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1. 发明申请

WO2020120842A1 STEREO IMAGING APPARATUS 审中-公开
公开(公告)号：WO2020120842A1
公开(公告)日：2020-06-18
申请号：PCT/FI2019/050886
申请日：2019-12-12
申请人： TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
发明人： MÄKINEN, Jukka-Tapani , OJALA, Kai
IPC分类号： G03B35/10 , H04N13/229 , G03B37/06
摘要： An apparatus (500) comprises: - an imaging device (CAM1) comprising an input element (100), a focusing unit (300) and an image sensor (DET1), wherein the input element (100) has a symmetry axis (AX1), wherein a viewing region (ZONE1) surrounds the input element (100), and wherein the imaging device (CAM1) is arranged to form an annular image (IMG1) of the viewing region (ZONE1) on the image sensor (DET1), - a curved diffractive element (G1) to provide a first diffracted light ray (LR2a) and a second light ray (LR2b, LR2c) by diffracting light (LB1) received from a first object point (P0) located in the viewing region (ZONE1) such that the first diffracted light ray (LR2a) propagates towards the axis (AX1) in a first azimuthal direction (j1), and such that the second diffracted light ray (LR2b, LR2c) propagates towards the axis (AX1) in a second different azimuthal direction (j2), - wherein the imaging device (CAM1) is arranged to form a first image point (P1a) of the first object point (P0) by focusing light of the first diffracted light ray (LR2a) to the image sensor (DET1), and the imaging device (CAM1) is arranged to form a second different image point (P1b, P1c) of the first object point (P0) by focusing light of the second diffracted light ray (LR2b, LR2c) to the image sensor (DET1).

2. 发明申请

WO2017042435A1 IMAGING SPECTROGRAPH 审中-公开
标题翻译：成像光谱
公开(公告)号：WO2017042435A1
公开(公告)日：2017-03-16
申请号：PCT/FI2016/050622
申请日：2016-09-07
申请人： TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
发明人： OJALA, Kai
IPC分类号： G01J3/04 , G01J3/06 , G01J3/14 , G01J3/18 , G02B13/22 , G02B26/08 , G01J3/28
CPC分类号： G01J3/04 , G01J3/0291 , G01J3/06 , G01J3/14 , G01J3/18 , G01J3/2803 , G02B13/22
摘要： An imaging device (500) comprises: a first telecentric system (SYS1) to form a first image (IMG1) of an object (OBJ1),5 a second telecentric system (SYS2) to provide a bundle of output beams (LB5a,LB5b) for forming a second image (IMG2) such that the output beams (LB5a,LB5b) are formed from light received from the first image (IMG1), and a first dispersive element (G1) positioned between the first telecentric system (SYS1) and the second telecentric system (SYS2) to provide a bundle of deflected light beams (LB3a,LB3b) such that the direction of the deflected light beams (LB3a,LB3b) depends on the wavelength (κ), wherein the second telecentric system (SYS2) is arranged to form the output beams (LB5a,LB5b) from light of the deflected light beams (LB3a,LB3b), and the second telecentric system (SYS2) comprises an aperture stop (AP2) to reject light which is outside a selected spectral range (PB1).
摘要翻译：成像装置（500）包括：形成物体（OBJ1）的第一图像（IMG1）的第一远心系统（SYS1），5是第二远心系统（SYS2），以提供一束输出光束（LB5a，LB5b）用于形成第二图像（IMG2），使得输出光束（LB5a，LB5b）由从第一图像（IMG1）接收的光形成;以及第一色散元件（G1），位于第一远心系统（SYS1）和第一图像第二远心系统（SYS2），以提供一束偏转光束（LB3a，LB3b），使得偏转光束（LB3a，LB3b）的方向取决于波长（κ），其中第二远心系统（SYS2）是被布置成根据偏转光束（LB3a，LB3b）的光形成输出光束（LB5a，LB5b），并且第二远心系统（SYS2）包括孔径光阑（AP2）以抑制在所选光谱范围外的光 PB1）。

3. 发明申请

WO2021214393A1 HYPERSPECTRAL IMAGING DEVICE 审中-公开
公开(公告)号：WO2021214393A1
公开(公告)日：2021-10-28
申请号：PCT/FI2021/050301
申请日：2021-04-21
申请人： TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
发明人： OJALA, Kai , SAARI, Heikki
IPC分类号： G01J3/26 , G01J3/28 , G02B3/00 , G02B13/22 , G02B26/00
摘要： A spectral imaging device (500) comprises: - an optical modifier system (SYS1) to form axial light beams (LB2) from received light beams (LB1), the axial light beams (LB2) being parallel with an5 optical axis (AX1) of the imaging device (500), - a Fabry-Perot interferometer (FPI) to provide filtered axial light beams (LB3) by filtering light of the axial light beams (LB2), - an image sensor (SEN1), and - an array (ARR1) of lenses (LNS0,0, LNS0,1) to form a plurality of sub-images10 (S0,0, S0,1) on the image sensor (SEN1) by focusing light of the filtered light beams (LB3).

4. 发明申请

WO2017051074A1 METHOD AND APPARATUS FOR MEASURING THE HEIGHT OF A SURFACE 审中-公开
标题翻译：测量表面高度的方法和装置
公开(公告)号：WO2017051074A1
公开(公告)日：2017-03-30
申请号：PCT/FI2016/050657
申请日：2016-09-21
申请人： TEKNOLOGIAN TUTKIMUSKESKUS VTT OY
发明人： OJALA, Kai
IPC分类号： G01B11/24
CPC分类号： G01B11/24
摘要： A measuring device (500) comprises: - an illuminating unit (100) arranged to project an illuminating light beam (LB1 ) on a surface (SRF1 ) of a target object (OBJ1 ) so as to form an illuminated region (E1 ) on the surface (SRF1 ), - an image sensor (300), and - focusing optics (200) arranged to form a focused spot (E2) on the image sensor (300) by focusing light (LB2 k ) reflected from the illuminated region (E1 ) such that the position (u k ) of the spot (E2) depends on the height (z k ) of the surface (SRF1 ) with respect to a reference plane (PLN1 ), wherein the device (500) is configured to determine a height (z k ) of the surface (SRF1 ) from a detected position (u k ) of the focused spot (E2 k ), and wherein the normal (N3) of the image sensor (300) is inclined with respect to the optical axis (AX2) of the focusing optics (200).
摘要翻译：测量装置（500）包括： - 照明单元（100），被布置成将目标物体（OBJ1）的表面（SRF1）上的照明光束（LB1）投射在所述目标物体（OBJ1）的表面上，以在所述照射区域表面（SRF1）， - 图像传感器（300），以及 - 聚焦光学器件（200），被布置成通过聚焦从照明区域（E1）反射的光（LB2k）在图像传感器（300）上形成聚焦点使得点（E2）的位置（uk）取决于表面（SRF1）相对于参考平面（PLN1）的高度（zk），其中装置（500）被配置为确定高度（zk ）从聚焦点（E2k）的检测位置（uk）开始的表面（SRF1）），并且其中图像传感器（300）的法线（N3）相对于聚焦点的光轴（AX2）倾斜光学（200）。

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