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    • 1. 发明申请
    • METHOD AND APPARATUS FOR MANAGING AND UNIFORMLY MAINTAINING PIXEL CIRCUITRY IN A FLAT PANEL DISPLAY
    • 用于在平板显示器中管理和均匀维护像素电路的方法和装置
    • WO2007120849A2
    • 2007-10-25
    • PCT/US2007/009174
    • 2007-04-11
    • NUELIGHT CORPORATIONNAUGLER, W., EdwardWILE, DonSARKARIA, Kapil
    • NAUGLER, W., EdwardWILE, DonSARKARIA, Kapil
    • G06F3/042
    • G09G3/3233G09G3/006G09G3/3291G09G2320/0242G09G2320/0276G09G2320/0295G09G2320/045G09G2320/048G09G2330/12
    • The present invention describes a method and apparatus for measuring the voltage and current characteristics of the OLED pixel as it ages and correlating the measured data to the decrease in quantum efficiency and changes in OLED impedance over the life of the OLED, so that corrections can be made to the image drive system to prevent image sticking and color point drift. The method and apparatus of the present invention do not require any additional circuitry or changes in the display design. The circuitry of the present invention is implemented in the display driver integrated circuit (IC) chips. The basis of the invention is the luminance-current-voltage (LIV) curves which characterize the OLED materials over their life time. A series of these curves are stored in memory representing a OLED material at various ages. The apparatus of the present invention is used to measure driver voltages and currents for a pixel having an OLED, which measurements are then used to extract the voltage current curve for the OLED at any point in time. The extracted curve is compared to the aging curves stored in memory to determine the aging curve that best describes the measured present voltage current characteristic of the pixel. That aging curve is used to drive the pixel.
    • 本发明描述了一种用于测量OLED像素的电压和电流特性的方法和装置,当OLED像素老化并使测量数据与OLED的寿命期间量子效率的降低和OLED阻抗的变化相关联时,校正可以是 制作图像驱动系统,防止图像粘贴和色点漂移。 本发明的方法和装置不需要任何额外的电路或显示设计的改变。 本发明的电路在显示驱动器集成电路(IC)芯片中实现。 本发明的基础是在其寿命中表征OLED材料的亮度 - 电流 - 电压(LIV)曲线。 这些曲线的一系列存储在代表各种年龄的OLED材料的存储器中。 本发明的装置用于测量具有OLED的像素的驱动电压和电流,然后使用这些测量值在任何时间点提取OLED的电压电流曲线。 将提取的曲线与存储在存储器中的老化曲线进行比较,以确定最佳描述所测量的当前电压电流特性的老化曲线。 该老化曲线用于驱动像素。