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    • 1. 发明申请
    • X-RAY ANALYSIS DEVICE
    • X射线分析装置
    • WO2016193687A1
    • 2016-12-08
    • PCT/GB2016/051559
    • 2016-05-27
    • UNIVERSITY OF LEICESTER
    • HANSFORD, Graeme Mark
    • G01N23/20
    • G01N23/20008
    • An X-Ray analysis device comprising an X-Ray source and an X-ray detector and a method of analysis are disclosed. The X-ray source is arranged to emit a first characteristic X-Ray line and a second characteristic X-Ray line both incident on the sample. The X-Ray detector is adapted to detect X-rays diffracted by the sample. Each of the first and second characteristic X-Ray lines is diffracted at a distinct diffraction angle determined by each of the first and second lattice spacings to produce four diffraction angles, and two of the diffraction angles correspond to one another.
    • 公开了包括X射线源和X射线检测器的X射线分析装置和分析方法。 X射线源被布置成发射入射到样品上的第一特征X射线和第二特征X射线。 X射线检测器适用于检测样品衍射的X射线。 第一和第二特征X射线中的每一个以由第一和第二晶格间隔中的每一个确定的不同的衍射角衍射,以产生四个衍射角,并且两个衍射角彼此对应。