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1. 发明申请

WO2011005095A1 A METHOD OF ENCAPSULATING A FLEXIBLE OPTOELECTRONIC MULTI-LAYERED STRUCTURE 审中-公开
标题翻译：一种柔性光电多层结构的封装方法
公开(公告)号：WO2011005095A1
公开(公告)日：2011-01-13
申请号：PCT/NL2010/050442
申请日：2010-07-09
申请人： NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO , KONINKLIJKE PHILIPS ELECTRONICS N.V. , VAN DER WEIJER, Peter , VAN MOL, Antonius Maria Bernardus , TANASE, Cristina
发明人： VAN DER WEIJER, Peter , VAN MOL, Antonius Maria Bernardus , TANASE, Cristina
IPC分类号： H01L51/52
CPC分类号： H01L51/5259 , H01L51/5253 , H01L51/5256
摘要： The invention relates to a method of encapsulating a flexible optoelectronic multi-layered structure (6) provided on a polymer substrate (2) comprising the steps of providing the flexible optoelectronic multi-layered structure with one or both a bottom encapsulation stack (B) and a top encapsulation stack (T), wherein the bottom encapsulation stack and the top encapsulation layer comprise a first inorganic layer (4a, 8a) separated from a second inorganic layer (4b, 8b) by a substantially continuous getter layer (5, 8) comprising a metal oxide, the first and the second inorganic layers having an intrinsic water vapour transmission of 1O -5 g.m -2. day -1 or less.
摘要翻译：本发明涉及一种封装设置在聚合物基板（2）上的柔性光电多层结构（6）的方法，包括以下步骤：向柔性光电多层结构提供底部封装叠层（B）和顶部封装堆叠（T），其中底部封装堆叠和顶部封装层包括通过基本上连续的吸气剂层（5,8）与第二无机层（4b，8b）分离的第一无机层（4a，8a）包含金属氧化物，所述第一和第二无机层的固有水蒸气透过率为10-5m2m2·day-1或更低。

2. 发明申请

WO2002103378A2 METHOD AND APPARATUS FOR LEAK-TESTING AN ELECTROLUMINESCENT DEVICE 审中-公开
标题翻译：用于泄漏测试电致发光器件的方法和装置
公开(公告)号：WO2002103378A2
公开(公告)日：2002-12-27
申请号：PCT/IB2002/002195
申请日：2002-06-10
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V.
发明人： MANK, Adrianus, J., G. , VAN DER WEIJER, Peter
IPC分类号： G01R31/26
CPC分类号： H01L51/5259
摘要： A method of detecting the leak-in of oxygen in an organic electroluminescent device via the extent of photo-degradation of the electroluminescent organic material is described. The photo-degradation of the electroluminescent organic material is induced by the presence of oxygen, and can be detected by comparing the photo luminescence of the material, before and after illumination of the material with light (e.g. form a laser). Photo-degradation due to the presence of oxygen in an encapsulated organic electroluminescent device is evidence for a leak in the device, which leak will result in a shorter lifetime of the device. The invention provides a fast, non-destructive method of inspecting organic electroluminescent devices on leakage, immediately after their production. Leak devices can be identified and discarded, even on-line.
摘要翻译：描述了通过电致发光有机材料的光降解程度检测有机电致发光器件中的氧气泄漏的方法。电致发光有机材料的光降解由氧的存在引起，并且可以通过在材料照射之前和之后（例如形成激光）比较材料的光致发光来检测。由于在封装的有机电致发光器件中存在氧引起的光降解是器件泄漏的证据，这种泄漏将导致器件的寿命更短。本发明提供了在其生产之后立即检查有机电致发光器件的泄漏的快速，非破坏性的方法。泄漏设备可以被识别和丢弃，甚至在线。

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