基本信息:
- 专利标题: Method and system for multi-vision x-ray stereoscopic imaging
- 申请号:JP2003432314 申请日:2003-12-26
- 公开(公告)号:JP2004333473A 公开(公告)日:2004-11-25
- 发明人: XIAO YONGSHUN , CHIN SHIKIYOU , ZHANG LI
- 申请人: Qinghua Univ , Tsinghua Tongfang Nuctech Co Ltd , 清華同方威視技術股▲分▼有限公司 , 清華大学
- 专利权人: Qinghua Univ,Tsinghua Tongfang Nuctech Co Ltd,清華同方威視技術股▲分▼有限公司,清華大学
- 当前专利权人: Qinghua Univ,Tsinghua Tongfang Nuctech Co Ltd,清華同方威視技術股▲分▼有限公司,清華大学
- 优先权: CN02159995 2002-12-31
- 主分类号: G01N23/04
- IPC分类号: G01N23/04 ; A61B6/02 ; G01T1/00 ; G01T1/161 ; G02B27/22 ; G03C5/16 ; G03C9/00 ; G06T1/00 ; G21K4/00 ; H05G1/61 ; G06T17/40
摘要:
PROBLEM TO BE SOLVED: To provide a method and a system for multi-X-ray stereoscopic imaging. SOLUTION: An index of angle and distance is constructed for a pixel string of a series of projection images along a circular track or a spiral track by an X-ray imaging system parameter and a data sampling parameter. The index is stored so that a rapid seek for the index is made possible. A pixel angle and a distance parameter on a stereoscopic image pair, which is to be combined, by a selected observation point of view, a direction of a line of sight, and parallax effect. Thereby, a memory index and an image parameter corresponding thereto are searched to conduct image composition. Multi-vision X-ray stereoscopic imaging display, which can specify a position of a point of view and a direction of a line of sight and adjust parallax effect, is thus provided to allow an inspector to conduct alternating stereoscopic diagonal line image inspection and get a better grasp on the stereoscopic structure of a specimen. COPYRIGHT: (C)2005,JPO&NCIPI
公开/授权文献:
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/04 | ..并形成图像 |