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    • 9. 发明申请
    • CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING
    • 在扫描相位对比成像中的校正
    • WO2014207193A1
    • 2014-12-31
    • PCT/EP2014/063679
    • 2014-06-27
    • KONINKLIJKE PHILIPS N.V.
    • ROESSL, EwaldMARTENS, Gerhard
    • A61B6/00G01N23/20G21K1/06G02B5/18
    • A61B6/582A61B6/484A61B6/5258A61B6/583G01N23/20075G01N2223/303G02B5/1838G21K1/06G21K1/10G21K2207/005
    • The present invention relates to calibration in X-ray phase contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating (10) for a slit-scanning X-ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments (11) comprising a filter material (12) and a second plurality of opening segments (13). The filter segments and the opening segments are arranged alternating as a filter pattern (15). The filter material is made from a material with structural elements (14) comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating (54) and an analyzer grating (60) of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator (55) comprising a plurality of bars (57) and slits (59). The filter pattern is aligned with the pre-collimator pattern (61).
    • 本发明涉及X射线相位成像中的校准。 为了消除由于各种增益因素引起的干扰,提供了一种用于狭缝扫描X射线相位成像装置的校准滤光器光栅(10),其包括第一多个过滤器段(11),其包括过滤材料(12 )和第二多个开口段(13)。 过滤器段和开口段作为过滤器图案交替排列(15)。 过滤材料由具有包括微米区域中的结构参数的结构元件(14)的材料制成。 滤光器光栅可移动地布置在相位成像装置的狭缝扫描系统中的干涉仪单元的X射线源光栅(54)和分析器光栅(60)之间。 狭缝扫描系统设置有包括多个杆(57)和狭缝(59)的预准直器(55)。 滤光片图案与预准直图案(61)对准。