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    • 3. 发明授权
    • X-ray exposure method, x-ray exposure apparatus, fine structure and semiconductor device
    • X射线曝光方法,x射线曝光装置,精细结构和半导体装置
    • US06735275B2
    • 2004-05-11
    • US10140066
    • 2002-05-08
    • Kenji ItogaToyoki Kitayama
    • Kenji ItogaToyoki Kitayama
    • H01L2130
    • G03F7/70141G03F7/702G21K1/10
    • An X-ray exposure method and an X-ray exposure apparatus using exposure X-rays having short wavelengths for formation of a fine pattern in X-ray lithography and suppressing fogging due to secondary electrons from a substrate bearing a resin film. The X-ray exposure method includes forming, by coating, a resist film on a substrate made of a material having an absorption-edge in or near an illumination wavelength range; and illuminating the resist film with X-rays having a wavelength range, including the absorption-edge wavelength, through an X-ray mask. The X-ray intensity is reduced in the wavelength range of an absorption spectrum including the absorption-edge of the material of the substrate in an optical path leading to the substrate.
    • X射线曝光方法和X射线曝光装置,其使用在X射线光刻中形成微细图案的具有短波长的曝光X射线,并抑制由于带有树脂膜的基板引起的二次电子的起雾。 X射线曝光方法包括通过在由照射波长范围内或附近具有吸收边缘的材料制成的基板上涂布抗蚀剂膜, 并通过X射线掩模对具有包括吸收边缘波长在内的波长范围的X射线照射抗蚀剂膜。 在包括通向基板的光路中的基板的材料的吸收边缘的吸收光谱的波长范围内,X射线强度降低。
    • 4. 发明授权
    • Planar light source device and method of manufacturing divided prism mold
    • 平面光源装置及分割棱镜模具的制造方法
    • US08348490B2
    • 2013-01-08
    • US12919382
    • 2009-02-19
    • Akimasa YuukiKenji ItogaNaoko IwasakiSuguru Nagae
    • Akimasa YuukiKenji ItogaNaoko IwasakiSuguru Nagae
    • F21V7/04
    • G02B6/0036G02B6/0038G02B6/0053G02F1/133615
    • A planar light source device capable of increasing light use efficiency and preventing color breakup without using any reflection polarizing plate nor performing multiple reflection. The planar light source device includes a planar light guide plate, light sources arranged as to be opposed to end surfaces of the light guide plate on its both sides, and a divided prism formed in a back surface inside the light guide plate and that reflects light incident upon the light guide plate from the light sources toward a front surface side of the light guide plate. The divided prism includes a prism portion and a dividing portion both of which have a width equal to or less than the wavelength of light from the light sources and is formed with the prism portion and the dividing portion alternately repeated along a direction parallel to the end surfaces of the light guide plate which are opposed to the light sources.
    • 一种平面光源装置,能够提高光的使用效率,防止在不使用反射偏光板的情况下分色,也不进行多次反射。 平面光源装置包括平面导光板,被布置成与导光板的两侧的端面相对的光源和形成在导光板内部的背面的分割棱镜,并且反射光 在导光板上从光源入射到导光板的前表面侧。 分割棱镜包括棱镜部分和分隔部分,两者均具有等于或小于来自光源的光的波长的宽度,并且形成有棱镜部分和分割部分沿着平行于端部的方向交替重复 导光板的与光源相对的表面。
    • 5. 发明授权
    • Levitator with rotation control
    • 悬臂旋转控制
    • US5155651A
    • 1992-10-13
    • US815837
    • 1991-12-30
    • Shinichi YodaKenji ItogaSouichiro OkudaKazunori Ikegami
    • Shinichi YodaKenji ItogaSouichiro OkudaKazunori Ikegami
    • B64G1/22G05D3/12
    • B64G1/22G05D3/12
    • A levitator which is mounted on a space station; for example, for use in material science experiments in space. The levitator has a position detector for detecting the position of a sample, a variable power supply whose output voltage varies in accordance with the signal output from the position detector, a pair of planar electrodes connected to two ends, respectively, of the variable power supply and disposed in opposing relation to each other, and a ring electrode disposed so as to surround each of the planar electrodes and to which is applied a higher voltage than that applied to the corresponding planar electrode from a DC power supply, thereby holding the sample stationary at a desired position by means of the planar and ring electrodes. The levitator further has a means for rotating the sample being held stationary. Thus, it is possible to rotate the sample in a controlled manner and hence possible to carry out an experiment in which the sample is uniformly heated in a microgravity environment.
