The present invention relates to a constant compensation force scanning probe microscope and the correction method, in order to achieve this object a scanning probe microscope of the present invention, the sample is a sample support unit is fixed; The probe is attached to the cantilever and a detector placed on top of the specimen support unit; And it characterized in that it comprises a calculation of the probe by using a resonance frequency of the cantilever detector when in contact with the sample calculated by said probe a force constant which can compensate for the amount of force applied to the sample. According to the invention, used to force the monomolecular measuring scanning probe microscope in the distance measurement there is applied to the contact area between the probe and sample into one of the largest variable, using the resonance frequency of the cantilever detector probe is attached to this by calculating the force constant of the force applied to the sample there is an effect that it is possible to scan a more accurate sample by applying it to the cantilever detector.