基本信息:
- 专利标题: 방사선 검사 장치, 방사선 검사 방법, 및 촬상 조건 산출 장치
- 专利标题(英):Radiation inspection apparatus, radiation inspection method, and image pickup condition calculation apparatus
- 专利标题(中):辐射检查装置,辐射检查方法和图像拾取条件计算装置
- 申请号:KR1020120002391 申请日:2012-01-09
- 公开(公告)号:KR101334721B1 公开(公告)日:2013-11-29
- 发明人: 스즈키요시쿠니
- 申请人: 야마하하쓰도키 가부시키가이샤
- 申请人地址: 일본국 시즈오카켄 이와타시 신가이 ****반치
- 专利权人: 야마하하쓰도키 가부시키가이샤
- 当前专利权人: 야마하하쓰도키 가부시키가이샤
- 当前专利权人地址: 일본국 시즈오카켄 이와타시 신가이 ****반치
- 代理人: 하영욱
- 优先权: JPJP-P-2011-006985 2011-01-17
- 主分类号: G01N23/04
- IPC分类号: G01N23/04 ; G01B15/04
Radiation inspection apparatus of the plurality which are required to obtain the tomographic image information of the second region in which the tomographic image information from the member arrangement information showing an arrangement of the respective members constituting the subject of the inspection target range except for the estimated possible first region and a control means for setting an image pickup condition. Said control means is the subject with one of the plurality of the image pickup condition setting while changing the positional relationship of the radiation source by sensing a transmission image of the subject in each wanted the tomographic image information of the second area from the image pickup results as well as by estimating the tomographic image information of the first area from the information of the members disposed the subject obtains a tomographic image information of the inspection object range.
公开/授权文献:
- KR1020120083219A 방사선 검사 장치, 방사선 검사 방법, 및 촬상 조건 산출 장치 公开/授权日:2012-07-25
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/04 | ..并形成图像 |