
基本信息:
- 专利标题: SUBSTRATE POLISHING DEVICE AND POLISHING METHOD
- 申请号:EP18204957.7 申请日:2018-11-07
- 公开(公告)号:EP3479958A1 公开(公告)日:2019-05-08
- 发明人: NAKANISHI, Masayuki , KODERA, Kenji
- 申请人: Ebara Corporation
- 申请人地址: 11-1 Haneda Asahi-cho Ohta-ku Tokyo 144-8510 JP
- 专利权人: Ebara Corporation
- 当前专利权人: EBARA CORPORATION
- 当前专利权人地址: EBARA CORPORATION
- 代理机构: Klang, Alexander H.
- 优先权: JP2017214570 20171107
- 主分类号: B24B37/10
- IPC分类号: B24B37/10 ; B24B37/12 ; B24B37/30 ; B24B41/047 ; B24B41/06 ; B24B7/07 ; B24B27/00 ; B24B37/22
摘要:
One object of the present invention is to improve the uniformity of polishing in a substrate polishing device for polishing a quadrilateral-shaped substrate.
The present application discloses, as one embodiment of the present invention, a substrate polishing device (100) for polishing a quadrilateral-shaped substrate (130), the substrate polishing device (100) including: a surface plate (110); a substrate support mechanism that is attached to the surface plate (110) and that supports the substrate (130); a polishing head mechanism (140) for attaching a polishing pad (150), the polishing head mechanism (140) opposing the surface plate (110); and an orbital drive mechanism (160) for orbitally driving the polishing head mechanism (140). The substrate support mechanism includes: a base plate (121); a plate flow passage (520A, 520C, 520E) provided to the base plate (121); and a plurality of substrate support chambers (510A, 510C, 510E) that are connected to the plate flow passage (520A, 520C, 520E), wherein each substrate support chamber (510A, 510C, 510E) independently applies a vertical direction force to the substrate (130), and the vertical direction force applied to the substrate (130) corresponds to an internal pressure of the substrate support chamber (510A, 510C, 510E).
The present application discloses, as one embodiment of the present invention, a substrate polishing device (100) for polishing a quadrilateral-shaped substrate (130), the substrate polishing device (100) including: a surface plate (110); a substrate support mechanism that is attached to the surface plate (110) and that supports the substrate (130); a polishing head mechanism (140) for attaching a polishing pad (150), the polishing head mechanism (140) opposing the surface plate (110); and an orbital drive mechanism (160) for orbitally driving the polishing head mechanism (140). The substrate support mechanism includes: a base plate (121); a plate flow passage (520A, 520C, 520E) provided to the base plate (121); and a plurality of substrate support chambers (510A, 510C, 510E) that are connected to the plate flow passage (520A, 520C, 520E), wherein each substrate support chamber (510A, 510C, 510E) independently applies a vertical direction force to the substrate (130), and the vertical direction force applied to the substrate (130) corresponds to an internal pressure of the substrate support chamber (510A, 510C, 510E).
公开/授权文献:
- EP3479958B1 SUBSTRATE POLISHING DEVICE AND POLISHING METHOD 公开/授权日:2023-01-04
IPC结构图谱:
B | 作业;运输 |
--B24 | 磨削;抛光 |
----B24B | 用于磨削或抛光的机床、装置或工艺;磨具磨损表面的修理或调节;磨削,抛光剂或研磨剂的进给 |
------B24B37/00 | 研磨机床或装置,即需要在相对软但仍为刚性的研具和被研磨表面之间加入粉末状磨料;及其附件 |
--------B24B37/005 | .研磨机床或装置的控制装置 |
----------B24B37/07 | ..以工件或研具的运动为特征 |
------------B24B37/10 | ...用于单侧研磨 |