section (14b) is set to be smaller than the diameter of the shaft support section (14a).
摘要翻译：一种仪器驱动装置，其构造成使得壳体不接收用于将指针压配合到指针轴中的负载，并且壳体内的诸如润滑剂的液体不会从其中泄漏。仪器驱动装置（1）包括：设有通过截面的第一轴承部分（13）和第二轴承部分（14）的壳体（12）由第一轴承部分（13）和第二轴承部分（14）可枢转地支撑并且具有从壳体（12）向外部突出并且安装有指针的部分的指针轴（6）。仪器驱动装置（1）还设置有压配合并由第二轴承部分（14）保持的轴承体（16）并限制指针轴（6）在轴向方向上的移动。第二轴承部分（14）设置有用于可枢转地支撑指针轴（6）的轴支撑部分（14a），并且还具有保持部分（14b），轴承体（16）被压配合并保持在该保持部分中。保持部（14b）的直径被设定为小于轴支撑部（14a）的直径。

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