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    • 2. 发明授权
    • Systems and methods for pipelined analog to digital conversion
    • 用于流水线模数转换的系统和方法
    • US07656340B2
    • 2010-02-02
    • US12134523
    • 2008-06-06
    • Sergey GribokChoshu ItoWilliam LohErik Chmelar
    • Sergey GribokChoshu ItoWilliam LohErik Chmelar
    • H03M1/38
    • H03M1/182H03M1/002H03M1/004H03M1/361H03M1/367
    • Various embodiments of the present invention provide systems and methods for analog to digital conversion. For example, a pipelined analog to digital converter is disclosed that includes two or more comparators. A first of the comparators is operable to compare an analog input to a first voltage reference upon assertion of the first clock, and a second of the comparators is operable to compare the analog input to a second voltage reference upon assertion of the second clock. The pipelined analog to digital converters further include a multiplexer tree with at least a first tier multiplexer and a second tier multiplexer. The first tier multiplexer receives an output of the first comparator and an output of the second comparator, and the second tier multiplexer receives an output derived from the first tier multiplexer. The second tier multiplexer provides an output bit. A bit enable set is used as a selector input to the first tier multiplexer and the second tier multiplexer, and the bit enable set includes one or more output bits from preceding bit periods.
    • 本发明的各种实施例提供了用于模数转换的系统和方法。 例如,公开了一种流水线模数转换器,其包括两个或更多个比较器。 比较器中的第一个可操作以在断言第一时钟时将模拟输入与第一参考电压进行比较,并且第二比较器可用于在断言第二时钟时将模拟输入与第二参考电压进行比较。 流水线模数转换器还包括具有至少第一层多路复用器和第二层多路复用器的复用器树。 第一层多路复用器接收第一比较器的输出和第二比较器的输出,并且第二层多路复用器接收从第一层多路复用器导出的输出。 第二层复用器提供输出位。 位使能集合用作对第一层多路复用器和第二层多路复用器的选择器输入,并且位使能集包括来自先前位周期的一个或多个输出位。
    • 4. 发明申请
    • RRAM memory error emulation
    • RRAM内存错误仿真
    • US20070094534A1
    • 2007-04-26
    • US11257470
    • 2005-10-24
    • Alexander AndreevVojislav VukovicSergey Gribok
    • Alexander AndreevVojislav VukovicSergey Gribok
    • G06F11/00
    • G06F11/261
    • A method for verifying the functionality of a repair system of configurable memory that functions to replace memory that fails predetermined tests with unused memory that passes the tests. The method includes the steps of providing a matrix comprising a plurality of reconfigurable memory blocks, providing an emulation system, generating a substitute memory block for each of the reconfigurable memory blocks utilizing the emulation system computing platform, providing a memory design that incorporates the substitute memory blocks, generating files for mapping errors into the reconfigurable memory blocks and providing a control file associated with the emulation system, and operating the emulation system to emulate the memory design.
    • 一种用于验证可配置存储器的修复系统的功能的方法,其用于替换通过测试的未使用存储器进行预定测试的存储器。 该方法包括以下步骤:提供包括多个可重构存储器块的矩阵,提供仿真系统,利用仿真系统计算平台为每个可重构存储器块生成替代存储器块,提供将替代存储器 生成用于将错误映射到可重构存储器块中的文件,并提供与仿真系统相关联的控制文件,以及操作仿真系统以模拟存储器设计。
    • 9. 发明授权
    • Built in self test transport controller architecture
    • 内置自检传输控制器架构
    • US07546505B2
    • 2009-06-09
    • US11557513
    • 2006-11-08
    • Sergey GribokAlexander AndreevIvan Pavisic
    • Sergey GribokAlexander AndreevIvan Pavisic
    • G01R31/28G11C29/00
    • G11C29/16G11C29/34G11C2029/0401G11C2029/1204G11C2029/2602
    • A built in self test circuit in a memory matrix. Memory cells within the matrix are disposed into columns. The circuit has only one memory test controller, adapted to initiate commands and receive results. Transport controllers are paired with the columns of memory cells. The controllers receive commands from the memory test controller, test memory cells within the column, receive test results, and provide the results to the memory test controller. The transport controllers operate in three modes. A production testing mode tests the memory cells in different columns, accumulating the results for a given column with the controller associated with the column. A production testing mode retrieves the results from the controllers. A diagnostic testing mode tests memory cells within one column, while retrieving results for the column.
    • 内存自检电路在内存矩阵中。 矩阵内的存储单元被排列成列。 该电路只有一个内存测试控制器,适用于启动命令并接收结果。 传输控制器与存储单元的列配对。 控制器从存储器测试控制器接收命令,测试列内的测试存储单元,接收测试结果,并将结果提供给存储器测试控制器。 运输控制器以三种模式运行。 生产测试模式测试不同列中的存储单元,使用与列相关联的控制器累积给定列的结果。 生产测试模式从控制器检索结果。 诊断测试模式测试一列内的存储单元,同时检索列的结果。
    • 10. 发明申请
    • Master controller architecture
    • 主控制器架构
    • US20060129874A1
    • 2006-06-15
    • US10999720
    • 2004-11-30
    • Alexandre AndreevSergey GribokAnatoli Bolotov
    • Alexandre AndreevSergey GribokAnatoli Bolotov
    • G06F11/00
    • G11C29/16G11C29/44G11C29/4401G11C29/72
    • A master controller for an RRAM subsystem. An interface communicates with at least one RRAM controller. A main control unit selects and implements test and repair operations on the RRAM subsystem through the RRAM controller. A timer determines a maximum number of test and repair operations that can be implemented within a given time. Thus, a master controller is included in the RRAM subsystem. The master controller has a relatively simple interface, and performs test and repair operations on the RRAM subsystem. The advantages of using the master controller include an elimination of additional test ports, simplification of the process of preparing the test vectors for RRAM testing, and the master controller is able to accumulate test results and initiate repairs based on those results. In this manner, the RRAM subsystem has a self-repair functionality.
    • 用于RRAM子系统的主控制器。 接口与至少一个RRAM控制器通信。 主控单元通过RRAM控制器对RRAM子系统进行测试和修复操作。 定时器确定在给定时间内可以实现的最大测试和修复操作数。 因此,主控制器包含在RRAM子系统中。 主控制器具有相对简单的接口,并对RRAM子系统执行测试和修复操作。 使用主控制器的优点包括消除额外的测试端口,简化了用于RRAM测试的测试向量的准备过程,并且主控制器能够根据这些结果积累测试结果并启动修复。 以这种方式,RRAM子系统具有自修复功能。