    • 安装在空间站上的升降机; 例如,用于空间材料科学实验。 升降器具有位置检测器,用于检测样品的位置,输出电压根据从位置检测器输出的信号而变化的可变电源,连接到可变电源的两端的一对平面电极 并且彼此相对设置,并且设置成围绕每个平面电极设置的环形电极,并且施加比从直流电源施加到相应的平面电极的电压更高的电压,从而保持样品静止 通过平面和环形电极在期望的位置。 升降器还具有用于使保持静止的样品旋转的装置。 因此,可以以受控的方式旋转样品,因此可以进行在微重力环境中样品被均匀加热的实验。
    • 6. 发明申请
    • FLAT SURFACE LIGHT SOURCE DEVICE AND METHOD FOR MANUFACTURING METALLIC MOLD FOR DIVIDING PRISM
    • 平面光源装置及制造金属模具的分类方法
    • US20110002142A1
    • 2011-01-06
    • US12919382
    • 2009-02-19
    • Akimasa YuukiKenji ItogaNaoko IwasakiSuguru Nagae
    • Akimasa YuukiKenji ItogaNaoko IwasakiSuguru Nagae
    • F21V7/22B29D11/00
    • G02B6/0036G02B6/0038G02B6/0053G02F1/133615
    • A planar light source device capable of increasing light use efficiency and preventing color breakup without using any reflection polarizing plate nor performing multiple reflection. The planar light source device includes a planar light guide plate, light sources arranged as to be opposed to end surfaces of the light guide plate on its both sides, and a divided prism formed in a back surface inside the light guide plate and that reflects light incident upon the light guide plate from the light sources toward a front surface side of the light guide plate. The divided prism includes a prism portion and a dividing portion both of which have a width equal to or less than the wavelength of light from the light sources and is formed with the prism portion and the dividing portion alternately repeated along a direction parallel to the end surfaces of the light guide plate which are opposed to the light sources.
    • 一种平面光源装置,能够提高光的使用效率,防止在不使用反射偏光板的情况下分色,也不进行多次反射。 平面光源装置包括平面导光板,被布置成与导光板的两侧的端面相对的光源和形成在导光板内部的背面的分割棱镜,并且反射光 在导光板上从光源入射到导光板的前表面侧。 分割棱镜包括棱镜部分和分隔部分,两者均具有等于或小于来自光源的光的波长的宽度,并且形成有棱镜部分和分割部分沿着平行于端部的方向交替重复 导光板的与光源相对的表面。
    • 8. 发明授权
    • Dust particle inspection apparatus, and device manufacturing method using the same
    • 粉尘检查装置及其制造方法
    • US06521889B1
    • 2003-02-18
    • US09689860
    • 2000-10-13
    • Hideki InaKenji Itoga
    • Hideki InaKenji Itoga
    • G01N2189
    • G01N21/88
    • A dust particle inspection apparatus for detecting size information and height information of a dust particle on the surface of a mask or a wafer, as well as a device manufacturing method using the same, are disclosed. Light from a light source is directed to a predetermined surface to be inspected, and reflection light from a dust particle on the predetermined surface is detected by a detecting system. An output signal of the detecting system is processed by a signal processing system, so that size information of the dust particle along the predetermined surface and height information thereof with respect to a direction of a normal to the predetermined surface are detected.
    • 公开了一种用于检测掩模或晶片表面上的灰尘颗粒的尺寸信息和高度信息的灰尘颗粒检查装置及其装置的制造方法。 来自光源的光被引导到要检查的预定表面,并且通过检测系统检测来自预定表面上的灰尘颗粒的反射光。 检测系统的输出信号由信号处理系统处理,从而检测出沿着预定表面的灰尘颗粒的尺寸信息和相对于预定表面的法线方向的高度信息。