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1. 发明申请

WO2009025779A1 METHODS AND INSTRUMENTS FOR MEASURING TISSUE MECHANICAL PROPERTIES 审中-公开
标题翻译：测量组织机械性能的方法和仪器
公开(公告)号：WO2009025779A1
公开(公告)日：2009-02-26
申请号：PCT/US2008/009826
申请日：2008-08-18
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA , HANSMA, Paul, K.
发明人： HANSMA, Paul, K.
IPC分类号： A61B5/103
CPC分类号： A61B5/103 , A61B5/416 , A61B5/4519 , A61B5/4547 , A61B5/6848 , A61B5/6885 , A61B2562/0252 , A61B2562/0261 , A61B2562/18
摘要： Method and instrument for characterizing a material using a test probe constructed for insertion into the material, optionally with a reference probe constructed either for insertion into the material or to contact another material without insertion. The test probe is inserted at least a microdistance into the material (i) together with insertion of the reference probe into the material, (ii) with the reference probe contacting another material, or (iii) without a reference probe, and then withdrawn. The material property is determined by measuring an interaction of the test probe with the material, which may be related to the insertion of the test probe into the material, the movement of the test probe in the material, and/or the withdrawal of the test probe from the material.
摘要翻译：用于使用构造成用于插入材料的测试探针来表征材料的方法和仪器，可选地具有构造成用于插入材料中的参考探针或者在不插入的情况下接触另一种材料。测试探针至少插入到材料（i）中，同时将参考探针插入到材料中，（ii）参考探针接触另一种材料，或（iii）没有参考探针，然后取出。材料性质通过测量测试探针与材料的相互作用来确定，这可能与测试探针插入材料中有关，测试探针在材料中的移动和/或测试的撤回从材料探测。

2. 发明申请

WO2006060052A1 SCANNER FOR PROBE MICROSCOPY 审中-公开
标题翻译：扫描仪用于探针显微镜
公开(公告)号：WO2006060052A1
公开(公告)日：2006-06-08
申请号：PCT/US2005/032871
申请日：2005-09-13
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA , HANSMA, Paul, K. , FANTNER, Georg , KINDT, Johannes, H.
发明人： HANSMA, Paul, K. , FANTNER, Georg , KINDT, Johannes, H.
IPC分类号： G12B21/22 , G12B21/24
CPC分类号： G01Q10/04
摘要： A scanner for probe microscopy that avoids low resonance frequencies and accounts better for piezo nonlinearities. The scanning probe microscope comprises a probe, a housing, at least two actuators, each coupled to the housing, and a support. The actuators are orthogonally arranged linear stacks of flat piezos in push-pull configuration. The scanner is a 2D scanner having a support frame with x and y axes, and a member for supporting a sample for a probe, the scanner comprising a flexure and flexure coupled cross-conformed piezos arranged along x and y axes. Expansion of the piezos is measured by two strain gauges disposed to measure the differential motion of two opposed actuators. The strain gauges are preferably arranged to compensate for ambient temperature changes, and two strain gauges of identical type are disposed on each actuator to magnify the strain signal.
摘要翻译：用于探针显微镜的扫描仪，可避免低共振频率，更好地考虑压电非线性。扫描探针显微镜包括探针，壳体，至少两个致动器，每个致动器联接到壳体和支撑件。致动器是按推拉配置的平面压电体的正交布置的线性堆叠。该扫描器是具有带x和y轴的支撑框架的2D扫描器，以及用于支撑用于探针的样本的构件，该扫描器包括沿着x和y轴布置的挠曲和弯曲耦合的交叉配合的压电体。通过两个应变仪来测量压电体的扩展，这两个应变计用于测量两个相对的致动器的差动运动。应变计优选地布置成补偿环境温度变化，并且相同类型的两个应变计布置在每个致动器上以放大应变信号。

