To provide a measurement system capable of suppressing increase in a measurement time of an optical semiconductor element formed on a semiconductor substrate.SOLUTION: A measurement system 1 comprises: an optical probe array 12 in which an optical probe group 111 to optical probe group 11m that each include an optical probe 101 to 10n are arranged (n, m: an integer of 2 or more); an optical signal selector 211 to optical signal selector 21m, each of which corresponds on one-to-one basis to any of the optical probe group 111 to optical probe group 11m and selects and outputs one optical signal from optical signals from respective optical probes 101 to 10n of the corresponding probe group; and a control circuit 50 for controlling the optical signal selector 211 to optical signal selector 21m. The measurement system 1, by control of the control circuit 50, repeats switching of optical signal selection by the optical signal selector 211 to optical signal selector 21m until optical signals output from all optical probes 101 to 10n included in the optical probe group 111 to optical probe group 11m are selected.SELECTED DRAWING: Figure 1