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1. 发明申请

WO2010056340A1 UV-VIS ATR SHORT PATHLENGTH SPECTROSCOPY OF PRINTING INKS 审中-公开
标题翻译： UV-VIS ATR短路印刷墨水的光谱
公开(公告)号：WO2010056340A1
公开(公告)日：2010-05-20
申请号：PCT/US2009/006098
申请日：2009-11-12
申请人： SUN CHEMICAL CORPORATION , LEE, Kathryn , RICH, Danny, Clark
发明人： LEE, Kathryn , RICH, Danny, Clark
IPC分类号： G01N21/00
CPC分类号： G01N21/552 , G01N21/85
摘要： A spectroanalytic system and process for analyzing the absorption properties of highly absorbing viscous materials is disclosed. The measurement probe includes a UV-VIS optical system. A single crystal is shaped so that the light enters the crystal perpendicular to its surface and is Incident on the back face at an angle of 45 degree or greater and the reflected light is collected and channeled to a detector system. This system provides an attenuated total reflectance measurement with minimal reflection points wherein the total path length is comparable with a typically printed offset ink film (0.7 - 1.3 micron). The total absorption process path length depends only on the refractive index of the chosen crystal and on the angle of incidence of the single reflection. High refractive index materials, like diamond, have path lengths of 50nm, and an economical material such as cubic zirconium provides a path length of 0.1 micron.
摘要翻译：公开了用于分析高吸收性粘性材料的吸收性能的光谱分析系统和方法。测量探头包括一个UV-VIS光学系统。单晶被成形为使得光垂直于其表面进入晶体，并且以45度或更大的角度入射在背面上，并且将反射光收集并引导到检测器系统。该系统提供具有最小反射点的衰减的全反射率测量，其中总路径长度与通常印刷的胶印油墨膜（0.7-1.3微米）相当。总吸收过程路径长度仅取决于所选晶体的折射率和单次反射的入射角。诸如金刚石的高折射率材料具有50nm的路径长度，经济的材料如立方锆提供0.1微米的路径长度。

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