3. 发明申请

WO2004035644A3 SELF-HEALING ORGANOSILOXANE MATERIALS CONTAINING REVERSIBLE AND ENERGY-DISPERSIVE CROSSLINKING DOMAINS 审中-公开
公开(公告)号：WO2004035644A3
公开(公告)日：2004-04-29
申请号：PCT/US2003/021584
申请日：2003-07-10
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
发明人： HARRELD, John, H. , WONG, Michael, S. , HANSMA, Paul, K. , MORSE, Daniel, E. , STUCKY, Galen, D.
IPC分类号： B29C73/16
摘要： Self-healing copolymeric materials comprising a plurality of intermediate strength crosslinks are provided. The copolymeric materials comprise a silicon component and a plurality of crosslinking components. The crosslinking components comprise a polymeric structure forming a structure held together by ionic and/or hydrogen bonding with a net intermediate strength. The plurality of intermediate strength crosslinks provide toughness to the material, and allow for rehealing by allowing reforming of the crosslinks after a disruptive stress incidence. The material is also suited for recasting, and can be used as an active matrix by incorporating additional substances. Articles of manufacture incorporating such materials, and methods of recasting such materials are also provided.

4. 发明申请

WO2003009305A3 MEASUREMENT HEAD FOR ATOMIC FORCE MICROSCOPY AND OTHER APPLICATIONS 审中-公开
公开(公告)号：WO2003009305A3
公开(公告)日：2003-01-30
申请号：PCT/US2002/022929
申请日：2002-07-17
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
发明人： HANSMA, Paul, K. , DRAKE, Barney , THOMPSON, James , KINDT, Johannes, H. , HALE, David
IPC分类号： G12B21/08
摘要： An improvement for atomic force microscopes, more generally for light beam detecting systems, but also in part applicable to scanning probe microscopes, providing significant novel features and advantages. Particular features include using different objective lens regions for incident and reflected light, a flexure that allows three dimensional motion of the optics block, forming the housing and optics block of a composite material or ceramic, arranging the components so that the beam never hits a flat surface at normal incidence, providing a resonant frequency of cantilever vibration greater than 850 HZ between the cantilever and sample and the cantilever and focusing lens, and focusing the incident beam to a 5 μm or less spot, preferably to a 3 μm or less spot.

5. 发明申请

WO1998010458A1 ATOMIC FORCE MICROSCOPE FOR GENERATING A SMALL INCIDENT BEAM SPOT 审中-公开
标题翻译：用于产生小型入射光束的原子力显微镜
公开(公告)号：WO1998010458A1
公开(公告)日：1998-03-12
申请号：PCT/US1997014622
申请日：1997-08-20
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
发明人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA , HANSMA, Paul, K. , SCHAFFER, Tilman, E. , CLEVELAND, Jason, P.
IPC分类号： H01J03/14
CPC分类号： G01Q20/02 , G01Q60/38 , G01Q70/06 , Y10S977/87
摘要： An atomic force microscope utilizes an optical system having a numerical aperture sufficient with the wavelength of light of an incident beam (44) to form a spot on a cantilever (14) having a size of 8 micrometers or less in at least one dimension. An adjustable aperture (34) can be utilized to control the size and/or shape of the incident beam spot on the cantilever (14). Portions of the incident beam and the beam reflected from the cantilever overlap and are directed so that the plane of focus of the incident beam is parallel to the plane of the cantilever (14). The incident and reflected light beams are separated by polarization using a beam splitter (40) in conjuntion with a quarterwave plate (42). Focussing can be accomplished with a confocal viewing system coupled with a translatable focussing lens common to the optical system and the viewing system.
摘要翻译：原子力显微镜利用具有足够入射光束（44）的光的波长的数值孔径的光学系统在至少一个维度上在尺寸为8微米或更小的悬臂（14）上形成点。可调节的孔（34）可用于控制悬臂（14）上的入射束斑的尺寸和/或形状。入射光束的一部分和从悬臂反射的光束重叠并被引导，使得入射光束的焦平面平行于悬臂（14）的平面。通过使用与四分之一波片（42）结合的分束器（40）将入射和反射的光束通过偏振分离。可以用与光学系统和观察系统共同的可平移聚焦透镜耦合的共焦观察系统来实现聚焦。

