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    • 102. 发明申请
    • Page-buffer and non-volatile semiconductor memory including page buffer
    • 页缓冲器和非易失性半导体存储器,包括页缓冲器
    • US20060120172A1
    • 2006-06-08
    • US11228189
    • 2005-09-19
    • Sung-Soo LeeYoung-Ho LimHyun-Chul ChoDong-Hyuk Chae
    • Sung-Soo LeeYoung-Ho LimHyun-Chul ChoDong-Hyuk Chae
    • G11C7/10
    • G11C16/0483G11C16/26
    • In one aspect, a non-volatile memory device is provided which is operable in a programming mode and a read mode. The memory device includes a memory cell array which includes a plurality of non-volatile memory cells, a plurality of word lines, and a plurality of bit lines. The memory device further includes an internal data output line for outputting data read from the bit lines of the memory array, and a page buffer operatively connected between a bit line of the memory cell array and the internal data output line. The page buffer includes a sense node which is selectively connected to the bit line, a latch circuit having a latch node which is selectively connected to the sense node, a latch input path which sets a logic voltage of the latch node in the programming mode and the read mode, and a latch output path which is separate from the latch input path and which sets as logic voltage of the internal date output line according to the logic voltage of the latch node.
    • 在一个方面,提供一种可在编程模式和读取模式下操作的非易失性存储器件。 存储器件包括存储单元阵列,其包括多个非易失性存储器单元,多个字线和多个位线。 存储器件还包括用于输出从存储器阵列的位线读取的数据的内部数据输出线以及可操作地连接在存储单元阵列的位线和内部数据输出线之间的页缓冲器。 页面缓冲器包括选择性地连接到位线的感测节点,具有选择性地连接到感测节点的锁存节点的锁存电路,将锁存节点的逻辑电压设置为编程模式的锁存器输入路径,以及 读取模式和与锁存器输入路径分离并根据锁存节点的逻辑电压设置为内部日期输出线的逻辑电压的锁存器输出路径。
    • 104. 发明授权
    • Molding apparatus for molding semiconductor devices in which the mold is automatically treated with a releasing agent
    • 用于模制用脱模剂自动处理的半导体器件的成型装置
    • US06971863B2
    • 2005-12-06
    • US10320485
    • 2002-12-17
    • Kyung-soo ParkTae-hyuk KimHoon ChangSung-soo Lee
    • Kyung-soo ParkTae-hyuk KimHoon ChangSung-soo Lee
    • H01L21/56B29C33/58B29C45/14B29C70/72
    • B29C33/58H01L21/565H01L2924/0002H01L2924/00
    • A molding apparatus for molding semiconductor devices using a molding compound in which a mold is automatically treated with a mold releasing agent is provided. A lead frame strip in-magazine part and a tablet loading part are designed so that dummy lead frame strips and releasing tablets used in a mold releasing agent treatment process are automatically supplied to the molding apparatus in a mold releasing agent treatment mode or a mold cleaning mode. After the mold releasing agent treatment mode or mold cleaning mode is complete, the molding apparatus is switched back to a normal molding process and normal lead frame strips and molding compound tablets are to the mold part. In addition, a pick-up part and a stack magazine part are designed to distinguish by-products generated during the mold releasing agent treatment process from normally molded products by switching from a normal molding process to either a mold releasing agent treatment process or a mold cleaning process.
    • 提供了一种用于模制使用模塑料的半导体器件的成型设备,其中模具被脱模剂自动处理。 引线框条盒内部片剂和片剂装载部分被设计成使得在脱模剂处理过程中使用的虚拟引线框带和释放片在脱模剂处理模式或模具清洁中被自动提供给模制设备 模式。 在脱模剂处理模式或模具清洁模式完成之后,将成型装置切换回正常的成型工艺,并将正常的引线框条和模塑复合片放置在模具部分。 此外,拾取部分和堆叠盒部分被设计成将脱模剂处理过程中产生的副产物与正常模制产品相区分,从正常模塑过程切换到脱模剂处理工艺或模具 清洗过程。
    • 105. 发明授权
    • Semiconductor memory device with a flexible redundancy scheme
    • 具有灵活冗余方案的半导体存储器件
    • US06956769B2
    • 2005-10-18
    • US10373410
    • 2003-02-24
    • Sung-Soo Lee
    • Sung-Soo Lee
    • G11C16/04G06F12/00G11C16/06G11C29/00G11C29/04
    • G11C29/88G11C29/808G11C29/82
    • A semiconductor memory device including an array with a first memory cell block having redundancy blocks and a second memory cell block having normal blocks. A redundancy block in the first memory cell block is substituted for a defective normal block in the second memory cell block. The substitution is performed by a block selection circuit. When substitution is required, the block selection circuit selects from among the first memory cell blocks in inverse order, beginning with the first memory cell block having the highest address. First memory cell blocks that are not substituted for defective cell blocks are used as normal memory cell blocks by the block selection circuit.
    • 一种半导体存储器件,包括具有具有冗余块的第一存储单元块的阵列和具有正常块的第二存储单元块。 第一存储单元块中的冗余块代替第二存储器单元块中的有缺陷的正常块。 替代由块选择电路执行。 当需要替换时,块选择电路从第一存储单元块中以与地址最高的第一存储器单元块相反的顺序选择。 通过块选择电路将不替代缺陷单元块的第一存储单元块用作正常存储单元块。
    • 109. 发明授权
    • Data loading circuit for partial program of nonvolatile semiconductor
memory
    • 非易失性半导体存储器部分程序数据加载电路
    • US5712818A
    • 1998-01-27
    • US537615
    • 1995-10-02
    • Sung-Soo LeeJin-Ki Kim
    • Sung-Soo LeeJin-Ki Kim
    • G11C17/00G11C16/02G11C16/06G11C16/10G11C16/04
    • G11C16/10
    • The present invention provides a nonvolatile semiconductor memory comprising a plurality of floating gate-type memory cells arranged in a matrix form of rows and columns; a plurality of bit lines connected the memory cells arranged in the direction of said column; a plurality of data lines respectively connected to the plurality of bit lines; a plurality of latch circuits respectively connected to said plurality of data lines; a preset unit for presetting the plurality of latch circuits to predetermined logic states during a presetting operation; a unit for loading data to selected ones of the plurality of latch circuits through data input/output terminals during a data loading operation after the presetting operation; and unit for programming to the memory cells arranged and erased in one selected row, data loaded to the latch circuits of the selected portion and data presetted to remaining latch circuits except for the latch circuits of the selected portion during a programming operation after the data loading operation.
    • 本发明提供了一种非易失性半导体存储器,包括以行和列的矩阵形式布置的多个浮动栅型存储单元; 连接沿所述列方向布置的存储单元的多个位线; 分别连接到所述多个位线的多条数据线; 分别连接到所述多条数据线的多个锁存电路; 预置单元,用于在预设操作期间将所述多个锁存电路预置到预定的逻辑状态; 用于在预置操作之后的数据加载操作期间通过数据输入/输出端将数据加载到多个锁存电路中的选定数据的单元; 以及用于编程的单元,用于在一个选定行中被布置和擦除的存储器单元,加载到所选部分的锁存电路的数据以及在数据加载之后的编程操作期间被预设给除了所选部分的锁存电路之外的剩余锁存电路的数据 操作。