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    • 2. 发明申请
    • INSPECTION METHOD OF HONEYCOMB STRUCTURE
    • 蜂窝结构检测方法
    • US20100238284A1
    • 2010-09-23
    • US12718240
    • 2010-03-05
    • Takayoshi AKAOAkihiro MIZUTANIKensuke TANAKA
    • Takayoshi AKAOAkihiro MIZUTANIKensuke TANAKA
    • H04N7/18
    • G01B11/26G01N21/94G01N21/95692
    • An inspection method of a honeycomb structure comprises the steps of illuminating one end face 15 of a honeycomb structure 11 as an inspection target by a light source 1; condensing, by a condensing lens 2 as a lens having an angle of view, light which is emitted from the light source 1 to the one end face 15, passed through cells of the honeycomb structure 11 and radiated from the other end face 16; receiving the light condensed on the condensing lens 2 by a camera 3; subjecting the light received by the camera 3 to image processing by an image processor 4, thereby specifying the radiated position of the light on the other end face 16; and calculating the tilt of the cells 14 of the honeycomb structure 11 from the radiated position of the light on the other end face 16, and the direction of the tilt.
    • 蜂窝结构的检查方法包括以下步骤:通过光源1照射作为检查对象的蜂窝结构体11的一个端面15; 通过聚光透镜2作为具有视角的透镜,从光源1发射到一个端面15的光通过蜂窝结构体11的单元并从另一端面16辐射; 通过相机3接收在聚光透镜2上聚集的光; 对由照相机3接收的光进行图像处理器4的图像处理,从而指定另一端面16上的光的照射位置; 并且从另一端面16上的光的辐射位置和倾斜方向计算蜂窝结构体11的单元14的倾斜度。
    • 5. 发明申请
    • Electron beam irradiating apparatus
    • 电子束照射装置
    • US20070040130A1
    • 2007-02-22
    • US11385483
    • 2006-03-21
    • Tsutomu NanatakiIwao OhwadaYuki BesshoTakayoshi Akao
    • Tsutomu NanatakiIwao OhwadaYuki BesshoTakayoshi Akao
    • A61N5/00
    • G21K5/04H01J37/317H01L21/67005
    • An electron beam irradiating apparatus includes a chamber being kept under vacuum, and housing a planar electron emitting element and a positioning unit and an object to be irradiated is directly irradiated with an electron beam emitted from the element. The planar electron emitting element includes: an emitter portion composed of a dielectric material; and a first electrode and a second electrode applied with a driving voltage for emitting electrons, and the first electrode is formed on a first surface of the emitter portion and has a plurality of through-holes where the emitter portion is exposed, a surface of the first electrode facing to the emitter portion around the through-holes is separated from the emitter portion, and the electron beam is emitted from the first surface of the emitter portion through the through-holes.
    • 电子束照射装置包括保持在真空下的室,并容纳平面电子发射元件和定位单元,并且被照射物体直接用从元件发射的电子束照射。 平面电子发射元件包括:由电介质材料构成的发射极部分; 以及施加有用于发射电子的驱动电压的第一电极和第二电极,并且所述第一电极形成在所述发射极部分的第一表面上,并且具有多个通过所述发射极部分露出的通孔, 面向通孔周围的发射极部分的第一电极与发射极部分分离,并且电子束通过通孔从发射器部分的第一表面发射。