6. 发明申请

WO1996030927A1 COMBINED SCANNING PROBE AND SCANNING ENERGY MICROSCOPE 审中-公开
标题翻译：组合扫描探测和扫描能量显微镜
公开(公告)号：WO1996030927A1
公开(公告)日：1996-10-03
申请号：PCT/US1996003721
申请日：1996-03-20
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
发明人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA , HANSMA, Paul, K. , WALTERS, Deron, A. , HILNER, Paul, E.
IPC分类号： H01J37/26
CPC分类号： G02B21/0028 , G01Q30/025 , Y10S977/869
摘要： A combined scanning probe and scanning energy microscope, in which the same scanning system is used for both the scanning probe and scanning energy images. A sample is translated substantially along a horizontal plane either between or below the probe (14) of a scanning probe microscope and the objective (12) of a scanning energy microscope. The probe (14) collects topographic or other information. The objective (12) focuses a fixed beam of energy to a small spot (16) on the sample, then collects energy from the same spot and transmits it to a detector (18). A vertical translator (22) connected to the probe (14) or sample support (10) provides the vertical motion necessary to maintain them in close proximity. The images produced by the two microscopes are in substantial direct registration with each other. The invention is exemplified by a combined atomic force and confocal laser scanning microscope with a translated sample.
摘要翻译：组合的扫描探针和扫描能量显微镜，其中扫描探针和扫描能量图像都使用相同的扫描系统。样本在扫描探针显微镜的探针（14）和扫描能量显微镜的物镜（12）之间或之下基本上沿水平面平移。探头（14）收集地形或其他信息。目标（12）将固定的能量束聚焦到样品上的小点（16）上，然后从同一点收集能量并将其传输到检测器（18）。连接到探头（14）或样品支架（10）的垂直平移器（22）提供了使其保持紧密的必要的垂直运动。由两个显微镜产生的图像相互直接对准。本发明通过具有翻译样品的组合原子力和共聚焦激光扫描显微镜来举例说明。

7. 发明申请

WO1996005531A1 METHOD AND APPARATUS FOR PERFORMING NEAR-FIELD OPTICAL MICROSCOPY 审中-公开
标题翻译：用于执行近场光学显微镜的方法和装置
公开(公告)号：WO1996005531A1
公开(公告)日：1996-02-22
申请号：PCT/US1995009779
申请日：1995-08-01
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
发明人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA , HILLNER, Paul, E. , RADMACHER, Manfred , HANSMA, Paul, K.
IPC分类号： G02B21/00
CPC分类号： G01Q60/22 , Y10S977/862
摘要： A near-field optical microscope and method of microscopy in which a probe including a flexible cantilever (3) having a sharp tip (10) is positioned in proximity to a sample (15). In one embodiment, a region (14) of the sample is irradiated with light, and one or more portions (21) of this region are caused to fluoresce. A quenching element (13) is provided at the tip (10) of the probe to quench the fluorescence of these portions within the region (14). The amount of quenching is determined while the sample is scanned to produce a high resolution image of the irradiated region (14) of the sample. In another embodiment, the fluorescence imparted to one or more portions of the irradiated region is enhanced by the interaction of an optically active element (13) disposed at the tip portion (10) of the cantilever probe which provides for sharper images with greater signal-to-noise ratios. The near-field optical microscopes according to the present invention can also be used to measure the reflection/transmission or absorption characteristics from a sample region within a distance of one wavelength of light away from the sample surface. The microscopes also include means for producing a relative scanning motion between the sample and the probe such as by raster scanner or circular scanning, for example.
摘要翻译：近场光学显微镜和显微镜方法，其中包括具有尖锐尖端（10）的柔性悬臂（3）的探针位于样品（15）附近。在一个实施例中，用光照射样品的区域（14），并且使该区域的一个或多个部分（21）发荧光。在探针的尖端（10）处提供淬火元件（13）以淬灭该区域（14）内的这些部分的荧光。在扫描样品以产生样品的照射区域（14）的高分辨率图像时确定淬灭量。在另一个实施方案中，通过设置在悬臂探头的尖端部分（10）处的光学活性元件（13）的相互作用，赋予被照射区域的一个或多个部分的荧光增强，其提供更清晰的图像，信噪比。根据本发明的近场光学显微镜还可以用于从远离样品表面的一个波长的光的距离内的样品区域测量反射/透射或吸收特性。显微镜还包括用于例如通过光栅扫描器或圆形扫描在样品和探针之间产生相对扫描运动的装置。

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