基本信息:
- 专利标题： 전자 부품들을 테스트하기 위한 네스트
- 专利标题（英）：Nest for testing electrical components
- 专利标题（中）：用于测试电气元件
- 申请号：KR1020147016519 申请日：2012-12-05
- 公开(公告)号：KR1020140134263A 公开(公告)日：2014-11-21
- 发明人： 비에노실뱅 , 비베흐쥬필립 , 스카르펠라마시모 , 로아필립
- 申请人： 이스메카 세미컨덕터 홀딩 에스.아.
- 申请人地址： 스위스 라 쇼-드-퐁 뤼 드 렐베띠 *** (우편번호 : 씨에이치-****)
- 专利权人： 이스메카 세미컨덕터 홀딩 에스.아.
- 当前专利权人： 이스메카 세미컨덕터 홀딩 에스.아.
- 当前专利权人地址： 스위스 라 쇼-드-퐁 뤼 드 렐베띠 *** (우편번호 : 씨에이치-****)
- 代理人： 방해철; 김용인
- 优先权： CH00186/12 2012-02-10
- 国际申请： PCT/EP2012/074397 2012-12-05
- 国际公布： WO2013117265 2013-08-15
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R1/04 ; G01R31/26
Nested according to the invention can receive at least a portion of the fixing portion 3 and a nest (1) including a moving part (5), the fixing part 3 and the moving part (5) and electronic components (25) pocket being configured to cooperate to define a 7 that, the moving part (5) includes first and second can be moved between a position, a pocket in one location (7) is to be able to be opened for electronic components at least at least a portion is fixed in the pocket, the nest (1) in some of pockets movable in (7), and the pocket in the second position 7 will be closed the electronic component 25 located in a pocket in the second and further comprising a biasing means (9) arranged so as to bias the moving part (5) towards the location. The step of moving method of fixing a component to the nest according to the invention, against the force of the nest, and deflecting means portion moved to the first position; The method comprising positioning the at least a portion of the component in the pocket; And a mobile unit by using the biasing force of the biasing means moves to a second position adjacent to the added step of moving the coupling part and the friction part in order to secure the component in the pocket; It includes.
公开/授权文献:
- KR101885686B1 전자 부품들을 테스트하기 위한 네스트 公开/授权日：2018-09-11
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |
| --------G01R31/28 | .电路的测试，例如用信号故障寻测器 |