基本信息:
- 专利标题： 시뮬레이션 발광 다이오드 광원 혼합 광 상태 검출 방법
- 专利标题（英）：Method of inspecting mixed light state of simulation light emitting diode light source
- 专利标题（中）：模拟发光二极管光源的混合光状态检测方法
- 申请号：KR1020110009424 申请日：2011-01-31
- 公开(公告)号：KR1020120073076A 公开(公告)日：2012-07-04
- 发明人： 웽이룽 , 양흐신-타이 , 리밍-한
- 申请人： 크로마 에이티이 인코포레이티드
- 申请人地址： ** Hwa-Ya * Rd., Hwa-Ya Technical Park, Kuei-Shan Hsiang, Taoyuan Hsien, Taiwan, R.O.C.
- 专利权人： 크로마 에이티이 인코포레이티드
- 当前专利权人： 크로마 에이티이 인코포레이티드
- 当前专利权人地址： ** Hwa-Ya * Rd., Hwa-Ya Technical Park, Kuei-Shan Hsiang, Taoyuan Hsien, Taiwan, R.O.C.
- 代理人： 김경희
- 优先权： TW099145871 2010-12-24
- 主分类号： G01J3/443
- IPC分类号： G01J3/443 ; G01J1/58
摘要：
PURPOSE: A method for detecting a mixed light state of a light emitting diode light source simulation is provided to primarily detect a plurality of light bars and a LED unit including the same without considering of a light uniform role after the LED light bar penetrate a diffusion sheet. CONSTITUTION: A method for detecting a mixed light state of a light emitting diode light source simulation is as follows. An exclusive diffusion light field profile with respect to a LED unit penetrating one or more diffusion sheets is taken(S101). The diffusion light field profile is became a reference diffusion light field profile by a normalization(S102). Coordinates of each unit of common detection images and light intensity information corresponding to the coordinates are detected(S104). Images of a light emitting diode light source simulation are obtained by applying the reference diffusion light field profile to each LED unit based on the coordinates of each unit and light intensity information corresponding to the coordinates(S105).
摘要（中）：
目的：提供一种用于检测发光二极管光源模拟的混合光状态的方法，以在LED灯条穿透扩散之后，主要检测多个光条和包括该光条的LED单元，而不考虑轻均匀的作用 片。 构成：用于检测发光二极管光源模拟的混合光状态的方法如下。 采取相对于穿透一个或多个漫射片的LED单元的独占扩散光场分布（S101）。 扩散光场分布通过归一化成为参考扩散光场分布（S102）。 检测与坐标对应的常用检测图像和光强度信息的各单位的坐标（S104）。 通过基于每个单位的坐标和对应于坐标的光强度信息（S105）将参考漫射光场分布应用于每个LED单元来获得发光二极管光源模拟的图像。
公开/授权文献:
- KR101189909B1 시뮬레이션 발광 다이오드 광원 혼합 광 상태 검출 방법 公开/授权日：2012-10-10