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    • 3. 发明授权
    • Semiconductor component with MIM capacitor
    • 具有MIM电容器的半导体元件
    • US07659602B2
    • 2010-02-09
    • US12131728
    • 2008-06-02
    • Stefan TegenKlaus MuemmlerPeter BaarsOdo Wunnicke
    • Stefan TegenKlaus MuemmlerPeter BaarsOdo Wunnicke
    • H01L49/00
    • H01L28/90H01L28/86
    • A structure and method of forming a capacitor is described. In one embodiment, the capacitor includes a cylindrical first electrode having an inner portion bounded by a bottom surface and an inner sidewall surface, the first electrode further having an outer sidewall, the first electrode being formed from a conductive material. An insulating fill material is disposed within the inner portion of the first electrode. A capacitor dielectric is disposed adjacent at least a portion of the outer sidewall of the first electrode. A second electrode is disposed adjacent the outer sidewall of the first electrode and separated therefrom by the capacitor dielectric. The second electrode is not formed within the inner portion of the first electrode.
    • 描述形成电容器的结构和方法。 在一个实施例中,电容器包括圆柱形第一电极,其具有由底表面和内侧壁表面限定的内部部分,第一电极还具有外侧壁,第一电极由导电材料形成。 绝缘填充材料设置在第一电极的内部部分内。 电容器电介质设置在第一电极的外侧壁的至少一部分附近。 第二电极邻近第一电极的外侧壁设置,并由电容器电介质分离。 第二电极不形成在第一电极的内部。
    • 8. 发明申请
    • Method of manufacturing a field effect transistor device with recessed channel and corner gate device
    • 具有凹槽和角栅装置的场效应晶体管器件的制造方法
    • US20070155119A1
    • 2007-07-05
    • US11321450
    • 2005-12-30
    • Klaus MuemmlerPeter BaarsStefan Tegen
    • Klaus MuemmlerPeter BaarsStefan Tegen
    • H01L21/76
    • H01L29/66621H01L27/10876H01L29/4236H01L29/66545H01L29/66553
    • Fabrication of recessed channel array transistors (RCAT) with a corner gate device includes forming pockets between a semiconductor fin that includes a gate groove and neighboring shallow trench isolations that extend along longs sides of the semiconductor fin. A protection liner covers the semiconductor fin and the trench isolations in a bottom portion of the gate groove and the pockets. An insulator collar is formed in the exposed upper sections of the gate groove and the pockets, wherein a lower edge of the insulator collar corresponds to a lower edge of source/drain regions formed within the semiconductor fin. The protection liner is removed. The bottom portion of the gate groove and the pockets are covered with a gate dielectric and a buried gate conductor layer. The protection liner avoids residuals of polycrystalline silicon between the active area in the semiconductor fin and the insulator collar.
    • 具有拐角栅极器件的凹槽通道阵列晶体管(RCAT)的制造包括在包括栅极沟槽的半导体鳍片之间形成凹穴以及沿着半导体鳍片的长边延伸的相邻浅沟槽隔离件。 保护衬套覆盖半导体鳍片和栅极沟槽和凹穴的底部中的沟槽隔离。 绝缘体套环形成在门槽和凹穴的暴露的上部中,其中绝缘体环的下边缘对应于形成在半导体鳍内的源/漏区的下边缘。 保护衬垫被取下。 栅极槽和凹穴的底部被栅极电介质和掩埋栅极导体层覆盖。 保护衬垫避免了半导体鳍片的有源区域和绝缘体套环之间的多晶硅残留。