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    • 95. 发明申请
    • Circuit and Method for a Sense Amplifier with Instantaneous Pull Up/Pull Down Sensing
    • 一种具有瞬时上拉/下拉传感的读出放大器的电路和方法
    • US20090251975A1
    • 2009-10-08
    • US12062320
    • 2008-04-03
    • Shine ChungJonathan Hung
    • Shine ChungJonathan Hung
    • G11C7/06
    • G11C11/4091G11C7/062
    • A circuit and method for a sense amplifier for sensing the charge stored when a select signal couples a memory cell to the sense amplifier. A pull up voltage and a pull down voltage are instantaneously supplied to the sense amplifier to sense the small signal differential input on the complementary bit lines and to simultaneously restore the value stored in the memory cell. A differential output signal generator circuit is provided to instantaneously supply the pull up and pull down voltages. In another preferred embodiment the signal generator provides the pull up and pull down voltages at a first level and subsequently increases the pull up voltage to a voltage greater than the positive supply voltage and decreases the pull down voltage. A method of sensing is disclosed wherein the sense and restore actions are performed instantaneously to provide memory cell sensing with greater tolerance of device mismatches.
    • 一种用于感测放大器的电路和方法,用于感测当选择信号将存储器单元耦合到感测放大器时所存储的电荷。 立即将上拉电压和下拉电压提供给读出放大器以感测互补位线上的小信号差分输入,并同时恢复存储在存储单元中的值。 提供差分输出信号发生器电路以瞬时提供上拉和下拉电压。 在另一优选实施例中,信号发生器在第一电平上提供上拉和下拉电压,随后将上拉电压增加到大于正电源电压的电压并降低下拉电压。 公开了一种感测方法,其中感测和恢复动作被立即执行以提供具有更大的设备不匹配容限的存储器单元感测。
    • 96. 发明授权
    • Memory word lines with interlaced metal layers
    • 记忆字线与交错金属层
    • US07592649B2
    • 2009-09-22
    • US12100866
    • 2008-04-10
    • Shine ChungCheng-Hsien Hung
    • Shine ChungCheng-Hsien Hung
    • H01L29/00
    • H01L27/105H01L27/10894
    • A memory device with improved word line structure is disclosed. The memory device includes a plurality of polysilicon strips substantially parallel to each other on the substrate, the plurality of polysilicon strips arranged in two interleaved groups of a first group and a second group. The memory device further includes a first layer of conductive strips forming a plurality of bit lines and a second layer of meal strips, the second layer of conductive strips overlying the polysilicon strips and coupled to the first group of polysilicon strips. In addition, the memory device includes a third layer of conductive strips forming one or more power line, and a fourth layer of metal strips, the fourth layer of conductive strips overlying the second layer of conductive strips and coupled to the second group of polysilicon strips to form a new word line structure having a low resistance.
    • 公开了一种具有改进的字线结构的存储器件。 存储器件包括在衬底上基本上彼此平行的多个多晶硅条,多个多晶硅条布置在第一组和第二组的两个交替组中。 存储器件还包括形成多个位线的第一层导电条和第二层餐条,第二层导电条覆盖在多晶硅条上并耦合到第一组多晶硅条。 此外,存储器件包括形成一个或多个电源线的第三层导电条和第四层金属条,第四层导电条覆盖在第二层导电条上,并连接到第二组多晶硅条 以形成具有低电阻的新字线结构。
    • 99. 发明申请
    • SYSTEM TO PROTECT ELECTRICAL FUSES
    • 保护电熔丝的系统
    • US20070279816A1
    • 2007-12-06
    • US11839966
    • 2007-08-16
    • Shine ChungJiann-Tseng HuangShao-Chang Huang
    • Shine ChungJiann-Tseng HuangShao-Chang Huang
    • H02H9/04H03K19/003
    • G11C17/16G11C17/18
    • A method and system is disclosed for protecting electrical fuse circuitry. A electrical fuse circuit with electrostatic discharge (ESD) protection has at least one electrical fuse, a programming device coupled in series with the electrical fuse having at least a transistor for receiving a control signal for controlling a programming current flowing through the electrical fuse, a voltage source coupled to the fuse and the programming device for providing the programming current, and a protection module coupled to a gate of the transistor at its first end for reducing charges accumulated at the gate of the transistor due to electric static charges arriving at the voltage source, thereby preventing the programming device from accidentally programming the fuse.
    • 公开了一种用于保护电熔丝电路的方法和系统。 具有静电放电(ESD)保护的电熔丝电路具有至少一个电熔丝,与至少一晶体管串联耦合的编程装置,用于接收用于控制流经电熔丝的编程电流的控制信号, 电压源耦合到熔丝和用于提供编程电流的编程装置,以及保护模块,其在其第一端耦合到晶体管的栅极,以减少由于到达电压的电静电而在晶体管的栅极处累积的电荷 源,从而防止编程设备意外编程保险丝。