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    • 10. 发明申请
    • PLASMA TREATMENT OF POLYMER POWDERS
    • 聚合物粉末的等离子体处理
    • WO1994015264A1
    • 1994-07-07
    • PCT/CA1993000537
    • 1993-12-22
    • THE UNIVERSITY OF WESTERN ONTARIOFUJITSU LIMITED
    • THE UNIVERSITY OF WESTERN ONTARIOFUJITSU LIMITEDKODAMA, JunFOERCH, RenateMacINTYRE, N., StewartCASTLE, George, S.,P.
    • G03G09/097
    • B29C59/14B29K2025/00B29K2033/12B29K2105/251C08J3/28G03G9/08
    • Surfaces of fine polystyrene (PS) and polymethyl methacrylate (PMMA) powders were modified by exposure to the downstream products of a nitrogen or oxygen microwave plasma. The effects of nitrogen and indium incorporation in the powder surface were studied with emphasis on variations in the triboelectric properties of the powder. X-ray photoelectron spectroscopy (XPS) was utilized to determine the changes in surface elemental composition. After nitrogen plasma treatment, the C 1s peak profiles suggested the formation of amines in the case of PS, and the formation of imines and amides in the case of PMMA. Oxygen plasma treatment suggested the formation of hydroxyl and carbonyl groups on the surfaces of both PS and PMMA. After treatment with a nitrogen or oxygen plasma, the charge-to-mass ratio (Q/M) of PS and PMMA powders in contact with carrier particles was measured using the cage blowoff method. The surface charge density (Q/A) was calculated from Q/M. The Q/A of nitrogen plasma-treated PS powder was seen to shift towards positive charge with small increases in the nitrogen concentration. The Q/A of oxygen plasma treated PS powder initially shifted toward negative charge, but changed towards positive charge with higher oxygen concentrations. Plasma-treated PMMA powder showed a different behaviour and the variation of Q/A on PMMA was much less than that of PS. Results suggest that triboelectrification of the polymer powder may be related to changes in the electrical surface states, and that nitrogen may act as a group V dopant within the PS surface.
    • 通过暴露于氮或氧微波等离子体的下游产物,改性了聚苯乙烯(PS)和聚甲基丙烯酸甲酯(PMMA)粉末的表面。 研究了粉末表面氮和铟掺入的影响,重点是粉末的摩擦电性能的变化。 X射线光电子能谱(XPS)用于确定表面元素组成的变化。 在氮等离子体处理后,C 1s峰曲线表明在PS的情况下形成胺,在PMMA的情况下形成亚胺和酰胺。 氧等离子体处理表明在PS和PMMA的表面上形成羟基和羰基。 用氮或氧等离子体处理后,使用笼式吹扫法测定与载体颗粒接触的PS和PMMA粉末的电荷质量比(Q / M)。 表面电荷密度(Q / A)由Q / M计算。 观察到氮等离子体处理的PS粉末的Q / A向正电荷转移,氮浓度增加小。 氧等离子体处理的PS粉末的Q / A最初向负电荷转移,但随着氧浓度的升高而向正电荷变化。 等离子体处理的PMMA粉末显示出不同的行为,并且PM / PM对PMMA的变化远小于PS。 结果表明,聚合物粉末的摩擦带电可能与电气表面状态的变化有关,并且氮气可以作为PS表面内的V族掺杂剂。